Informacja

Drogi użytkowniku, aplikacja do prawidłowego działania wymaga obsługi JavaScript. Proszę włącz obsługę JavaScript w Twojej przeglądarce.

Wyszukujesz frazę "61.10.-i" wg kryterium: Temat


Tytuł:
Studies of Be-Fe Compounds Synthesized by Laser Irradiation
Autorzy:
Amulevicius, A.
Mazeika, K.
Sipavicius, C.
Baltusnikas, A.
Powiązania:
https://bibliotekanauki.pl/articles/2043662.pdf
Data publikacji:
2005-09
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.18.Fs
61.10.-i
61.80.Ba
Opis:
The FeBe$\text{}_{2,5,11}$ compounds and theα-Fe(Be) solid solution of Be$\text{}_{x}$Fe$\text{}_{1-x}$ system were synthesized by laser irradiation from a powder mixture. The dependence of the phase structure on the initial sample composition (x=0.1-0.95) was studied. The phases were determined and studied by means of Mössbauer spectroscopy and X-ray diffraction.
Źródło:
Acta Physica Polonica A; 2005, 108, 3; 467-478
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
The Influence of Laser Irradiation Time on Fe-Si-C System Structure
Autorzy:
Amulevicius, A.
Daugvila, A.
Davidonis, R.
Mazeika, K.
Powiązania:
https://bibliotekanauki.pl/articles/2037036.pdf
Data publikacji:
2003-12
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.18.Fs
61.10.-i
61.80.Ba
Opis:
The influence of different laser irradiation times on the structure of grey cast iron was studied. Mössbauer spectroscopy and X-ray diffraction were used to characterise the changes caused by laser irradiation. The composition of martensite and austenite as well as the creation of carbide phases during quenching were studied. Modelling of temperature during laser irradiation allowed differences in the influence of different laser irradiation types and times to be explained.
Źródło:
Acta Physica Polonica A; 2003, 104, 6; 537-548
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Influence of Dislocation Interactions with Impurities on their Topographical Images in Silicon Crystals
Autorzy:
Auleytner, J.
Skorokhod, M. Ya.
Datsenko, L. I.
Khrupa, V. I.
Powiązania:
https://bibliotekanauki.pl/articles/1945730.pdf
Data publikacji:
1996-09
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.10.-i
61.72.Cc
61.72.Ff
81.40.Cd
Opis:
Silicon crystals contained copper atoms included by diffusion way during high temperature treatment have been investigated by means of X-ray transmission topography (Lang method). The studies allow us to observe the increase or decrease in the dislocation images widths in dependence on the time of diffusin annealing. In one case, during the more prolonged decoration process a build-up of decorating particles on dislocation occurs with widening of the topographic images of this dislocation. In another case (short time of decorating process) some compensation of defect deformation fields has been noticed (shortening of the mentioned images takes part). The obtained effects depend not only on the type of intrinsic impurities which take part in forming the Cottrell atmospheres but also on the duration of diffusion annealing. The observed results of interaction of dislocations with impurities have been confirmed by the studies of the integral reflectivity of decorated samples by means of the double-crystal spectrometer.
Źródło:
Acta Physica Polonica A; 1996, 90, 3; 541-546
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
X-Ray and Electron-Optical Characterization of ZnSe(Co) Crystal with Natural Face
Autorzy:
Auleytner, J.
Domagała, J.
Gołacki, Z.
Pawłowska, M.
Pełka, J.
Regiński, K.
Powiązania:
https://bibliotekanauki.pl/articles/1929340.pdf
Data publikacji:
1993-06
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.10.-i
61.14.Hg
61.16.Bg
Opis:
Using complementary X-ray and electron-optical methods, a ZnSe(Co) crystal with natural face was investigated. X-ray diffraction methods such as double-crystal X-ray reflection topography, double-crystal diffractometry for rocking curve measurements, precise lattice constant measurements by the Bond technique were used for crystal structure characterization and X-ray fluorescence method for studies of chemical composition along the crystal. The scanning electron microscopic image of the crystal surface and reflection diffraction of the high-energy electrons enriched the crystal structure characterization. It was shown that X-ray characterization and reflection high-energy electron diffraction can be regarded as very important complementary tools for non-destructive investigation of the ZnSe(Co) crystal surface layers.
Źródło:
Acta Physica Polonica A; 1993, 83, 6; 759-768
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
X-Ray and Electron-Optical Characterization of ZnTe/CdTe and ZnTe/GaAs Epitaxial Layers Obtained by the MBE Method
Autorzy:
Auleytner, J.
Dziuba, Z.
Górecka, J.
Pełka, J.
Regiński, K.
Powiązania:
https://bibliotekanauki.pl/articles/1931657.pdf
Data publikacji:
1994-10
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.14.Hg
61.10.-i
68.55.-a
Opis:
X-ray diffraction topography (Bragg diffraction) and X-ray rocking curve measurements were used to study the perfection and structural properties of ZnTe epitaxial layers on the CdTe and GaAs substrates. ZnTe epitaxial layers on CdTe were grown by MBE method by using a machine made in the Institute of Physics of the Polish Academy of Sciences. The ZnTe layers on GaAs were produced on the other, factory-made MBE system. The comparison between the X-ray topographical images of the substrate and epitaxial layer shows that imperfections on the substrate surface cause imperfections in the epitaxial layer. The results of double-crystal diffractometry measurements show that the perfection of the layer on the GaAs substrate is higher than that on the CdTe. The presence of microtwining in the ZnTe layer on the CdTe substrate was confirmed by RHEED measurements. The X-ray standing wave fluorescent spectra were also measured for the samples.
Źródło:
Acta Physica Polonica A; 1994, 86, 4; 567-574
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
High Resolution X-Ray Diffraction Investigations of Si/SiGe Quantum Well Structures and Si/Ge Short-Period Superlattices
Autorzy:
Bauer, G.
Koppensteiner, E.
Hamberger, P.
Nützel, J.
Abstreiter, G.
Kibbel, H.
Presting, H.
Kasper, E.
Powiązania:
https://bibliotekanauki.pl/articles/1929613.pdf
Data publikacji:
1993-09
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
68.65.+g
61.10.-i
68.55.Jk
Opis:
Double crystal and triple axis X-ray diffractometry was used to characterize the structural properties of Si/Si$\text{}_{1-x}$Ge$\text{}_{x}$ multiquantum well samples grown pseudomorphically on Si(001) substrates, as well as of short-period Si$\text{}_{9}$Ge$\text{}_{6}$ superlattices grown by molecular beam epitaxy on rather thick step-graded Si$\text{}_{1-x}$Ge$\text{}_{x}$ (0 < x < 0.4, 650 nm thick) buffers followed by 550 nm Si$\text{}_{0.6}$ Ge$\text{}_{0.4}$ layers. Reciprocal space maps around the (004) and (224) reciprocal lattice points yield direct information on the strain status of the layers in the heterostructure systems and in particular on the amount of strain relaxation.
Źródło:
Acta Physica Polonica A; 1993, 84, 3; 475-489
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
High Resolution X-ray Reciprocal Space Mapping
Autorzy:
Bauer, G.
Li, J. H.
Holy, V.
Powiązania:
https://bibliotekanauki.pl/articles/1943985.pdf
Data publikacji:
1996-02
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.10.-i
68.55.-a
61.72.Lk
Opis:
A survey will be given on recent advances in the investigation of semiconductor epilayers, heterostructures and superlattices using reciprocal space mapping techniques based on triple-axis diffractometry. It is shown that X-ray reciprocal space mapping yields quantitative information on strain, strain relaxation, as well as composition in such structures. These data are obtained from analyses of the isointensity contours of scattered X-ray intensity around reciprocal lattice points. Further analysis of the diffuse scattering yields also information on defect distribution in the epilayers.
Źródło:
Acta Physica Polonica A; 1996, 89, 2; 115-127
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Spatially Resolved Chemistry on Bimetallic Surfaces
Autorzy:
Behm, R. J.
Powiązania:
https://bibliotekanauki.pl/articles/1968689.pdf
Data publikacji:
1998-02
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.16.Ch
68.10.Jy
82.65.-i
Opis:
The local chemical properties of bimetallic surfaces, which are often drastically different from those of each of the components, will be discussed. Using CO adsorption as a probe molecule it will be shown for two model systems, Au/Pd(111) and Pt/Ru(0001), that their chemical properties depend decisively on the local surface structure and that the correct interpretation of area integrating spectroscopic and kinetic data obtained from such surfaces requires detailed knowledge of their (defect) structure and of the distribution of the different components in the surface layer. It will further be shown that information on the local chemical properties of specific structural elements such as monolayer islands and monolayer island edges, and specific surface ensembles can be gained by applying high resolution scanning tunneling microscopy imaging and area integrating spectroscopic techniques in combination to bimetallic surfaces whose morphology and composition is varied in a systematic and controlled way. Based on experimental results adsorption on a monolayer A / substrate B system is suggested as a model for gaining information on the modifications in chemical properties of AB alloy surfaces due to metal-metal interactions.
Źródło:
Acta Physica Polonica A; 1998, 93, 2; 259-272
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Application of Third Generation Synchrotron Source to Studies of Non-Crystalline Materials: In-Se Amorphous Films
Autorzy:
Burian, A.
Jabłońska, A.
Burian, A. M.
Le Bolloc'h, D.
Metzger, H.
Proux, O.
Hazemann, J. L.
Mosset, A.
Raoux, D.
Powiązania:
https://bibliotekanauki.pl/articles/2030649.pdf
Data publikacji:
2002-05
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.10.-i
61.43.Dq
Opis:
The local structure of vacuum evaporated In-Se amorphous films, containing 50, 60, and 66 at.% Se, was studied using differential anomalous X-ray scattering and extended X-ray absorption fine structure. Both intensity and absorption spectra were measured in the vicinity of the absorption K-edge of Se. The differential anomalous X-ray scattering data were converted to real space by the inverse Fourier transform yielding the differential radial distribution functions. The obtained results provide evidence for the presence of Se-In spatial correlations for In$\text{}_{50}$Se$\text{}_{50}$ and Se-In and Se-Se correlations for In$\text{}_{40}$Se$\text{}_{60}$ and In$\text{}_{34}$Se$\text{}_{66}$ within the first coordination sphere.
Źródło:
Acta Physica Polonica A; 2002, 101, 5; 701-708
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Curved Surfaces in Disordered Carbons by High Energy X-ray Scattering
Autorzy:
Burian, A.
Szczygielska, A.
Kołoczek, J.
Dore, J.
Honkimaki, V.
Duber, S.
Powiązania:
https://bibliotekanauki.pl/articles/2030692.pdf
Data publikacji:
2002-05
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.10.-i
61.10.Eq
61.46.+w
Opis:
Disordered carbons prepared by slow pyrolysis of saccharose and anthracene and subsequent heat treatment at 1000ºC and 2300ºC have been studied by high energy X-ray diffraction. Computer simulations of the powder diffraction patterns of fullerenes, nanotubes and carbon models have been compared with the experimental data after conversion to real space via the Fourier transform. The presence of fullerene- and nanotube-like fragments with non-six membered rings in the investigated samples has been deduced by detailed analysis of the radial distribution functions of the saccharose- and anthracene-based carbons and related to resistance to graphitization of the saccharose-based carbons and to stability of the growing crystallites in the case of the anthracene-based carbons. The obtained results are compared to high resolution electron microscopy and Raman studies.
Źródło:
Acta Physica Polonica A; 2002, 101, 5; 751-759
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Does Carbon Prefer Flat or Curved Surfaces?
Autorzy:
Burian, A.
Dore, J. C.
Powiązania:
https://bibliotekanauki.pl/articles/2014367.pdf
Data publikacji:
2000-11
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.48.+c
61.10.-i
78.30.Na
Opis:
The presence of fullerene- and nanotube-like elements in carbons prepared from saccharose and anthracene by slow pyrolysis and then heat treated at 1000°C, 1900°C, and 2300°C has been revealed using Raman spectroscopy. High energy X-ray diffraction has been used to examine the effect on these carbons of heat treatment. Tendency to graphitization of the anthracene-based carbon and resistance to graphitization of the saccharose carbon will be considered in the light of the formation of curved graphitic networks and cages. The obtained results lead us to propose a model of the structure of non-graphitizing and graphitizing carbons.
Źródło:
Acta Physica Polonica A; 2000, 98, 5; 457-468
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Interpretation of Differential Anomalous X-Ray Scattering Data for Amorphous Cd-As
Autorzy:
Burian, A.
Lecante, P.
Mosset, A.
Galy, J.
Tonnerre, J. M.
Raoux, D.
Powiązania:
https://bibliotekanauki.pl/articles/1931688.pdf
Data publikacji:
1994-10
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.70.Dm
61.10.-i
Opis:
The computational procedure, based on Warren's exact method for an amorphous sample with more than one atom, was developed to obtain the short-range order structural parameters from the differential anomalous X-ray scattering data, collected using the synchrotron radiation. The experimental differential radial distribution functions were fitted with the true distribution functions expressed in an analytical form and broadened by convolution with the pair functions. It was found that atoms in the amorphous Cd-As films remain almost tetrahedrally coordinated and the investigated alloys are chemically ordered.
Źródło:
Acta Physica Polonica A; 1994, 86, 4; 633-640
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Integral Structure Perfection Diagnostics of Single Crystals Using Two Wavelengths of X-Ray Spectrum
Autorzy:
Datsenko, L.
Krasulya, S.
Machulin, V.
Auleytner, J.
Khrupa, V.
Powiązania:
https://bibliotekanauki.pl/articles/1964123.pdf
Data publikacji:
1997-05
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
81.40.-z
61.10.-i
Opis:
A new approach to determination of microdefect structure parameters by means of single crystal diffractometer is proposed. The approach is based on the measurements of the integral reflectivity of a sample for two selected X-ray wavelengths providing with the approximations of thin and thick crystal, respectively.
Źródło:
Acta Physica Polonica A; 1997, 91, 5; 935-938
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Structure Changes in Cz-Si Single Crystals Irradiated with Fast Oxygen and Neon Ions
Autorzy:
Datsenko, L.
Żymierska, D.
Auleytner, J.
Klinger, D.
Machulin, V.
Klad'ko, V.
Melnik, V.
Prokopenko, I.
Czosnyka, T.
Choiński, J.
Powiązania:
https://bibliotekanauki.pl/articles/2011007.pdf
Data publikacji:
1999-07
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.80.Jh
61.10.-i
61.72.-y
Opis:
The research of the surface and the near-surface region of Cz-Si wafers irradiated with fast oxygen and neon ions of energy 4 MeV/u and dose 10$\text{}^{14}$ particles/cm$\text{}^{2}$ is presented. In our study several methods based on the Bragg case of X-ray diffraction using Ag K_{α$\text{}_{1}}$, as well as reflection high-energy electron diffraction and Nomarsky optical microscopy were used. It was shown that implantation with fast neon ions causes larger disturbances of silicon crystal structure than irradiation with oxygen ions.
Źródło:
Acta Physica Polonica A; 1999, 96, 1; 137-142
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Single Pulse Laser Ablation of AISI 316L Stainless Steel Surface Using Nd:YAG Laser Irradiation
Autorzy:
Demir, P.
Kacar, E.
Akman, E.
Demir, A.
Powiązania:
https://bibliotekanauki.pl/articles/1195232.pdf
Data publikacji:
2014-02
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
42.62.-b
44.05.+e
44.10.+i
61.82.-d
61.82.Bg
79.20.Eb
Opis:
The interaction of single-pulse Nd:YAG laser, operating at 1064 nm wavelength and 6 ns pulse duration, with AISI 316L stainless steel target surface was investigated experimentally and theoretically. Surface modification of stainless steel using laser irradiation was studied by observing the effects of varying incident laser pulse intensities on surface morphology. Surface structure of laser treated stainless steel was determined by optical microscopy and profilometry analyses. Numerical calculation by heat transfer equation was performed for single laser pulse irradiation. The results, obtained by theoretical and experimental processes, of the interaction between single-pulse Nd:YAG laser irradiation and AISI 316L stainless steel target surface are reported.
Źródło:
Acta Physica Polonica A; 2014, 125, 2; 439-441
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł

Ta witryna wykorzystuje pliki cookies do przechowywania informacji na Twoim komputerze. Pliki cookies stosujemy w celu świadczenia usług na najwyższym poziomie, w tym w sposób dostosowany do indywidualnych potrzeb. Korzystanie z witryny bez zmiany ustawień dotyczących cookies oznacza, że będą one zamieszczane w Twoim komputerze. W każdym momencie możesz dokonać zmiany ustawień dotyczących cookies