Application of Third Generation Synchrotron Source to Studies of Non-Crystalline Materials: In-Se Amorphous Films

The local structure of vacuum evaporated In-Se amorphous films, containing 50, 60, and 66 at.% Se, was studied using differential anomalous X-ray scattering and extended X-ray absorption fine structure. Both intensity and absorption spectra were measured in the vicinity of the absorption K-edge of Se. The differential anomalous X-ray scattering data were converted to real space by the inverse Fourier transform yielding the differential radial distribution functions. The obtained results provide evidence for the presence of Se-In spatial correlations for In$\text{}_{50}$Se$\text{}_{50}$ and Se-In and Se-Se correlations for In$\text{}_{40}$Se$\text{}_{60}$ and In$\text{}_{34}$Se$\text{}_{66}$ within the first coordination sphere.