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Wyszukujesz frazę "Karwasz, G. P." wg kryterium: Autor

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    Wyświetlanie 1-9 z 9
    Tytuł:
    Positron Annihilation Studies of Czochralski-Grown Silicon Annealed Under Pressure
    Autorzy:
    Karwasz, G. P.
    Brusa, R. S.
    Misiuk, A.
    Zecca, A.
    Powiązania:
    https://bibliotekanauki.pl/articles/2008074.pdf
    Data publikacji:
    1999-04
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    71.60.+z
    78.70.Bj
    71.55.Cn
    Opis:
    Two positron techniques have been applied to study dynamics of oxygen precipitation in Czochralski-grown silicon, annealed under high (up to 1.4 GPa) pressure. Lifetime measurements were performed with 180 ps resolution; Doppler broadening with a variable-energy slow-positron beam. Different thermal treatings rise the mean lifetime of positrons from 222 ps in as-grown samples up to 227 ps. In samples with a high (up to 85%) amount of oxygen precipitated, an intermediate (550-800 ps) lifetime is observed.
    Źródło:
    Acta Physica Polonica A; 1999, 95, 4; 575-580
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Porosity of Low-κ Materials Studied by Slow Positron Beam
    Autorzy:
    Brusa, R. S.
    Macchi, C.
    Mariazzi, S.
    Karwasz, G. P.
    Powiązania:
    https://bibliotekanauki.pl/articles/2042213.pdf
    Data publikacji:
    2005-04
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    71.60.+z
    78.70.Bj
    68.60.Dv
    68.90.+g
    Opis:
    The information about porosity in low-κ materials obtainable by depth profiling with positron annihilation spectroscopy is reviewed. In particular we focus on Doppler broadening spectroscopy and 2-3γ ratio of positronium measurements on SiOCH and amorphous carbon a-C:F:H thin films produced by plasma enhanced chemical vapour deposition.
    Źródło:
    Acta Physica Polonica A; 2005, 107, 4; 702-711
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Low Energy Cross-Sections for Positron Interactions with Cyclic Hydrocarbons
    Autorzy:
    Karwasz, G. P.
    Pliszka, D.
    Brusa, R. S.
    Perazzolli, C.
    Powiązania:
    https://bibliotekanauki.pl/articles/2042198.pdf
    Data publikacji:
    2005-04
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    34.85.+x
    39.90.+d
    Opis:
    We report total cross-section measurements for positron scattering on cyclic hydrocarbons: benzene, aniline, and cyclohexane. Measurements were done by an absolute transition method in the energy range 1.5-20 eV (0.4-20 eV for cyclohexane). High cross-sections for all measured molecules were observed at low energies. In the case of cyclohexane the cross-section in the zero energy limit tends to a constant value. In aniline a weakly accented peak slightly above the positronium formation threshold is observed. Similar but less visible bump was observed in the case of benzene. Measurement of total cross-sections in nitrogen and argon used for calibration of the apparatus are also presented.
    Źródło:
    Acta Physica Polonica A; 2005, 107, 4; 666-672
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Toward a European Network of Positron Laboratories
    Autorzy:
    Karwasz, G. P.
    Brusa, R. S.
    Egger, W.
    Ogorodnikova, O. V.
    Powiązania:
    https://bibliotekanauki.pl/articles/146548.pdf
    Data publikacji:
    2015
    Wydawca:
    Instytut Chemii i Techniki Jądrowej
    Tematy:
    positron beams
    material science
    thermonuclear reaction
    Opis:
    Some applications of controlled-energy positron beams in material studies are discussed. In porous organic polysilicates, measurements of 3γ annihilation by Doppler broadening (DB) method at the Trento University allowed to trace pore closing and filling by water vapor. In silicon coimplanted by He+ and H+, DB data combined with positron lifetime measurements at the München pulsed positron beam allowed to explain Si blistering. Presently measured samples of W for applications in thermonuclear reactors, irradiated by W+ and electrons, show vast changes of positron lifetimes, indicating complex dynamics of defects.
    Źródło:
    Nukleonika; 2015, 60, No. 4, part 1; 733-739
    0029-5922
    1508-5791
    Pojawia się w:
    Nukleonika
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Positron Scattering on Atoms and Molecules in the Limit of Low Energy
    Autorzy:
    Karwasz, G. P.
    Brusa, R. S.
    Pliszka, D.
    Idziaszek, Z.
    Nowakowska, H.
    Powiązania:
    https://bibliotekanauki.pl/articles/2047133.pdf
    Data publikacji:
    2006-11
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    34.85.+x
    39.90.+d
    Opis:
    Starting from experimental cross-sections for positron scattering in argon and nitrogen, we examine different energy ranges. In the zero-energy limit the cross-section falls with energy and can be described by modified effective range theory for polarization potential. In a few eV range the cross-sections are constant vs. energy. As far as it is possible to force the elastic scattering phase shifts in a way that both experimental differential cross-sections are reproduced and the total cross-section remains constant in energy, such a model lacks the physical justification. Only the virtual-positronium model, developed recently by Gribakin, reproduces a constant dependence of the total cross section in a few eV energy range.
    Źródło:
    Acta Physica Polonica A; 2006, 110, 5; 605-614
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Systematic Measurements of Doppler-Coincidence Spectra for Positron Annihilation in Pure Metals and Semiconductors
    Autorzy:
    Deng, W.
    Pliszka, D.
    Brusa, R. S.
    Karwasz, G. P.
    Zecca, A.
    Powiązania:
    https://bibliotekanauki.pl/articles/2030758.pdf
    Data publikacji:
    2002-06
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    71.60.+z
    78.70.Bj
    Opis:
    Doppler-broadening measurements of the electron-positron annihilation line in twenty six elements are presented. The adopted coincidence technique allows to reduce the background and point out the contribution of positron annihilation with core electrons. The changes of the high momentum contribution is presented for selected examples and a semiempirical analysis of the dependence on electronic structure is performed. Measured data are in a good agreement with recent theoretical calculations and can be used to identification of impurities surrounding open volume defects.
    Źródło:
    Acta Physica Polonica A; 2002, 101, 6; 875-892
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Structural Studies of Titanium Oxide Multilayers
    Autorzy:
    Karwasz, G. P.
    Miotello, A.
    Zomer, E.
    Brusa, R. S.
    Kościelska, B.
    Armellini, C.
    Kuzmin, A.
    Powiązania:
    https://bibliotekanauki.pl/articles/2043379.pdf
    Data publikacji:
    2005-06
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    82.47.Jk
    78.70.Bj
    61.10.Nz
    Opis:
    Multilayers of titanium oxide on conductive glasses (silica, covered with indium/tin and tin oxides) were obtained by different methods (from suspension, by sol-gel, by vacuum sputtering). X-ray diffraction and positron annihilation depth-resolved characterization of these samples are presented. The data allow us to determine optimal deposition parameters, in order to obtain the anatase phase, important in practical applications in photoelectrochemical cells.
    Źródło:
    Acta Physica Polonica A; 2005, 107, 6; 977-982
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Amorphous Carbon Thin Films Deposited on Si and PET: Study of Interface States
    Autorzy:
    Mariazzi, S.
    Macchi, C.
    Karwasz, G. P.
    Brusa, R. S.
    Laidani, N.
    Bartali, R.
    Gottardi, G.
    Anderle, M.
    Powiązania:
    https://bibliotekanauki.pl/articles/2043339.pdf
    Data publikacji:
    2005-05
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    68.55.Ac
    71.60.+z
    73.20.At
    78.70.Bj
    Opis:
    Thin carbon films with various thicknesses, deposited on different substrates (Si and poly-ethylene-terephthalate) at the same operating conditions in a radio frequency plasma enhanced chemical vapour deposition system were characterized by Doppler broadening spectroscopy. The films and the substrates were depth profiled by a slow positron beam. The aim of these measurements was to study the open volume structure and the interface of the films. It was found that, independently from the substrate, the films were homogeneous and exhibited the same open volume distribution. On the contrary, the effective positron diffusion length in the Si substrate was found to change with the thickness of the carbon films. This behaviour was interpreted as a change in the electric field at the carbon/silicon interface.
    Źródło:
    Acta Physica Polonica A; 2005, 107, 5; 842-847
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Surfaces of Electron-Emitting Glasses Studied by a Slow Positron Beam
    Autorzy:
    Pliszka, D.
    Gazda, M.
    Kusz, B.
    Trzebiatowski, K.
    Karwasz, G. P.
    Deng, W.
    Brusa, R. S.
    Zecca, A.
    Powiązania:
    https://bibliotekanauki.pl/articles/2025748.pdf
    Data publikacji:
    2001
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    71.60.+z
    78.70.Bj
    Opis:
    Semi-conducting glasses used for electron multipliers and microchannel plate devices are obtained by surface modification of Pb or Bi-reach silicon-based glasses. The reduced layer extends down to 200-500 nm, much more than the effective depth of the electron-emitting layer. By the use of slow-positron beam we monitor the structural changes undergoing in near-to-surface layers after isothermal annealing. The measurements suggest a possible correlation between secondary-electron emission coefficient and the Doppler-broadening S-parameter. On these samples there were also performed atomic force microscopy, secondary electron emission, differential scanning calorimetry, and electric conductivity measurements.
    Źródło:
    Acta Physica Polonica A; 2001, 99, 3-4; 465-472
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-9 z 9

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