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Wyświetlanie 1-15 z 33
Tytuł:
Optimization of soft X-ray tomography on the COMPASS tokamak
Autorzy:
Imríšek, M.
Mlynář, J.
Löffelmann, V.
Weinzettl, V.
Odstrčil, T.
Odstrčil, M.
Tomeš, M.
Powiązania:
https://bibliotekanauki.pl/articles/146251.pdf
Data publikacji:
2016
Wydawca:
Instytut Chemii i Techniki Jądrowej
Tematy:
soft X-ray
tomography
Tikhonov regularization
tokamak
Opis:
The COMPASS tokamak is equipped with the soft X-ray (SXR) diagnostic system based on silicon photodiode arrays shielded by a thin beryllium foil. The diagnostic is composed of two pinhole cameras having 35 channels each and one vertical pinhole camera with 20 channels, which was installed recently to improve tomographic inversions. Lines of sight of the SXR detectors cover almost complete poloidal cross section of the COMPASS vessel with a spatial resolution of 1–2 cm and temporal resolution of about 3 s. Local emissivity is reconstructed via Tikhonov regularization constrained by minimum Fisher information that provides reliable and robust solution despite limited number of projections and ill-conditionality of this task. Improved border conditions and numerical differentiation matrices suppressing artifacts in reconstructed radiation were implemented in the code. Furthermore, a fast algorithm eliminating iterative processes was developed, and it is foreseen to be tested in real-time plasma control.
Źródło:
Nukleonika; 2016, 61, 4; 403-408
0029-5922
1508-5791
Pojawia się w:
Nukleonika
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Development of a Soft X-ray Microprobe for Radiobiology Studies
Autorzy:
Appuhamilage, I.
Adjei, D.
Alatabi, S.
Alnaimi, R.
Michette, A.
Pfauntsch, S.
Powiązania:
https://bibliotekanauki.pl/articles/1197646.pdf
Data publikacji:
2014-04
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
41.50.+h
07.85.Fv
Opis:
The King's College London (KCL) first X-ray microprobe (MKI) and the third generation microfocus X-ray sources (MKIII) are intended to be used for various applications including the study of physical and biological interactions at the atomic and molecular scales. The microfocus ultra-soft X-ray sources (MKI and MKIII) with interchangeable targets will provide a superior spatial resolution (a focal spot a few hundreds of nanometres in diameter can be achieved) and the control of the dose delivered to irradiated cells. This will require characterization of the spectra and intensities of the source, measurements of the focus intensities and spot sizes of suitable X-ray optics such as zone plates, grazing incidence microstructured optical arrays and multilayer mirrors.
Źródło:
Acta Physica Polonica A; 2014, 125, 4; 882-885
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Second order reflection from crystals used in soft X-ray spectroscopy
Autorzy:
Książek, I.
Powiązania:
https://bibliotekanauki.pl/articles/146093.pdf
Data publikacji:
2015
Wydawca:
Instytut Chemii i Techniki Jądrowej
Tematy:
soft X-ray
plasma spectroscopy
PbSt
KAP
Opis:
In this note the ratio of the second to the first order reflection is determined for the KAP and PbSt crystals, for wavelengths corresponding to the Al K-line emission. The source of the radiation was a low-voltage stabilized X-ray tube. The X-rays were detected with a Bragg spectrometer equipped with a proportional counter detector. The signal measured by the proportional counter was subsequently pulse height analyzed.
Źródło:
Nukleonika; 2015, 60, 2; 263-265
0029-5922
1508-5791
Pojawia się w:
Nukleonika
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Soft X-Ray Spectromicroscopy and its Application to Semiconductor Microstructure Characterization
Autorzy:
Gozzo, F.
Franck, K.
Howells, M. R.
Hussain, Z.
Warwick, A.
Padmore, H. A.
Triplett, B. B.
Powiązania:
https://bibliotekanauki.pl/articles/1963346.pdf
Data publikacji:
1997-04
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.16.-d
85.40.-e
79.60.-i
Opis:
The universal trend towards device miniaturization has driven the semiconductor industry to develop sophisticated and complex instrumentation for the characterization of microstructures. Many significant problems of relevance to the semiconductor industry cannot be solved with conventional analysis techniques, but can be addressed with soft X-ray spectromicroscopy. An active spectromicroscopy program is being developed at the Advanced Light Source, attracting both the semiconductor industry and the materials science academic community. Examples of spectromicroscopy techniques are presented. An Advanced Light Source μ-XPS spectromicroscopy project is discussed, involving the first microscope completely dedicated and designed for microstructure analysis on patterned silicon wafers.
Źródło:
Acta Physica Polonica A; 1997, 91, 4; 697-705
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Limitations of thermoluminescent dosimeters in soft X-ray diagnostics of pulsed plasma
Autorzy:
Krása, J.
Fárníková, M.
Juha, L.
Cejnarová, A.
Powiązania:
https://bibliotekanauki.pl/articles/147287.pdf
Data publikacji:
2001
Wydawca:
Instytut Chemii i Techniki Jądrowej
Tematy:
dosimetry of photons
thermoluminescent dosimeters
X-ray plasma diagnostics
Opis:
Responses of thermoluminescent dosimeters (TLDs) of CaF2:Dy, CaF2:Mn, and LiF:Mg,Cu,P to the deposited energy of monochromatic 1.75–3.5 keV radiation were measured with respect to an increase in the local dose due to the attenuation length that was much shorter than the TLD thickness. The responses of TLDs to X-ray emission from the laserproduced aluminium plasma were found to be independent of the dose rate within a wide range.
Źródło:
Nukleonika; 2001, 46, suppl. 1; 49-51
0029-5922
1508-5791
Pojawia się w:
Nukleonika
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Biomedical application of soft X-ray microscopy with special reference to spectromicroscopy
Autorzy:
Ito, A.
Inoue, T.
Kado, M.
Ohigashi, T.
Tone, S.
Shinohara, K.
Powiązania:
https://bibliotekanauki.pl/articles/1065144.pdf
Data publikacji:
2016-02
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
87.59.-e
Opis:
Soft X-ray microscopy has great advantages over other types of microscopy on the observation of hydrated specimens at high spatial resolution below 100 nm, and on the elemental and molecular mapping using absorption characteristics. These advantages are particularly suitable for biomedical applications. A possible problem associated with observation of specimens at high spatial resolution in a hydrated environment is described and a strategy to overcome the problem is presented. The latter part of the present report deals with spectromicroscopy to obtain molecular distribution in biological specimens. DNA and protein distributions in isolated nuclei are examined following to the progression of apoptosis at high resolution, and the oxidation product is visualized in human hair in relation to calcium content.
Źródło:
Acta Physica Polonica A; 2016, 129, 2; 260-263
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Contact Microscopy using a Compact Laser Produced Plasma Soft X-Ray Source
Autorzy:
Ayele, M.
Czwartos, J.
Adjei, D.
Wachulak, P.
Ahad, I.
Bartnik, A.
Wegrzynski, Ł.
Szczurek, M.
Jarocki, R.
Fiedorowicz, H.
Lekka, M.
Pogoda, K.
Gostek, J.
Powiązania:
https://bibliotekanauki.pl/articles/1398826.pdf
Data publikacji:
2016-02
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
52.50.Jm
68.37.Yz
85.40.Hp
Opis:
Soft X-ray contact microscopy potentially allows imaging of wet living biological specimens at a spatial resolution higher than optical microscopy and without many of the constraints of scanning electron microscopy. In this paper, we present the development of a laboratory scale contact microscope that uses a laser produced plasma soft X-ray source. The source is based on a double-stream gas-puff target approach and it operates in the "water window" spectral range which enables to capture images of biological samples with a natural contrast. In the preliminary experiments the contact microscope system has been used for imaging of fixed and dried non-malignant HCV29 human bladder cell lines cultured on polymethyl methacrylate photoresists. The samples were exposed with 150 pulses of soft X-rays as an initial test to demonstrate the possibility of image formation. The soft X-ray contact images registered in the photoresists exhibit high resolution in the atomic force microscopy topography which indicates the potential application of soft X-ray contact microscopy in life science to examine small features as small as few tens of nm. The technique could also be used for living cell imaging with further optimization of the microscope system and development of a special specimen holder. The details of the soft X-ray contact microscopy technique and the experimental results are presented and discussed.
Źródło:
Acta Physica Polonica A; 2016, 129, 2; 237-240
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Recent measurements of soft X-ray emission from the DPF-1000U facility
Autorzy:
Surała, W.
Sadowski, M. J.
Paduch, M.
Zielinska, E.
Tomaszewski, K.
Powiązania:
https://bibliotekanauki.pl/articles/148171.pdf
Data publikacji:
2015
Wydawca:
Instytut Chemii i Techniki Jądrowej
Tematy:
plasma focus
X-ray emission
X-ray images
gas puffing
filaments
hot spots
Opis:
Soft X-ray imaging is a very useful diagnostic technique in plasma-focus (PF) experiments. This paper reports results of four experimental sessions which were carried out at the DPF-1000U plasma-focus facility in 2013 and 2014. Over 200 discharges were performed at various experimental conditions. Measurements were taken using two X-ray pinhole cameras with a line of sight perpendicular to the z-axis, at different azimuthal angles (about 20° and 200°), and looking towards the centre of the PF-pinch column. They were equipped with diaphragms 1000 μm or 200–300 μm in diameter and coated with filters of 500 μm Al foil and 10 μm Be foil, respectively. Data on the neutron emission were collected with silver activation counters. For time-resolved measurements the use was made of four PIN diodes equipped with various fi lters and oriented towards the centre of the PF-column, in the direction perpendicular to the electrode axis. The recorded X-ray images revealed that when the additional gas-puff system is activated during the discharge, the stability of the discharge is improved. The data collected in these experiments confi rmed the appearance of a filamentary fi ne structure in the PF discharges. In the past years the formation of such fi laments was observed in many Z-pinch type experiments. Some of the recorded X-ray images have also revealed the appearance of the so-called hot- -spots, i.e. small plasma regions of a very intense X-ray emission. Such a phenomenon was observed before in many PF experiments, e.g. in the MAJA-PF device, but it has not been investigated so far in a large facility such as the DPF-1000U. The time-resolved measurements provided the evidence of a time lapse between the X-ray emission from plasma regions located at different distance from the anode surface. The formation of distinct ‘hot-spots’ in different instants of the DPF-1000U discharge was also observed.
Źródło:
Nukleonika; 2015, 60, 2; 303-308
0029-5922
1508-5791
Pojawia się w:
Nukleonika
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Studies of Solids and Adsorbates in Synchrotron Radiation Excited Soft X-Ray Fluorescence
Autorzy:
Nordgren, J.
Wassdahl, N.
Powiązania:
https://bibliotekanauki.pl/articles/1920879.pdf
Data publikacji:
1992-08
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.70.En
Opis:
A progress report is presented on recent developments in soft X-ray emission spectroscopy using synchrotron radiation. Some key experiments are discussed demonstrating that new information can be gained by using synchrotron radiation for this purpose. Recent work on highly resolved soft X-ray emission from monolayers of adsorbed species is commented on and some perspectives are given regarding further developments expected from the third generation sources that are underway.
Źródło:
Acta Physica Polonica A; 1992, 82, 2; 251-262
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Measurements of fast electron beams and soft X-ray emission from plasma-focus experiments
Autorzy:
Surała, W.
Sadowski, M. J.
Kwiatkowski, R.
Jakubowski, L.
Żebrowski, J.
Powiązania:
https://bibliotekanauki.pl/articles/147850.pdf
Data publikacji:
2016
Wydawca:
Instytut Chemii i Techniki Jądrowej
Tematy:
electron beams
X-ray emission
plasma focus
hot spots
Opis:
The paper reports results of the recent experimental studies of pulsed electron beams and soft X-rays in plasma-focus (PF) experiments carried out within a modifi ed PF-360U facility at the NCBJ, Poland. Particular attention was focused on time-resolved measurements of the fast electron beams by means of two different magnetic analyzers, which could record electrons of energy ranging from about 41 keV to about 715 keV in several (6 or 8) measuring channels. For discharges performed with the pure deuterium fi lling, many strong electron signals were recorded in all the measuring channels. Those signals were well correlated with the fi rst hard X-ray pulse detected by an external scintillation neutron-counter. In some of the analyzer channels, electron spikes (lasting about dozens of nanoseconds) and appearing in different instants after the current peculiarity (so-called current dip) were also recorded. For several discharges, fast ion beams, which were emitted along the z-axis and recorded with nuclear track detectors, were also investigated. Those measurements confi rmed a multibeam character of the ion emission. The time-integrated soft X-ray images, which were taken side-on by means of a pinhole camera and sensitive X-ray fi lms, showed the appearance of some fi lamentary structures and so-called hot spots. The application of small amounts of admixtures of different heavy noble gases, i.e. of argon (4.8% volumetric), krypton (1.6% volumetric), or xenon (0.8% volumetric), decreased intensity of the recorded electron beams, but increased intensity of the soft X-ray emission and showed more distinct and numerous hot spots. The recorded electron spikes have been explained as signals produced by quasi-mono-energetic microbeams emitted from tiny sources (probably plasma diodes), which can be formed near the observed hot spots.
Źródło:
Nukleonika; 2016, 61, 2; 161-167
0029-5922
1508-5791
Pojawia się w:
Nukleonika
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Measurement Capabilities Upgrade of GEM Soft X-ray Measurement System for Hot Plasma Diagnostics
Autorzy:
Linczuk, Pawel
Wojenski, Andrzej
Kolasinski, Piotr
Krawczyk, Rafal
Zabolotny, Wojciech
Pozniak, Krzysztof
Chernyshova, Maryna
Czarski, Tomasz
Gaska, Michal
Kasprowicz, Grzegorz
Malinowski, Karol
Powiązania:
https://bibliotekanauki.pl/articles/1844588.pdf
Data publikacji:
2021
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
measurement system
GEM
DAQ
Opis:
The paper presents improvements of the developed system for hot plasma radiation measurement in the soft Xray range based on a Gas Electron Multiplier (GEM) detector. Scope of work consists of a new solution for handling hardware time-synchronization with tokamak systems needed for better synchronization with other diagnostics and measurement quality. The paper describes the support of new modes of triggering on PC-side. There are communication and data path overview in the system. The new API is described, which provide separate channels for data and control and is more robust than the earlier solution. Work concentrates on stability and usability improvements of the implemented device providing better usage for end-user.
Źródło:
International Journal of Electronics and Telecommunications; 2021, 67, 1; 115-120
2300-1933
Pojawia się w:
International Journal of Electronics and Telecommunications
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Soft X-ray Diagnostic System Upgrades and Data Quality Monitoring Features for Tokamak Usage
Autorzy:
Wojenski, Andrzej
Linczuk, Paweł
Piotr, Kolasinski
Chernyshova, Maryna
Mazon, Didier
Kasprowicz, Grzegorz
Pozniak, Krzysztof T.
Gaska, Michał
Czarski, Tomasz
Krawczyk, Rafał
Powiązania:
https://bibliotekanauki.pl/articles/1844595.pdf
Data publikacji:
2021
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
data quality monitoring
FPGA
Verilog/VHDL
HDL
GEM detector
SXR plasma diagnostics
modular measurement system
data evaluation
tokamak
Opis:
The validation of the measurements quality after on-site diagnostic system installation is necessary in order to provide reliable data and output results. This topic is often neglected or not discussed in detail regarding measurement systems. In the paper recently installed system for soft X-ray measurements is described in introduction. The system is based on multichannel GEM detector and the data is collected and sent in special format to PC unit for further postprocessing. The unique feature of the system is the ability to compute final data based on raw data only. The raw data is selected upon algorithms by FPGA units. The FPGAs are connected to the analog frontend of the system and able to register all of the signals and collect the useful data. The interface used for data streaming is PCIe Gen2 x4 for each FPGA, therefore high throughput of the system is ensured. The paper then discusses the properties of the installation environment of the system and basic functionality mode. New features are described, both in theoretical and practical approach. New modes correspond to the data quality monitoring features implemented for the system, that provide extra information to the postprocessing stage and final algorithms. In the article is described also additional mode to perform hardware simulation of signals in a tokamak-like environment using FPGAs. The summary describes the implemented features of the data quality monitoring features and additional modes of the system.
Źródło:
International Journal of Electronics and Telecommunications; 2021, 67, 1; 109-114
2300-1933
Pojawia się w:
International Journal of Electronics and Telecommunications
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Nanoimaging Using Soft X-Ray and EUV Sources Based on Double Stream Gas Puff Targets
Autorzy:
Wachulak, P.
Torrisi, A.
Ayele, M.
Bartnik, A.
Węgrzyński, Ł.
Fok, T.
Czwartos, J.
Fiedorowicz, H.
Powiązania:
https://bibliotekanauki.pl/articles/1030619.pdf
Data publikacji:
2018-02
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
gas puff target
Fresnel zone plates
EUV/SXR microscopy
contact microscopy
imaging
nanometer resolution
Opis:
In this work we present recent results on nanoscale imaging in the extreme ultraviolet and soft X-ray spectral ranges, describing three novel imaging systems dedicated for high spatial resolution imaging of nanoscale objects with the extreme ultraviolet and soft X-ray radiations. The extreme ultraviolet and soft X-ray full field microscopes operate at 13.8 nm and 2.88 nm wavelengths and are capable of imaging of nanostructures with a sub-50 nm spatial resolution. A soft X-ray contact microscope operates in the "water-window" spectral range from 2.3 to 4.4 nm wavelength, to obtain images of an internal structure of the investigated object in a thin surface layer of soft X-ray light sensitive photoresist. The development of such compact imaging systems may, in the near future, be important from the point of view of new research related to biological, material science, and nanotechnology applications. Such preliminary applications are also shown in the studies of biological samples, including carcinoma cells, diatoms, and neurons.
Źródło:
Acta Physica Polonica A; 2018, 133, 2; 271-276
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Wyświetlanie 1-15 z 33

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