- Tytuł:
- Low-cost IR system for thermal characterization of electronic devices
- Autorzy:
-
Kopeć, M.
Więcek, B. - Powiązania:
- https://bibliotekanauki.pl/articles/114060.pdf
- Data publikacji:
- 2018
- Wydawca:
- Stowarzyszenie Inżynierów i Techników Mechaników Polskich
- Tematy:
-
thermal impedance
Foster network
thermal time constants
temperature measurement - Opis:
- In this article, a Low-cost measurement Infra-Red (IR) system for dynamic thermal testing of electronic devices is described. The element is powered by a step-function current and simultaneously temperature is measured by a fast single-detector IR head. The thermal impedance Zth(jω) is calculated using the Laplace transform and the Foster network is to get thermal time constants distribution.
- Źródło:
-
Measurement Automation Monitoring; 2018, 64, 4; 103-107
2450-2855 - Pojawia się w:
- Measurement Automation Monitoring
- Dostawca treści:
- Biblioteka Nauki
Artykuł