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Wyszukujesz frazę "61.16.-d" wg kryterium: Temat


Wyświetlanie 1-10 z 10
Tytuł:
The Optical Method of Determining the Point Symmetries
Autorzy:
Malinowski, S.
Powiązania:
https://bibliotekanauki.pl/articles/1887979.pdf
Data publikacji:
1991-07
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.16.-d
78.20.Bh
78.20.Jq
78.20.Ls
Opis:
The present symmetry theory of optical phenomena makes it possible to determine each of 122 point symmetry groups both for non-dispersive as well as dispersive media. This is achieved by considering the symmetry breaking effect external fields (separately E and H) on the propagation of electromagnetic waves. The corresponding results are collected in Tables I-III. The way of measuring the relevant physical quantities is proposed. The point symmetry of a given sample is obtained by comparing the experimental results with their theoretical counterparts. The results given in Tables I-III can also be viewed as the discussion of the "canonical" solutions (effects) for a given symmetry K.
Źródło:
Acta Physica Polonica A; 1991, 80, 1; 61-79
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Surface Self-Diffusion of Iridium: Field Electron Emission Study
Autorzy:
Antczak, G.
Błaszczyszyn, M.
Błaszczyszyn, R.
Powiązania:
https://bibliotekanauki.pl/articles/2014253.pdf
Data publikacji:
2000-10
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.16.-d
68.35.Fx
68.90.+g
68.55.-a
Opis:
The self-diffusion of iridium was studied by means of field electron microscopy. The measurements, based on the well-known process of surface build-up, were carried out under the UHV conditions within the temperature range of 790-935K. The activation energy for the diffusion was determined to be equal to 2.10±0.10eV/atom (48.4±2.3kcal/mol). This value is compared with activation energies for self-diffusion on other metal surfaces, as well as with those for self-diffusion of single iridium atoms and clusters on iridium, known from the field ion microscopy measurements.
Źródło:
Acta Physica Polonica A; 2000, 98, 4; 383-388
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Structures in Multicomponent Polymer Films: Their Formation, Observation and Applications in Electronics and Biotechnology
Autorzy:
Budkowski, A.
Bernasik, A.
Moons, E.
Lekka, M.
Zemła, J.
Jaczewska, J.
Haberko, J.
Raczkowska, J.
Rysz, J.
Awsiuk, K.
Powiązania:
https://bibliotekanauki.pl/articles/1808304.pdf
Data publikacji:
2009-02
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
81.16.Dn
61.25.H-
68.37.-d
82.80.Ms
85.60.-q
85.65.+h
82.37.Rs
Opis:
Several strategies to form multicomponent films of functional polymers, with micron, submicron and nanometer structures, intended for plastic electronics and biotechnology are presented. These approaches are based on film deposition from polymer solution onto a rotating substrate (spin-casting), a method implemented already on manufacturing lines. Film structures are determined with compositional (nanometer) depth profiling and (submicron) imaging modes of dynamic secondary ion mass spectrometry, near-field scanning optical microscopy (with submicron resolution) and scanning probe microscopy (revealing nanometer features). Self-organization of spin-cast polymer mixtures is discussed in detail, since it offers a one-step process to deposit and align simultaneously domains, rich in different polymers, forming various device elements: (i) Surface segregation drives self-stratification of nanometer lamellae for solar cells and anisotropic conductors. (ii) Cohesion energy density controls morphological transition from lamellar (optimal for encapsulated transistors) to lateral structures (suggested for light emitting diodes with variable color). (iii) Selective adhesion to substrate microtemplates, patterned chemically, orders lateral structures for plastic circuitries. (iv) Submicron imprints of water droplets (breath figures) decorate selectively micron-sized domains, and can be used in devices with hierarchic structure. In addition, selective protein adsorption to regular polymer micropatterns, formed with soft lithography after spin-casting, suggests applications in protein chip technology. An approach to reduce lateral blend film structures to submicron scale is also presented, based on (annealed) films of multicomponent nanoparticles.
Źródło:
Acta Physica Polonica A; 2009, 115, 2; 435-440
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Structural Mechanism of the High-Damping State Formation in the Fe-Mn-Si Shape Memory Alloys
Autorzy:
Udovenko, V. A.
Polyakova, N. A.
Turmambekov, T. A.
Powiązania:
https://bibliotekanauki.pl/articles/2011038.pdf
Data publikacji:
1999-08
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.16.-d
75.50.Bb
75.60.Ej
75.80.+q
Opis:
The structural mechanism of the high-damping state formation in the Fe-Mn-Si alloys has been investigated using transition electron microscopy and logarithmic decrement measurements. The high level of the elastic energy dissipation was found to be connected with a reversible movement of the Shockley dislocations under the sign changing stress action. The Shockley dislocations density and mobility are controlled by the alloys compositions and prior deformation value. The increase in the dislocations density with the help of the special cycling treatments can improve the alloys damping capacity.
Źródło:
Acta Physica Polonica A; 1999, 96, 2; 307-310
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Structural and Electron Paramagnetic Resonance Studies of (ZrO)$\text{}_{0.8}$(Y$\text{}_{2}$O$\text{}_{3}$)$\text{}_{0.2}$
Autorzy:
Shukla, N. L.
Sharma, S. V.
Chand, P.
Misra, B. N.
Powiązania:
https://bibliotekanauki.pl/articles/1929172.pdf
Data publikacji:
1993-04
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.16.-d
61.10.Lx
76.30.Fc
Opis:
The polycrystalline samples of copper and vanadium doped as well as undoped (ZrO)$\text{}_{0.8}$(Y$\text{}_{2}$O$\text{}_{3}$)$\text{}_{0.2}$ were synthesized and studied using X-ray diffraction, scanning electron microscopy and electron paramagnetic resonance (EPR) techniques in order to investigate their structural and magnetic behaviour. The effect of exposure to lithium vapours on the host lattice of these ceramic materials is also studied using EPR technique. It has been observed from X-ray diffraction study that the samples consist of mainly two phases monoclinic and tetragonal. The monoclinic phase is in dominant proportion. Scanning electron microscope study showed that the morphology of the samples is similar to each other. EPR studies showed interesting changes on diffusion of lithium into the lattice of the host materials.
Źródło:
Acta Physica Polonica A; 1993, 83, 4; 441-449
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
SrLaGaO$\text{}_{4}$-SrLaAlO$\text{}_{4}$ Solid Solutions - Substrate Materials with Tuneable Lattice Parameter for Various HTSC Compounds
Autorzy:
Berkowski, M.
Fink-Finowicki, J.
Mojaiskaia, E.
Powiązania:
https://bibliotekanauki.pl/articles/1964363.pdf
Data publikacji:
1997-07
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.16.-d
81.10.Fq
61.50.Νw
64.75.+g
Opis:
The increase in Τ$\text{}_{c}$ for high temperature superconductors can be realized, among others, by appropriate substrate/film combinations. SrLaGaO$\text{}_{4}$-SrLaΑlO$\text{}_{4}$ solid solutions were grown by the Czochralski method. The already achieved results allow to obtain single crystals of SrLaΑl$\text{}_{1-x}$Ga$\text{}_{x}$O$\text{}_{4}$ with lattice constant a in the range from 0.3754 to 0.3775 nm, and SrLaGa$\text{}_{1-x}$Αl$\text{}_{x}$O$\text{}_{4}$ crystals with lattice constant a in the range from 0.3843 to 0.3826 nm. Electron-probe microanalysis along obtained single crystals was used for determination of segregation coefficient between aluminum and gallium ions.
Źródło:
Acta Physica Polonica A; 1997, 92, 1; 182-186
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Soft X-Ray Spectromicroscopy and its Application to Semiconductor Microstructure Characterization
Autorzy:
Gozzo, F.
Franck, K.
Howells, M. R.
Hussain, Z.
Warwick, A.
Padmore, H. A.
Triplett, B. B.
Powiązania:
https://bibliotekanauki.pl/articles/1963346.pdf
Data publikacji:
1997-04
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.16.-d
85.40.-e
79.60.-i
Opis:
The universal trend towards device miniaturization has driven the semiconductor industry to develop sophisticated and complex instrumentation for the characterization of microstructures. Many significant problems of relevance to the semiconductor industry cannot be solved with conventional analysis techniques, but can be addressed with soft X-ray spectromicroscopy. An active spectromicroscopy program is being developed at the Advanced Light Source, attracting both the semiconductor industry and the materials science academic community. Examples of spectromicroscopy techniques are presented. An Advanced Light Source μ-XPS spectromicroscopy project is discussed, involving the first microscope completely dedicated and designed for microstructure analysis on patterned silicon wafers.
Źródło:
Acta Physica Polonica A; 1997, 91, 4; 697-705
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Preliminary Investigations into the Purification and Functionalization of Multiwall Carbon Nanotubes
Autorzy:
Trykowski, G.
Biniak, S.
Stobinski, L.
Lesiak, B.
Powiązania:
https://bibliotekanauki.pl/articles/1536523.pdf
Data publikacji:
2010-09
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.48.De
81.16.Be
07.57.Ty
82.80-d
68.37.Hk
Opis:
The purification and functionalization of commercial multiwall carbon nanotubes was investigated. Carbon nanotubes (CNT CO., Ltd, Korea) were treated with boiling concentrated HNO_3 under a reflux condenser for about 50 h at 120°C in order to purify and oxidize the raw material. The oxidized multiwall carbon nanotubes were rinsed with deionized water until stabilization of the filtrate pH. Measurement techniques included elemental analysis (CHN), scanning electron microscopy with energy dispersive X-ray spectrometer, inductively coupled plasma mass spectrometry, Fourier transform infrared spectroscopy and thermal analysis. With the measurement techniques used the following information was obtained: CHN analysis provided information about the quantitative composition of the following elements carbon, hydrogen, nitrogen, scanning electron microscopy imaging provided information on shape, thickness and length of the nanotubes, energy dispersive X-ray spectrometry analysis of information about surface atomic composition of the quantitative analysis, inductively coupled plasma mass spectrometry quantitative analysis of the atomic composition (metals, especially Fe, Al), the Fourier transform infrared studies provided information about qualitative analysis of surface functional groups $C_{x}O_{y}H_{z}$ (COOH, OH, COO) and thermal gravimetric-differential thermal analysis - quantitative analysis of thermal decomposition products. It was found that oxidation leads to the removal of amorphous carbon and forms mainly carboxylic functional groups linked to the nanotubes. The Fourier transform infrared spectra indicate the presence of some other structures, like ketone (quinone), acid anhydride, ether and epoxy groups. Nitric acid treatment also effectively removes aluminum oxide catalyst and iron catalyst from commercial multiwall carbon nanotubes.
Źródło:
Acta Physica Polonica A; 2010, 118, 3; 515-518
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Materials Modifications with Cluster Beams: Bulk and Surface Modification
Autorzy:
Dunlop, A.
Powiązania:
https://bibliotekanauki.pl/articles/2011014.pdf
Data publikacji:
1999-08
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.16.-d
61.80.-x
Opis:
It is now well accepted that electronic excitation and ionization arising from the slowing down of swift heavy ions can lead to structural modifications in some metallic targets as it has been known for a long time in insulators. A rapid overview of some results obtained after GeV monoatomic heavy ion irradiations will be given. It will then be shown that new specific effects take place during irradiations with cluster ions. The projectiles used are energetic cluster beams: 10 to 40 MeV Au$\text{}_{4}$ or C$\text{}_{60}$ ions. The rates of linear energy deposition in electronic excitation are close for GeV monoatomic and for 10 MeV cluster ions, but the cluster ions have characteristic velocities which are one order of magnitude smaller than those of monoatomic ions. This leads to a strong spatial localization of the deposited energy during the slowing down process. The density of deposited energy can then reach values as high as a few 100 eV/atom. This very high density of energy deposited in the electronic system of the targets can lead to spectacular structural modifications: generation in the vicinity of the ion trajectories of isolated or agglomerated point defects, new crystalline phases, amorphized regions... After an overview of such damage induced in bulk metals, semiconductors, and insulators, we will discuss surface damage, consisting in the formation of bumps, craters, "lava-flows" on the target surface.
Źródło:
Acta Physica Polonica A; 1999, 96, 2; 181-195
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Effect of Diffusion on (ZrO$\text{}_{2}$)$\text{}_{0.8}$(Y$\text{}_{2}$O$\text{}_{3}$)$\text{}_{0.2}$ Ceramic
Autorzy:
Sharma, S. V.
Chand, P.
Powiązania:
https://bibliotekanauki.pl/articles/1933619.pdf
Data publikacji:
1995-09
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.16.-d
64.80.Gd
66.30.-h
76.30.Fc
81.20.Lb
Opis:
Effect of iodine and lithium diffusion on undoped and doped (with transition metal ions: Ti, V, Ni, Fe, Cu, Co and Mn) samples of polycrystalline (ΖrO$\text{}_{2}$)$\text{}_{0.8}$(Y$\text{}_{2}$O$\text{}_{3}$)$\text{}_{0.2}$ ceramic has been investigated using X-ray diffraction, scanning electron microscopy and electron paramagnetic resonance.
Źródło:
Acta Physica Polonica A; 1995, 88, 3; 503-509
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-10 z 10

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