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    Wyświetlanie 1-10 z 10
    Tytuł:
    Scanning Ellipsometer Using a Fixed Phase Retarder and Rotating Polarizer and Analyzer
    Autorzy:
    Taya, S.
    El-Agez, T.
    Powiązania:
    https://bibliotekanauki.pl/articles/1399666.pdf
    Data publikacji:
    2013-02
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    07.60.Fs
    02.30.Nw
    Opis:
    A spectroscopic rotating polarizer-analyzer ellipsometer in which the polarizer and the analyzer rotate in opposite directions at the same speed and with a fixed retarder is proposed and investigated theoretically. The fixed phase retarder is introduced after the rotating polarizer to significantly reduce the percent error in the optical parameters.
    Źródło:
    Acta Physica Polonica A; 2013, 123, 2; 183-184
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Noise Effect on Thin Film Characterization Using Rotating Polarizer Analyzer Ellipsometer
    Autorzy:
    El-Agez, T.
    Taya, S.
    Powiązania:
    https://bibliotekanauki.pl/articles/1419661.pdf
    Data publikacji:
    2012-07
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    07.60.Fs
    78.66.Bz
    78.20.Ci
    Opis:
    We present theoretically the characterization of 100 nm $SiO_2$ thin film using spectroscopic rotating polarizer analyzer ellipsometer in which the two elements are rotating synchronously in opposite directions with the same angular speed. The proposed sample consists of air (ambient)/$SiO_2$ (thin film)/Si (substrate). The ellipsometric parameters ψ and Δ are calculated when a clean signal is received by the detector and when a hypothetical noise is imposed on this signal. The film thickness and the optical constants of the film are calculated for the noisy signal in the spectrum range 200-800 nm. The results are compared with the proposed thickness and with the published values for $SiO_2$ optical constants.
    Źródło:
    Acta Physica Polonica A; 2012, 122, 1; 15-19
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Effect of Thermal Annealing on Optical Properties of Implanted Gaas
    Autorzy:
    Kulik, M.
    Komarov, F. F.
    Mączka, D.
    Powiązania:
    https://bibliotekanauki.pl/articles/2011008.pdf
    Data publikacji:
    1999-07
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    07.60.Fs
    61.72.Vv
    78.20.-e
    Opis:
    GaAs samples doped with indium atoms by ion implantation and thermal annealed were studied using a channelling method, Rutherford backscattering, and an ellipsometry. From these measurements it was observed that the layer implanted with 3×10$\text{}^{16}$ cm$\text{}^{-2}$ indium dose was totally damaged and its optical properties, namely a refraction index n and an extinction coefficient k, corresponded to the amorphous material. Subsequent isobaric heating of the implanted samples resulted in recovery of the crystalline structures with simultaneous change of the n and k index values.
    Źródło:
    Acta Physica Polonica A; 1999, 96, 1; 131-135
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Ellipsometric and Spectrophotometric Investigations of Porous Silica Thin Films Produced by Sol-Gel Method
    Autorzy:
    Skoczek, E.
    Jaglarz, J.
    Karasiński, P.
    Powiązania:
    https://bibliotekanauki.pl/articles/1493259.pdf
    Data publikacji:
    2011-10
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    81.20.Fw
    83.80.Jx
    07.60.Fs
    07.60.Rd
    Opis:
    The work presents the optical properties of porous silica thin films prepared by TEOS sol-gel method. The films were deposited onto glass substrate using dip-coating technique. The spectroscopic ellipsometry measurements have been performed to determine the optical constants of the films. This technique also enabled evaluation of the depolarization for the investigated layers. Additionally, the spectrophotometric measurements of transmittance and reflectance by the use of integrating sphere and reflectance probe have been made with the aim of possible application of the films as antireflective coatings.
    Źródło:
    Acta Physica Polonica A; 2011, 120, 4; 732-735
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Nuclear and Optical Analyses of MOS Devices
    Autorzy:
    Rzodkiewicz, W.
    Kulik, M.
    Panas, A.
    Kobzev, A.
    Powiązania:
    https://bibliotekanauki.pl/articles/1400446.pdf
    Data publikacji:
    2013-05
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    82.80.Yc
    78.20.Ci
    07.60.Fs
    85.30.-z
    Opis:
    The characteristic dome-like shape distribution of electric parameters (with the biggest values in the middle and the lowest values in the corners of the gate) has been observed in our investigations. Taking the results of the papers into account, the following hypothesis was drawn: the shape distribution of electrical parameters has been caused by the irregular shape of stress distribution under the metal gate. To prove or deny the assumed hypothesis, a lot of investigations on stress and strain in MOS structures are being performed. The study of the atomic composition of electronic components constitutes the starting point of their characterization. Therefore, in this paper, we present experimental results of hydrogen, oxygen, aluminum, silicon, and copper concentrations in MOS structures carried out by the Rutherford backscattering spectrometry and elastic recoil detection methods. These techniques allow inter alia determination of silicon and oxygen content as a function of the position x on a wafer. On the basis of depth profile elastic recoil detection measurements performed on Al and AlSiCu gates, a much larger hydrogen content in the surface layer for MOS structure with Al gate was confirmed. Copper atoms were detected only in the AlSiCu gate.
    Źródło:
    Acta Physica Polonica A; 2013, 123, 5; 851-853
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Influence of Rare Earth Ions on the Optical Properties of Tellurite Glass
    Autorzy:
    Burtan, B.
    Reben, M.
    Cisowski, J.
    Wasylak, J.
    Nosidlak, N.
    Jaglarz, J.
    Jarząbek, B.
    Powiązania:
    https://bibliotekanauki.pl/articles/1493034.pdf
    Data publikacji:
    2011-10
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    07.60.Fs
    81.05.Pj
    42.70.Ce
    78.66.Jg
    Opis:
    The goal of this work was to investigate the influence of rare-earth ions such as $Nd^{3+}$ and $Er^{3+}$ on the optical properties of tellurite glass of the $TeO_2-WO_3-PbO-La_2O_3$ system. The optical studies of the glasses comprised spectrophotometry (reflectance and transmittance) and spectroscopic ellipsometry. The spectrophotometric measurements yield a number of narrow absorption bands which correspond to characteristic transitions between the ground- and consecutive excited states of rare-earth ions. From ellipsometric studies, in turn, the dispersion of the refraction coefficient has been obtained which appears to be practically the same for the tellurite glass matrix and the matrix doped with $Nd^{3+}$ and $Er^{3+}$ ions.
    Źródło:
    Acta Physica Polonica A; 2011, 120, 4; 579-581
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Optical Characterization of Laser-Synthesized Anatase $TiO_{2}$ Nanopowders by Spectroscopic Ellipsometry and Photoluminescence Measurements
    Autorzy:
    Šćepanović, M.
    Grujić-Brojčin, M.
    Mirić, M.
    Dohčević-Mitrović, Z.
    Popović, Z.
    Powiązania:
    https://bibliotekanauki.pl/articles/1795613.pdf
    Data publikacji:
    2009-10
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    81.07.Wx
    78.67.Bf
    73.22.-f
    07.60.Fs
    78.55.-m
    Opis:
    Nanosized titania $(TiO_{2})$ is synthesized by laser-induced pyrolysis using $TiCl_{4}$ as a liquid precursor. X-ray diffraction and Raman scattering confirmed anatase structure of $TiO_{2}$ nanocrystals. The dielectric function ε(ω) of $TiO_{2}$ nanopowders has been determined by spectroscopic ellipsometry in the energy range from 1.5 to 6 eV at room temperature. The features observed in ε(ω) have been fitted to analytical line shapes by using the second derivatives of experimental spectra. The energies corresponding to different interband electronic transitions have been determined. Photoluminescence measurements have been carried out in vacuum for T = 20 K and T = 300 K. Under laser irradiation with sub-band gap photon energy, anatase nanocrystals have displayed strong visible photoluminescence emission. In this broad photoluminescence band different variations of line shape and position with excitation energy and temperature are observed for nanopowders with different crystallite size, pointing out to the various electronic transitions mediated by defect levels within the band gap.
    Źródło:
    Acta Physica Polonica A; 2009, 116, 4; 603-606
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Characterization of ZnSe Nanolayers by Spectroscopic Ellipsometry
    Autorzy:
    Šćepanović, M.
    Grujić-Brojčin, M.
    Nesheva, D.
    Levi, Z.
    Bineva, I.
    Popović, Z.
    Powiązania:
    https://bibliotekanauki.pl/articles/1795712.pdf
    Data publikacji:
    2009-10
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    81.07.-b
    81.15.-z
    81.05.Dz
    78.30.-j
    07.60.Fs
    68.55.-a
    Opis:
    Single layers of ZnSe with thicknesses of 30, 40, 50, 70 and 100 nm are deposited at room substrate temperature by thermal evaporation of ZnSe powder in vacuum. The layers surface morphology has been investigated by atomic force microscopy. Structural characterization by the Raman scattering measurement revealed the existence of randomly oriented crystalline ZnSe particles in all layers, and the presence of amorphous phase in layers thinner than 100 nm. The ellipsometric measurements were performed in the range from 1.5 to 5 eV at room temperature in air. To interpret the experimental results, the Bruggeman effective medium approximation of dielectric function of ZnSe layers has been used, representing the layers as different mixtures of crystalline ZnSe (c-ZnSe), amorphous ZnSe (a-ZnSe), and voids. The assumption of polycrystalline ZnSe layers modeled as mixture of porous c-ZnSe (with volume fraction of voids ≈ 0.17) and a-ZnSe gives the best fit of ellipsometric experimental data. Single layer thicknesses similar to those expected from preparation conditions have been obtained by this fitting procedure. It has been also found that decrease in the layer thickness causes an increase of the volume fraction of a-ZnSe. Thus, c-ZnSe/a-ZnSe ratio, porosity and layer thickness obtained by spectroscopic ellipsometry, provides useful information about crystallinity and micro-/nanostructure of ZnSe nanolayers.
    Źródło:
    Acta Physica Polonica A; 2009, 116, 4; 708-711
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Thermo-Optical Parameters of Amorphous a-C:N:H Layers
    Autorzy:
    Pieczyńska, E.
    Jaglarz, J.
    Marszalek, K.
    Tkacz-Śmiech, K.
    Powiązania:
    https://bibliotekanauki.pl/articles/1377543.pdf
    Data publikacji:
    2014-12
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    07.60.Fs
    78.20.-e
    78.20.Ci
    78.20.N-
    78.30.Ly
    81.05.U-
    81.15.Gh
    Opis:
    Thermo-optical properties of hydrogenated amorphous carbon nitride layers (a-C:N:H) deposited on crystalline silicon by plasma assisted chemical vapour deposition were studied. The layers were characterized by the Fourier transform infrared spectroscopy and their chemical composition, i.e. [N]/[C] ratio, was determined by energy dispersive X-ray technique. The optic measurements were made by spectroscopic ellipsometer Wollam M2000 equipped with a heated vacuum chamber. The measurements of ellipsometric angles were carried out during heating the sample from room temperature to 300°C. Refractive index, extinction coefficient and the layer thicknesses were calculated by fitting the model of the layer to the ellipsometric data. The results confirm that at about 23°C the layer properties are changed. The measured thermo-optical parameters, dn/dT and dk/dT, show abrupt change from negative to positive values which can be explained by structure graphitization. Simultaneously, the bandgap decreases from 2.5 to 0.7 eV and the layer thickness drops to about 50% of the initial value.
    Źródło:
    Acta Physica Polonica A; 2014, 126, 6; 1241-1245
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    The influence of selected organic compounds on the corrosion of historical glass based on their state of preservation
    Autorzy:
    Greiner-Wronowa, E.
    Świt, P.
    Powiązania:
    https://bibliotekanauki.pl/articles/1058515.pdf
    Data publikacji:
    2016-12
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    89.90.+n
    61.43.Fs
    07.60.Pb
    68.37.-d
    68.37.Hk
    81.70.-q
    07.07.Df
    07.75.+h
    81.40.Np
    Opis:
    The aim of this study was to investigate the influence of selected organic compounds such as acetic acid and formaldehyde on the historical glass objects of corrosion processes. This is a very important problem for the field of conservation and restoration of glass of art. Glass objects exhibited in museum display cases can be suffered by evaporating organic compounds which undergo to reaction with leached glass elements to create corrosion deposit on their surface. The proposed method called glass sensors has been used to identify results of impact of various external factors on the tested glass. Due to aggressive environment for the objects there created corrosion phenomena. Glass sensor were prepared as reproduced XVIII-cent. materials. The current studies were carried out by modern physico-chemical methods such as optical, metallography, scanning electron microscopy, inductively coupled plasma mass spectrometry and the Fourier transform infrared spectrometry. These techniques allow to determine the composition of the corrosion layers as well as their structure. The issues raised in this work have been studied following an interdisciplinary approach. The information obtained by using different techniques provides a valuable source of knowledge about the chemical reactions taking place on the surface of the glass. The results derived from this work are useful for the design and implementation of exhibition recommendations and better planning of conservation tasks.
    Źródło:
    Acta Physica Polonica A; 2016, 130, 6; 1406-1414
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-10 z 10

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