- Tytuł:
- Light-Emitting Diode Degradation and Low-Frequency Noise Characteristics
- Autorzy:
-
Šaulys, B.
Matukas, J.
Palenskis, V.
Pralgauskaitė, S.
Kulikauskas, G. - Powiązania:
- https://bibliotekanauki.pl/articles/1505229.pdf
- Data publikacji:
- 2011-04
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
72.70.+m
74.40.-n
85.30.-z
85.60.Jb - Opis:
- Comprehensive investigation of phosphide-based red and nitride-based blue light-emitting diodes characteristics and physical processes that take place in device structure during aging has been carried out. Analysis of noise characteristics (the emitting-light power and the LED voltage fluctuations, also their cross-correlation factor) shows that investigated LEDs degradation is caused by defects that lead to the leakage current and non-radiating recombination increase in the active region or its interfaces. Appearance of the defects first of all manifests in noise characteristics: intensive and strongly correlated $1//f^{α}$ type optical and electrical fluctuations come out.
- Źródło:
-
Acta Physica Polonica A; 2011, 119, 4; 514-520
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł