- Tytuł:
- System for estimation of danger zones and safe evacuation routes in the face of bomb threat - discussion on the approach
- Autorzy:
-
Krawczyk, T.
Tomala, R. - Powiązania:
- https://bibliotekanauki.pl/articles/397809.pdf
- Data publikacji:
- 2014
- Wydawca:
- Politechnika Łódzka. Wydział Mikroelektroniki i Informatyki
- Tematy:
-
destruction field
explosives
shock wave
simulation
pole zniszczenia
materiały wybuchowe
fala uderzeniowa
symulacja - Opis:
- Anti-terrorist measures taken by the police are among the most dangerous operations of the uniformed services, both in the country and beyond its borders. Trained police officers, during their duties, risk their health and lives in order to protect the citizens and their property. During an anti-terrorist operation many external factors encountered in a scene may increase assault squad’s safety and thus also affect the ultimate success of the operation. However, these factors are not always exactly known and, therefore, not taken into consideration during the planning process. One of these factors is the location of the performed action. In order to efficiently eliminate the risk, officers have to know the exact placement of a suspicious object (potential explosives) and be familiar with all features of the environment that may affect ongoing operations, such as building layout, terrain, etc. In such case, it is possible to determine safety zones and evacuation routes for the outsiders. In the absence of time, even more important factor is the planning duration. Most of the anti-terrorist operations require a swift response to the arising threat. Despite having even the most detailed information about the operation’s location, there is often no time to take full advantage of this knowledge. Therefore every second, which can be saved on action planning, might become invaluable later on. After all, the ultimate success of the operation is often dependent on its speed.
- Źródło:
-
International Journal of Microelectronics and Computer Science; 2014, 5, 4; 155-159
2080-8755
2353-9607 - Pojawia się w:
- International Journal of Microelectronics and Computer Science
- Dostawca treści:
- Biblioteka Nauki
Artykuł