- Tytuł:
- Examination of the change of the characteristic X-rays of the zinc in fluorine- and boron-doped ZnO thin films
- Autorzy:
-
Söğüt, Ö.
Kerli, S.
Cengiz, E.
Apaydın, G. - Powiązania:
- https://bibliotekanauki.pl/articles/1050909.pdf
- Data publikacji:
- 2018-05
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
32.30.Rj
78.70.En
32.30.-r
32.80.Fb - Opis:
- In this study, K_{β}/K_{α} X-ray intensity ratios of zinc in pure zinc, undoped ZnO thin film and boron and fluorine-doped ZnO thin films have been investigated. These samples have been excited by 59.5 keV γ-rays from a ^{241}Am annular radioactive source. K X-rays emitted by the samples have been counted using an Ultra-LEGe detector with a resolution of 150 eV at 5.9 keV. The K_{β}/K_{α} X-ray intensity ratios of the doped ZnO thin films have been compared with that of the undoped ZnO thin film. The deviations between the results can be explained by delocalization and/or charge transfer phenomena causing change in valence electronic configuration of zinc.
- Źródło:
-
Acta Physica Polonica A; 2018, 133, 5; 1124-1128
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł