- Tytuł:
- Frequency Dependent Electrical Characteristics οf Au/n-Si/CuPc/Au Heterojunction
- Autorzy:
-
Ahmad, Z.
Sayyad, M.
Karimov, Kh.
Saleem, M.
Shah, M. - Powiązania:
- https://bibliotekanauki.pl/articles/1538707.pdf
- Data publikacji:
- 2010-03
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
79.60.Jv
73.90.+f - Opis:
- Electrical characteristics of the heterojunction fabricated by thermal deposition of copper phthalocyanine (CuPc) on an n-silicon substrate have been investigated. The frequency has significant effect on capacitance (C), conductance (G) and series resistance $(R_{s})$ interface states $(D_{it})$ of the junction. Measured capacitance and conductance were corrected for $R_{s}$. The conductance technique was used to measure the density of the interface states. This method revealed the value of the interface state density distribution for the Au/n-Si/CuPc/Au interfaces of the order of $10^{12} cm^{-2} eV^{-1}$.
- Źródło:
-
Acta Physica Polonica A; 2010, 117, 3; 493-496
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł