Autor: Asano, H. - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Study of the effect of intermittent type of mental work-load by physiological psychological index
Autorzy:: Mizuno, T.
Nomura, S.
Nozawa, A.
Asano, H.
Ide, H.
Powiązania:: https://bibliotekanauki.pl/articles/333172.pdf
Data publikacji:: 2009
Wydawca:: Uniwersytet Śląski. Wydział Informatyki i Nauki o Materiałach. Instytut Informatyki. Zakład Systemów Komputerowych
Tematy:: mentalne obciążenie pracą
mental workload
fasal skin temperature physiological psychological evaluation
intermittent type of MWL
Opis:: This paper was aimed at evaluating the mental work-load (MWL) with psycho-physiological indices. Especially, we focused on the intermittent type of MWL, which is assumed as a predisposing factor of various somatic and mental disorders. In the experiment, we introduced a facial skin thermo image comparing with conventional physiological indices, such as electrocardiogram (ECG) and electroencephalogram (EEG). As a result, the facial skin image was suggested to be a useful tool for evaluating such an intermittent type of MWL.
Źródło:: Journal of Medical Informatics & Technologies; 2009, 13; 249-253
1642-6037
Pojawia się w:: Journal of Medical Informatics & Technologies
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 2.

Tytuł:: Observations of Overlapped Single Shockley Stacking Faults in 4H-SiC PiN Diode
Autorzy:: Nakayama, K.
Hemmi, T.
Asano, K.
Miyazawa, T.
Tsuchida, H.
Powiązania:: https://bibliotekanauki.pl/articles/1197898.pdf
Data publikacji:: 2014-04
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 81.05.Hd
Opis:: In 4H-SiC PiN diodes, Shockley-type stacking faults expand from basal plane dislocations under conducting forward current. We report for the first time overlapped single Shockley-type stacking faults in a 4H-SiC PiN diode after forward conduction. In photoluminescence measurements, we observed not only an emission peak at 425 nm, which corresponds to the single Shockley-type stacking fault, but also one at 432 nm. In cross-sectional cathode luminescence images, emission lines at 425 nm and 432 nm merge and become straight. Transmission electron microscope images showed that the structure at the position with the 432 nm emission overlapped the single Shockley-type stacking faults.
Źródło:: Acta Physica Polonica A; 2014, 125, 4; 962-964
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 3.

Tytuł:: Intercultural differences in decoding facial expressions of the android robot Geminoid F
Autorzy:: Becker-Asano, C.
Ishiguro, H.
Powiązania:: https://bibliotekanauki.pl/articles/91612.pdf
Data publikacji:: 2011
Wydawca:: Społeczna Akademia Nauk w Łodzi. Polskie Towarzystwo Sieci Neuronowych
Tematy:: intercultural differences
decoding facial
android robot
Geminoid F
facial display
Opis:: As android robots become increasingly sophisticated in their technical as well as artistic design, their non-verbal expressiveness is getting closer to that of real humans. Accordingly, this paper presents results of two online surveys designed to evaluate a female android’s facial display of five basic emotions. Being interested in intercultural differences we prepared both surveys in English, German, as well as Japanese language, and we not only found that in general our design of the emotional expressions “fearful” and “surprised” were often confused, but also that Japanese participants more often confused “angry” with “sad” than the German and English participants. Although facial displays of the same emotions portrayed by the model person of Geminoid F achieved higher recognition rates overall, portraying fearful has been similarly difficult for her. Finally, from the analysis of free responses that the participants were invited to give, a number of interesting further conclusions are drawn that help to clarify the question of how intercultural differences impact on the interpretation of facial displays of an android’s emotions.
Źródło:: Journal of Artificial Intelligence and Soft Computing Research; 2011, 1, 3; 215-231
2083-2567
2449-6499
Pojawia się w:: Journal of Artificial Intelligence and Soft Computing Research
Dostawca treści:: Biblioteka Nauki

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