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    Wyświetlanie 1-7 z 7
    Tytuł:
    ARMScope – the versatile platform for scanning probe microscopy systems
    Autorzy:
    Świadkowski, Bartosz
    Piasecki, Tomasz
    Rudek, Maciej
    Świątkowski, Michał
    Gajewski, Krzysztof
    Majstrzyk, Wojciech
    Babij, Michał
    Dzierka, Andrzej
    Gotszalk, Teodor
    Powiązania:
    https://bibliotekanauki.pl/articles/221551.pdf
    Data publikacji:
    2020
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    Scanning probe microscopy
    AFM
    Kelvin Probe force microscopy
    scanning tunnelling microscopy
    Opis:
    Scanning probe microscopy (SPM) since its invention in the 80’s became very popular in examination of many different sample parameters, both in university and industry. This was the effect of bringing this technology closer to the operator. Although the ease of use opened a possibility for measurements without high labour requirement, a quantitative analysis is still a limitation in Scanning Probe Microscopes available on the market. Based on experience of Nano-metrology Group, SPM still can be considered as a tool for quantitative examination of thermal, electrical and mechanical surface parameters. In this work we present an ARMScope platform as a versatile SPM controller that is proved to be useful in a variety of applications: from atomic-resolution STM (Scanning Tunnelling Microscopy) to Multi-resonance KPFM (Kelvin Probe force microscopy) to commercial SEMs (Scanning electron microscopes).
    Źródło:
    Metrology and Measurement Systems; 2020, 27, 1; 119-130
    0860-8229
    Pojawia się w:
    Metrology and Measurement Systems
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Scanning Probe Microscopy and Spectroscopy of High Temperature Superconductors
    Autorzy:
    de Lozanne, A. L.
    Edwards, H. L.
    Yuan, C.
    Markert, J. T.
    Powiązania:
    https://bibliotekanauki.pl/articles/1968757.pdf
    Data publikacji:
    1998-02
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    61.16.Ch
    74.50.+r
    07.79.Cz
    07.79.Pk
    74.72.Bk
    74.72.Hs
    Opis:
    The authors review recent studies of high temperature superconductors conducted with scanning tunneling and magnetic force microscopes. Emphasis is placed on the importance of surface and probe characterization, both of which are likely to affect the detailed nature of the observations.
    Źródło:
    Acta Physica Polonica A; 1998, 93, 2; 333-342
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Diagnostics of micro- and nanostructure using the scanning probe microscopy
    Autorzy:
    Gotszalk, T.
    Janusz, P.
    Marendziak, A.
    Czarnecki, P.
    Radojewski, J.
    Szeloch, R. F.
    Grabiec, P.
    Rangelow, I. W.
    Powiązania:
    https://bibliotekanauki.pl/articles/308801.pdf
    Data publikacji:
    2005
    Wydawca:
    Instytut Łączności - Państwowy Instytut Badawczy
    Tematy:
    scannig probe microscopy
    microsystem
    nanofabrication
    Opis:
    In this paper we summarize the results of our research concerning the diagnostics of micro- and nanostructure with scanning probe microscopy (SPM). We describe the experiments performed with one of the scanning probe microscopy techniques enabling also insulating surfaces to be investigated, i.e., atomic force microscopy (AFM). We present the results of topography measurements using both contact and non-contact AFM modes, investigations of the friction forces that appear between the microtip and the surface, and experiments connected with the thermal behaviour of integrated circuits, carried out with the local resolution of 20 nm.
    Źródło:
    Journal of Telecommunications and Information Technology; 2005, 1; 41-46
    1509-4553
    1899-8852
    Pojawia się w:
    Journal of Telecommunications and Information Technology
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Analiza obrazów powierzchni w mikroskopii bliskich oddziaływań
    Surface Image Analysis in Scanning Probe Microscopy
    Autorzy:
    Jóźwiak, G.
    Gotszalk, T.
    Powiązania:
    https://bibliotekanauki.pl/articles/155430.pdf
    Data publikacji:
    2010
    Wydawca:
    Stowarzyszenie Inżynierów i Techników Mechaników Polskich
    Tematy:
    mikroskopia bliskich oddziaływań
    analiza topografii powierzchni
    analiza motywów 3D
    scanning probe microscopy
    surface analysis
    3D motif analysis
    Opis:
    W pracy przedstawiono wybrane metody analizy powierzchni (ISO 25178) wskazując na rodzaj informacji, jaką można za pomocą danej metody uzyskać. Opisywane algorytmy i procedury zostały zaimplementowane w opracowanym w Wydziałowym Zakładzie Metrologii Mikro- i Nanostruktur Politechniki Wrocławskiej programie TOPOGRAF. W pracy zaprezentowano przykładowe wyniki działania zaimplementowanych algorytmów i procedur.
    Progress in the scanning probe microscopy makes it become a much more common tool. In the paper the principle of operation of the scanning probe microscope is presented. It is emphasized that the measurement result is an image of the investigated surface. Two groups of parameters connected with lateral properties of the tested surface image are introduced. The first group of parameters is connected with the image autocorrelation function and two dimensional Fourier transform. The texture aspect ratio and surface autocorrelation length (Fig. 1) are given as examples of the autocorrelation parameters. The second group of parameters is related to the so called 3D motif analysis. At the first stage of this analysis the image is segmented by means of the watershed segmentations algorithm. At the second stage the statistics connected with the shape and dimensions of the segments are calculated. The segmentation algorithm as well as the parameters describing shape and dimensions of segments (Fig 2) are presented in the paper. Due to the quantum nature of the micro- and nano-world, the uncertainty of products of the micro and nanotechnology will always be greater than that of products of the conventional technology. For this reason there is strong demand for flexible techniques capable of handling this increased uncertainty. The 3D motif analysis is very well suited to meet this challenge, since it enables the extension of the basic set of the parameters describing segments. Therefore the segment parameters might be adapted to the function of the investigated nanostructures. The images presented in the paper were obtained by means of the TOPOGRAF software that is developed at the Division of Micro- and Nanostructures Metrology.
    Źródło:
    Pomiary Automatyka Kontrola; 2010, R. 56, nr 1, 1; 46-47
    0032-4140
    Pojawia się w:
    Pomiary Automatyka Kontrola
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Mechanical and Electrical Properties, of ZnO-Nanowire/Si-Substrate Junctions Studied by Scanning Probe Microscopy
    Autorzy:
    Aleszkiewicz, M.
    Fronc, K.
    Wróbel, J.
    Klepka, M.
    Wojtowicz, T.
    Karczewski, G.
    Powiązania:
    https://bibliotekanauki.pl/articles/2047440.pdf
    Data publikacji:
    2007-08
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    68.37.Ef
    68.37.Ps
    68.65.La
    73.21.Hb
    78.67.Lt
    Opis:
    Scanning tunneling spectroscopy was used to check the tunneling I-V characteristics of junctions formed by n-ZnO nanowires deposited on Si substrates with n- and p-type electrical conductivity (i.e. n-ZnO nanowire/n-Si and n-ZnO nanowire/p-Si junctions, respectively). Simultaneously, several phenomena which influence the measured I-V spectra were studied by atomic force microscopy. These influencing factors are: the deposition density of the nanowires, the possibility of surface modification by tip movement (difference in attraction forces between nanowires and the p-Si and n-Si) and the aging of the surface.
    Źródło:
    Acta Physica Polonica A; 2007, 112, 2; 255-260
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Analysis of the electrolytically polished skeletal dentures surfaces using various nano- and microscopic technologies
    Autorzy:
    Dąbrowa, Tomasz
    Majstrzyk, Wojciech
    Tamulewicz, Magdalena
    Piasecki, Tomasz
    Kunicki, Piotr
    Więckiewicz, Włodzimierz
    Gotszalk, Teodor
    Powiązania:
    https://bibliotekanauki.pl/articles/306706.pdf
    Data publikacji:
    2019
    Wydawca:
    Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
    Tematy:
    chropowatość powierzchni
    skaningowa mikroskopia elektronowa
    proteza ruchoma
    mikroskopia skaningowa
    surface roughness
    scanning electron microscopy
    removable partial denture
    scanning probe microscopy
    optical profilometry
    Opis:
    The surface roughness of the dental restorations is significant to the denture plaque adhesion. Methods: In this work, we present the complex analysis of the electropolished CoCrW alloy remanium® star (Dentaurum, Germany) samples with laserengraved fiducial marks performed using complementary set of micro- and nanoscopic techniques: optical profilometry (OP), atomic force microscopy (AFM), scanning electron microscopy (SEM) and focused ion beam (FIB) milling. Results: Both mean and RMS roughness of the samples were reduced by electopolishing process, however, the results obtained using OP and AFM exhibited some discrepancies. This was caused by the relatively high local protruding defects developed on the processed surface. The cross-sections of the protrusions were made to analyze the cause of their formation as the EDS elemental content maps revealed that their composition was uniform. We also analyzed the local roughness in the smaller areas free from the defects. Conclusions: In that case, both OP and AFM techniques delivered the same results. Analysis of results showed that various methods used for the surface roughness evaluation have to be used simultaneously to obtain complete and true analysis of the technological CoCrW samples.
    Źródło:
    Acta of Bioengineering and Biomechanics; 2019, 21, 4; 123-129
    1509-409X
    2450-6303
    Pojawia się w:
    Acta of Bioengineering and Biomechanics
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    A simple model of the scanning near-field optical microscopy probe tip for electric field enhancement
    Autorzy:
    Wang, Y.
    Cai, W.
    Yang, M.
    Liu, Z.
    Shang, G.
    Powiązania:
    https://bibliotekanauki.pl/articles/174091.pdf
    Data publikacji:
    2017
    Wydawca:
    Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
    Tematy:
    near-field tip
    electromagnetic field enhancement
    finite-difference time-domain
    FDTD
    Opis:
    In this paper, we present a simple near-field probe model that is composed of an elongated ellipsoid and a finite metal truncated cone. The elongated ellipsoid has been shown to act as a protrusion or separate particle near a truncated cone apex with strong near-field enhancement under laser excitation. By controllably varying the length of the ellipsoid protrusion from the truncated cone, the truncated cone-ellipsoid probes can be adapted to the suitability of near-field probes. The effects of substrate material and excitation wavelength on the near field enhancement for different tip apexes are also discussed. In addition, we compared the properties of the truncated cone-ellipsoid probe with the widely used hemisphere conical tip by launching surface plasmon polaritons on plasmonic waveguides to prove the suitability of the truncated cone-ellipsoid probes as high performance near-field probes. The present simple model would provide a theoretical basis for the actual construction of probes.
    Źródło:
    Optica Applicata; 2017, 47, 1; 119-130
    0078-5466
    1899-7015
    Pojawia się w:
    Optica Applicata
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-7 z 7

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