Autor: Cleff, B. - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Defect Profile Induced by Friction and Wear Processes Detected by Positron Annihilation Method
Autorzy:: Dryzek, J.
Dryzek, E.
Cleff, B.
Powiązania:: https://bibliotekanauki.pl/articles/1933487.pdf
Data publikacji:: 1995-07
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 78.70.Bj
Opis:: The positron annihilation studies of defect profile in Cu samples whose surfaces were exposed to the friction and wear processes are presented. The values of the S-parameter and its dependences on the depth from the Cu surface are the functions of the value of the load applied in the sliding contact between two metals. It indicates possibilities of applying the presented measurement method in the industry.
Źródło:: Acta Physica Polonica A; 1995, 88, 1; 129-133
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: Scanning Force Microscopy Studies of Implanted Silicon Crystals
Autorzy:: Lekki, J.
Lekka, M.
Romano, H.
Cleff, B.
Stachura, Z.
Powiązania:: https://bibliotekanauki.pl/articles/1945219.pdf
Data publikacji:: 1996-03
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 62.20.-x
Opis:: Scanning force microscope has been applied to investigate wear tracks produced during friction coefficient measurements of hard steel ball against ⟨111⟩ silicon crystals implanted with Ar ions. Such treatment causes the stable and significant decrease in friction, despite the total removal of implanted species from the wear track during friction. Scanning force microscope measurements of wear tracks topography supported the former hypothesis assuming the formation of post-implantation dense microcracks structure and subsequent propagation of this structure into the bulk. Such process assures small size of wear particles and a low friction coefficient value. Additionally the microfriction force measurement method was applied to determine the friction coefficient of Si$\text{}_{3}$N$\text{}_{4}$ cantilever and a wear track in Si crystal.
Źródło:: Acta Physica Polonica A; 1996, 89, 3; 315-322
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 3.

Tytuł:: Local Adhesive Surface Properties Studied by Force Microscopy
Autorzy:: Lekka, M.
Lekki, J.
Marszałek, M.
Stachura, Z.
Cleff, B.
Powiązania:: https://bibliotekanauki.pl/articles/1968773.pdf
Data publikacji:: 1998-02
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 68.35.Gy
Opis:: Scanning force microscopy was used in the contact mode to determine the adhesion force between a mica surface and a silicon nitride tip. The measurements were performed in an aqueous solution of sodium and calcium chlorides. The adhesion force according to the Derjaguin-Landau-Verwey- Overbeek theory depends on the competition between two kinds of forces: van der Waals and electrostatic "double layer". Two different curves of adhesion force versus salt concentration were obtained from the experiment with monovalent and divalent ions. The tip-surface adhesion force was determined from a statistical analysis of data obtained from the force vs. distance retracting curves.
Źródło:: Acta Physica Polonica A; 1998, 93, 2; 421-424
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

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