Wszystkie pola: 72.70.+m - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Hot-Electron Transport Noise and Power Dissipation in GaN Channels at High Density of Electrons
Autorzy:: Matulionis, A.
Liberis, J.
Matulionienė, I.
Ramonas, M.
Powiązania:: https://bibliotekanauki.pl/articles/1813383.pdf
Data publikacji:: 2008-03
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 72.20.Ht
72.70.+m
72.80.Ey
Opis:: The experimental results on transport, noise, and dissipation of electric power for voltage-biased Si-doped GaN channels are compared with those of Monte Carlo simulation. The measured dissipated power shows a stronger hot-phonon effect than the simulated one. On the other hand, the experimental results on the electron drift velocity at high electric fields show a weaker hot-phonon effect as compared with the simulated one. The misfit can be reduced if a conversion of the friction-active nonequilibrium longitudinal optical phonons into the friction-passive longitudinal optical phonons is considered.
Źródło:: Acta Physica Polonica A; 2008, 113, 3; 967-970
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: High-Frequency Noise Sources in Quantum Wells
Autorzy:: Ardaravičius, L.
Liberis, J.
Matulionis, A.
Powiązania:: https://bibliotekanauki.pl/articles/2035523.pdf
Data publikacji:: 2002-08
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 72.20.Ht
72.70.+m
73.40.Kp
Opis:: Hot-electron noise is investigated for InGaAs and InAs quantum wells containing a two-dimensional electron gas channel in a pulsed electric field applied parallel to the interfaces. Noise sources resulting from hot-electron "thermal" motion, electron temperature fluctuations, and real-space transfer are observed. The experimental results on hot-electron "thermal" noise are used to estimate energy relaxation time in the field range where other sources do not play any important role. Measurements of noise anisotropy in the plane of electron confinement are used to discuss real-space-transfer noise. High-frequency noise technique is used to study hot-electron trapping, and trap location in InAlAs/InGaAs/InAlAs heterostructure channels is determined.
Źródło:: Acta Physica Polonica A; 2002, 102, 2; 329-335
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 3.

Tytuł:: Hot-Electron Transport and Microwave Noise in 4H-SiC
Autorzy:: Ardaravičius, L.
Liberis, J.
Kiprijanovič, O.
Matulionienė, I.
Matulionis, A.
Powiązania:: https://bibliotekanauki.pl/articles/2041761.pdf
Data publikacji:: 2005-02
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 72.20.Ht
72.70.+m
73.40.Kp
Opis:: Hot-electron transport and microwave noise are investigated for n-type 4H-SiC (n=2×10$\text{}^{17}$ cm$\text{}^{-3}$) subjected to a pulsed electric field applied parallel to the basal plane. At room temperature, the negative differential conductance, masked by field ionization at the highest fields, is observed in the field range between 280 and 350 kV/cm. The threshold fields for the negative differential conductance and field ionization increase with lattice temperature. The results on microwave noise are used to evaluate the effective hot-electron temperature and the hot-electron energy relaxation time.
Źródło:: Acta Physica Polonica A; 2005, 107, 2; 310-314
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 4.

Tytuł:: Signature of Hot Phonons in Reliability of Nitride Transistors and Signal Delay
Autorzy:: Matulionis, A.
Liberis, J.
Matulionienė, I.
Šermukšnis, E.
Leach, J.
Wu, M.
Ni, X.
Morkoç, H.
Powiązania:: https://bibliotekanauki.pl/articles/1506173.pdf
Data publikacji:: 2011-02
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 72.70.+m
73.50.Fq
73.61.Ey
Opis:: Lifetime of non-equilibrium (hot) phonons in biased GaN heterostructures with two-dimensional electron gas channels was estimated from hot-electron fluctuations. Dependence of the lifetime on the electron density is not monotonous - the resonance-type fastest decay serves as a signature of hot phonons. The signature is resolved in nitride heterostructure field effect transistors when the gate voltage is used to change the channel electron density. The transistor cut-off frequency decreases on both sides of the resonance in agreement with the enhanced electron scattering caused by longer hot-phonon lifetimes. The signature is also noted in device reliability experiment: the enhanced temperature of hot phonons, possibly, triggers formation of new defects and accelerates device degradation.
Źródło:: Acta Physica Polonica A; 2011, 119, 2; 225-227
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

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