Wszystkie pola: Stachura, M. - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Local Adhesive Surface Properties Studied by Force Microscopy
Autorzy:: Lekka, M.
Lekki, J.
Marszałek, M.
Stachura, Z.
Cleff, B.
Powiązania:: https://bibliotekanauki.pl/articles/1968773.pdf
Data publikacji:: 1998-02
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 68.35.Gy
Opis:: Scanning force microscopy was used in the contact mode to determine the adhesion force between a mica surface and a silicon nitride tip. The measurements were performed in an aqueous solution of sodium and calcium chlorides. The adhesion force according to the Derjaguin-Landau-Verwey- Overbeek theory depends on the competition between two kinds of forces: van der Waals and electrostatic "double layer". Two different curves of adhesion force versus salt concentration were obtained from the experiment with monovalent and divalent ions. The tip-surface adhesion force was determined from a statistical analysis of data obtained from the force vs. distance retracting curves.
Źródło:: Acta Physica Polonica A; 1998, 93, 2; 421-424
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: Scanning Force Microscopy Studies of Implanted Silicon Crystals
Autorzy:: Lekki, J.
Lekka, M.
Romano, H.
Cleff, B.
Stachura, Z.
Powiązania:: https://bibliotekanauki.pl/articles/1945219.pdf
Data publikacji:: 1996-03
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 62.20.-x
Opis:: Scanning force microscope has been applied to investigate wear tracks produced during friction coefficient measurements of hard steel ball against ⟨111⟩ silicon crystals implanted with Ar ions. Such treatment causes the stable and significant decrease in friction, despite the total removal of implanted species from the wear track during friction. Scanning force microscope measurements of wear tracks topography supported the former hypothesis assuming the formation of post-implantation dense microcracks structure and subsequent propagation of this structure into the bulk. Such process assures small size of wear particles and a low friction coefficient value. Additionally the microfriction force measurement method was applied to determine the friction coefficient of Si$\text{}_{3}$N$\text{}_{4}$ cantilever and a wear track in Si crystal.
Źródło:: Acta Physica Polonica A; 1996, 89, 3; 315-322
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 3.

Tytuł:: Single-Bond Force Measured by Means of Scanning Force MicroscopyD
Autorzy:: Lekka, M.
Gryboś, J.
Lekki, J.
Stachura, Z.
Styczeń, J.
Powiązania:: https://bibliotekanauki.pl/articles/2035535.pdf
Data publikacji:: 2002-09
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 68.35.Gy
07.10.Pz
Opis:: The aim of this investigation was to determine the adhesion force as a function of calcium dichloride concentration in water. The studies were performed with two surfaces carrying opposite charge in water solution: mica - as a negatively charged surface and glass covered with poly-L-lysine - as a positively charged surface, the latter due to the presence of amino groups. The surfaces were immersed in a CaCl$\text{}_{2}$ solution in the range of concentration varied from 0 to 100 mM. The scanning force microscopy was applied to determine the adhesion force by measurements of the pull-off force. Additionally, the values of the single bond force were estimated basing on the Poisson distribution of the number of binding sites.
Źródło:: Acta Physica Polonica A; 2002, 102, 3; 355-364
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 4.

Tytuł:: Testing the efficiency of the Si3N4 membranes for charged particles registration
Autorzy:: Polak, W.
Lekki, J.
Gryboś, J.
Hajduk, R.
Cholewa, M.
Kukharenko, O.
Stachura, Z.
Powiązania:: https://bibliotekanauki.pl/articles/148584.pdf
Data publikacji:: 2003
Wydawca:: Instytut Chemii i Techniki Jądrowej
Tematy:: Si3N4
membrane
detection
secondary electrons
CsI
Opis:: Testing Si3N4 membrane windows is a preliminary research for the single-ion-single-cell irradiating programme prepared at the Cracow nuclear microprobe facility. The present investigation is concerned with finding a method to register every single particle of the microprobe beam when passing through a membrane to the atmosphere. The 200 nm thick membranes covered with different layers were investigated. The alpha particles, after passing the membrane window, were registered by a particle detector. Secondary electrons ejected from the membrane by alpha particles were registered by a channeltron. The channeltron signals were collected in coincidence with the silicon detector signals. The detection efficiency is the ratio of the fast coincident channeltron signal number to the total number of the silicon detector signals. The results of investigation of the membranes with different coverages are reported in the present work.
Źródło:: Nukleonika; 2003, 48, 1; 25-29
0029-5922
1508-5791
Pojawia się w:: Nukleonika
Dostawca treści:: Biblioteka Nauki

Artykuł

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