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Wyszukujesz frazę "Jaglarz, J." wg kryterium: Autor

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    Wyświetlanie 1-7 z 7
    Tytuł:
    Optical properties of Pittsburgh glass subjected to mechanical and chemical treating
    Autorzy:
    Jaglarz, J.
    Powiązania:
    https://bibliotekanauki.pl/articles/173426.pdf
    Data publikacji:
    2013
    Wydawca:
    Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
    Tematy:
    chemical etching and sanding of glass surface
    antireflective properties
    Opis:
    An optical study of satinated Pittsburgh glass wafers was conducted and special attention was paid to their applications in greenhouse industry. They included: specular reflectance spectra in the range 300–1100 nm, using a reflection probe, resolve angle scattering, diffuse reflectance by means of an integrating sphere, X–Y optical profile measurements and ellipsometric investigation by means of a spectroscopic ellipsometer. Additionally, a surface topography study of investigated samples was carried out by means of atomic force microscopy (AFM) measurements. The obtained results allowed us to describe surface topography of chemically and mechanically modified surfaces.
    Źródło:
    Optica Applicata; 2013, 43, 3; 453-461
    0078-5466
    1899-7015
    Pojawia się w:
    Optica Applicata
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Influence of active admixtures onto tellurite glass refractive index
    Autorzy:
    Reben, M.
    Wasylak, J.
    Jaglarz, J.
    Powiązania:
    https://bibliotekanauki.pl/articles/200746.pdf
    Data publikacji:
    2010
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    tellurite glass
    rare earth ions
    refractive index
    Opis:
    The goal of this work was to investigate the influence of rare earth ions such as Tm3+, Yb3+ on physico-chemical properies of tellurite glass from the TeO2-WO3-PbO-PbF2-Na2O system. The thermal characteristic of tellurite glass Tm3+, Yb3+ doped have been presented. The effect of the glass crystallization on thermal stability of the glass and crystallizing phases formed upon heat treatment were investigated by DTA/DSC/, XRD methods. The spectral dependence of ellipsometric angles of the tellurite glass samples, have been studied. The influence of ions of rare earth elements, i.e. Tm 3+ and Yb3+, onto changes of refractive index of glass P1 (without RE admixture) were examined. The optical measurements were conducted on Woollam M2000 spectroscopic ellipsometer, in spectral range of 190–1700 nm.
    Źródło:
    Bulletin of the Polish Academy of Sciences. Technical Sciences; 2010, 58, 4; 519-522
    0239-7528
    Pojawia się w:
    Bulletin of the Polish Academy of Sciences. Technical Sciences
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Ellipsometric and Spectrophotometric Investigations of Porous Silica Thin Films Produced by Sol-Gel Method
    Autorzy:
    Skoczek, E.
    Jaglarz, J.
    Karasiński, P.
    Powiązania:
    https://bibliotekanauki.pl/articles/1493259.pdf
    Data publikacji:
    2011-10
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    81.20.Fw
    83.80.Jx
    07.60.Fs
    07.60.Rd
    Opis:
    The work presents the optical properties of porous silica thin films prepared by TEOS sol-gel method. The films were deposited onto glass substrate using dip-coating technique. The spectroscopic ellipsometry measurements have been performed to determine the optical constants of the films. This technique also enabled evaluation of the depolarization for the investigated layers. Additionally, the spectrophotometric measurements of transmittance and reflectance by the use of integrating sphere and reflectance probe have been made with the aim of possible application of the films as antireflective coatings.
    Źródło:
    Acta Physica Polonica A; 2011, 120, 4; 732-735
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Angle Resolved Scattering Combined with Optical Profilometry as Tools in Thin Films and Surface Survey
    Autorzy:
    Marszałek, K.
    Wolska, N.
    Jaglarz, J.
    Powiązania:
    https://bibliotekanauki.pl/articles/1402327.pdf
    Data publikacji:
    2015-07
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    78.35.+c
    78.68.+m
    78.66.Jg
    Opis:
    The work presents an application of two scanning optical techniques, i.e. optical profilometry and angle resolved scattering method. The first method measures the light reflected from a film during scan of the surface, while the second method measures light intensity as a function of the scattering angle. The angle resolved scattering and optical profilometry measurements, being complementary to the atomic force microscopy, give information about surface topography. Scattered radiation measured by angle resolved scattering and optical profilometry is a function of height and slope of microfacets. The analysis of images allows to determine the most important statistic surface parameters, like roughness, height distribution and autocorrelation length, in large wavelength range by the determination of power spectral density function. The fast Fourier transform of angle resolved scattering and optical profilometry images permits to determine the distribution of surface features in the inverse space, such as periodicity and anisotropy. In this paper the results obtained for porous SiO₂, SiO₂-TiO₂ blends, TiN and polymer thin films have been presented. The paper demonstrates the usefulness of the angle resolved scattering and optical profilometry for the surface and volume thin film inspection.
    Źródło:
    Acta Physica Polonica A; 2015, 128, 1; 81-86
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Properties of TiN protective coatings on steel
    Autorzy:
    Fornal, P.
    Stanek, J.
    Jaglarz, J.
    Dąbrowski, M.
    Powiązania:
    https://bibliotekanauki.pl/articles/148888.pdf
    Data publikacji:
    2003
    Wydawca:
    Instytut Chemii i Techniki Jądrowej
    Tematy:
    Conversion Electron Mössbauer Spectroscopy
    hard coating
    oxidation
    TiN
    Opis:
    The properties of fast cutting steel SW7M, stainless steel 1H18N9T, and tool steel NC11 coated with a TiN protective layer were studied using 57Fe Conversion Electron Mössbauer Spectroscopy. The adhesion of the coatings is determined by the thickness of Fe-N and Fe-Ti interface. The model of the abrasion of the protected tools, based on fast diffusion of Fe ions to the surface though the TiN layer and further oxidation is proposed.
    Źródło:
    Nukleonika; 2003, 48,suppl.1; 21-24
    0029-5922
    1508-5791
    Pojawia się w:
    Nukleonika
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Thermo-Optical Parameters of Amorphous a-C:N:H Layers
    Autorzy:
    Pieczyńska, E.
    Jaglarz, J.
    Marszalek, K.
    Tkacz-Śmiech, K.
    Powiązania:
    https://bibliotekanauki.pl/articles/1377543.pdf
    Data publikacji:
    2014-12
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    07.60.Fs
    78.20.-e
    78.20.Ci
    78.20.N-
    78.30.Ly
    81.05.U-
    81.15.Gh
    Opis:
    Thermo-optical properties of hydrogenated amorphous carbon nitride layers (a-C:N:H) deposited on crystalline silicon by plasma assisted chemical vapour deposition were studied. The layers were characterized by the Fourier transform infrared spectroscopy and their chemical composition, i.e. [N]/[C] ratio, was determined by energy dispersive X-ray technique. The optic measurements were made by spectroscopic ellipsometer Wollam M2000 equipped with a heated vacuum chamber. The measurements of ellipsometric angles were carried out during heating the sample from room temperature to 300°C. Refractive index, extinction coefficient and the layer thicknesses were calculated by fitting the model of the layer to the ellipsometric data. The results confirm that at about 23°C the layer properties are changed. The measured thermo-optical parameters, dn/dT and dk/dT, show abrupt change from negative to positive values which can be explained by structure graphitization. Simultaneously, the bandgap decreases from 2.5 to 0.7 eV and the layer thickness drops to about 50% of the initial value.
    Źródło:
    Acta Physica Polonica A; 2014, 126, 6; 1241-1245
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Influence of Rare Earth Ions on the Optical Properties of Tellurite Glass
    Autorzy:
    Burtan, B.
    Reben, M.
    Cisowski, J.
    Wasylak, J.
    Nosidlak, N.
    Jaglarz, J.
    Jarząbek, B.
    Powiązania:
    https://bibliotekanauki.pl/articles/1493034.pdf
    Data publikacji:
    2011-10
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    07.60.Fs
    81.05.Pj
    42.70.Ce
    78.66.Jg
    Opis:
    The goal of this work was to investigate the influence of rare-earth ions such as $Nd^{3+}$ and $Er^{3+}$ on the optical properties of tellurite glass of the $TeO_2-WO_3-PbO-La_2O_3$ system. The optical studies of the glasses comprised spectrophotometry (reflectance and transmittance) and spectroscopic ellipsometry. The spectrophotometric measurements yield a number of narrow absorption bands which correspond to characteristic transitions between the ground- and consecutive excited states of rare-earth ions. From ellipsometric studies, in turn, the dispersion of the refraction coefficient has been obtained which appears to be practically the same for the tellurite glass matrix and the matrix doped with $Nd^{3+}$ and $Er^{3+}$ ions.
    Źródło:
    Acta Physica Polonica A; 2011, 120, 4; 579-581
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-7 z 7

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