Temat: nanostructures - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Application of scanning shear-force microscope for fabrication of nanostructures
Autorzy:: Sikora, A.
Gotszalk, T.
Sankowska, A.
Rangelow, I. W.
Powiązania:: https://bibliotekanauki.pl/articles/308832.pdf
Data publikacji:: 2005
Wydawca:: Instytut Łączności - Państwowy Instytut Badawczy
Tematy:: AFM
nanostructures fabrication
shear force microscopy
Opis:: In view of the rapid growth of interest in AFM technique in surface property investigation and local surface modification we describe here an AFM microscope with optical tip oscillation detection. The modular shear-force/tunneling microscope for surface topography measurement and nanoanodisation is described. The measurement instrument presented here is based on the fiber Fabry-Perot interferometer for the measurement of the conductive microtip oscillation that is used as nano e-beam for local surface anodisation. An advantage of this system is that quantitative measurements of tip vibration amplitude are easily performed.
Źródło:: Journal of Telecommunications and Information Technology; 2005, 1; 81-84
1509-4553
1899-8852
Pojawia się w:: Journal of Telecommunications and Information Technology
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 2.

Tytuł:: ZnO films: propeties determined by electronic microscopy and ellipsometry
Autorzy:: Rakov, M.
Poperenko, L.
Tkach, V.
Yurgelevich, I.
Powiązania:: https://bibliotekanauki.pl/articles/385183.pdf
Data publikacji:: 2009
Wydawca:: Sieć Badawcza Łukasiewicz - Przemysłowy Instytut Automatyki i Pomiarów
Tematy:: reactive magnetron sputtering
Beattie’s method
semi-infinite medium
AFM
SEM
nanostructures
Opis:: Zinc oxide is a good material for application in nanoand optoelectronics due to its notable features, for example, large band gap. In this work ZnO films deposited by reactive magnetron sputtering at various pressure of residual gases and different temperatures of the substrate are investigated. The spectral dependences of ellipsometric parameters and of the films are determined by ellipsometry. The effective values of optical constants and are calculated. The roughness and the texture of the surfaces are obtained by Atomic-Force Microscopy (AFM) and Scanning Electronic Microscopy (SEM). One indicates that the refractive index decreases when reducing the pressure of residual gases, and the roughness decreases when elevating the temperature of the substrate. Thus, the behavior of some properties of the films at various conditions of deposition is determined.
Źródło:: Journal of Automation Mobile Robotics and Intelligent Systems; 2009, 3, 4; 112-114
1897-8649
2080-2145
Pojawia się w:: Journal of Automation Mobile Robotics and Intelligent Systems
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 3.

Tytuł:: Fabrication and Optoelectronic properties of Fluoride tin oxides/porous silicon/p-Silicon heterojunction
Autorzy:: Hadi, H. A.
Powiązania:: https://bibliotekanauki.pl/articles/411926.pdf
Data publikacji:: 2014
Wydawca:: Przedsiębiorstwo Wydawnictw Naukowych Darwin / Scientific Publishing House DARWIN
Tematy:: porous silicon
electrochemical etching
spray pyrolysis
fluoride-doped tin oxide film
nanostructures
SEM
AFM
photodetector
Opis:: In this paper, formation of a nanostructure semi transparence fluoride tin oxides (FTO) by spray pyrolysis technique on porous silicon PS layer. Porous silicon PS layer was prepared by anodization of p-type silicon wafers to fabricate of the UV- Visible Fluoride-doped tin oxide /Porous silicon /p-Si heterojunction photodetector. Optical properties of FTO thin films were measured. The optical band gap of 3.77 eV for SnO₂ : F for film was deduced. From (I-V) and (C-V) measurements, the barrier Ø_B height for FTO/PS diode was of 0.77, and the built in voltage V_bi, which was of 0.95 V. External quantum efficiency was 55 % at 500 nm which corresponding to peak responsivity of 1.15 A/W at 1 V bias. The PS band gap in the vicinity of PS/c-Si heterojunction was 1.38 eV.
Źródło:: International Letters of Chemistry, Physics and Astronomy; 2014, 17, 2; 142-152
2299-3843
Pojawia się w:: International Letters of Chemistry, Physics and Astronomy
Dostawca treści:: Biblioteka Nauki

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