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Wyszukujesz frazę "Marszałek, J." wg kryterium: Autor

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    Wyświetlanie 1-5 z 5
    Tytuł:
    Angle Resolved Scattering Combined with Optical Profilometry as Tools in Thin Films and Surface Survey
    Autorzy:
    Marszałek, K.
    Wolska, N.
    Jaglarz, J.
    Powiązania:
    https://bibliotekanauki.pl/articles/1402327.pdf
    Data publikacji:
    2015-07
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    78.35.+c
    78.68.+m
    78.66.Jg
    Opis:
    The work presents an application of two scanning optical techniques, i.e. optical profilometry and angle resolved scattering method. The first method measures the light reflected from a film during scan of the surface, while the second method measures light intensity as a function of the scattering angle. The angle resolved scattering and optical profilometry measurements, being complementary to the atomic force microscopy, give information about surface topography. Scattered radiation measured by angle resolved scattering and optical profilometry is a function of height and slope of microfacets. The analysis of images allows to determine the most important statistic surface parameters, like roughness, height distribution and autocorrelation length, in large wavelength range by the determination of power spectral density function. The fast Fourier transform of angle resolved scattering and optical profilometry images permits to determine the distribution of surface features in the inverse space, such as periodicity and anisotropy. In this paper the results obtained for porous SiO₂, SiO₂-TiO₂ blends, TiN and polymer thin films have been presented. The paper demonstrates the usefulness of the angle resolved scattering and optical profilometry for the surface and volume thin film inspection.
    Źródło:
    Acta Physica Polonica A; 2015, 128, 1; 81-86
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Thermo-Optical Parameters of Amorphous a-C:N:H Layers
    Autorzy:
    Pieczyńska, E.
    Jaglarz, J.
    Marszalek, K.
    Tkacz-Śmiech, K.
    Powiązania:
    https://bibliotekanauki.pl/articles/1377543.pdf
    Data publikacji:
    2014-12
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    07.60.Fs
    78.20.-e
    78.20.Ci
    78.20.N-
    78.30.Ly
    81.05.U-
    81.15.Gh
    Opis:
    Thermo-optical properties of hydrogenated amorphous carbon nitride layers (a-C:N:H) deposited on crystalline silicon by plasma assisted chemical vapour deposition were studied. The layers were characterized by the Fourier transform infrared spectroscopy and their chemical composition, i.e. [N]/[C] ratio, was determined by energy dispersive X-ray technique. The optic measurements were made by spectroscopic ellipsometer Wollam M2000 equipped with a heated vacuum chamber. The measurements of ellipsometric angles were carried out during heating the sample from room temperature to 300°C. Refractive index, extinction coefficient and the layer thicknesses were calculated by fitting the model of the layer to the ellipsometric data. The results confirm that at about 23°C the layer properties are changed. The measured thermo-optical parameters, dn/dT and dk/dT, show abrupt change from negative to positive values which can be explained by structure graphitization. Simultaneously, the bandgap decreases from 2.5 to 0.7 eV and the layer thickness drops to about 50% of the initial value.
    Źródło:
    Acta Physica Polonica A; 2014, 126, 6; 1241-1245
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Local Adhesive Surface Properties Studied by Force Microscopy
    Autorzy:
    Lekka, M.
    Lekki, J.
    Marszałek, M.
    Stachura, Z.
    Cleff, B.
    Powiązania:
    https://bibliotekanauki.pl/articles/1968773.pdf
    Data publikacji:
    1998-02
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    68.35.Gy
    Opis:
    Scanning force microscopy was used in the contact mode to determine the adhesion force between a mica surface and a silicon nitride tip. The measurements were performed in an aqueous solution of sodium and calcium chlorides. The adhesion force according to the Derjaguin-Landau-Verwey- Overbeek theory depends on the competition between two kinds of forces: van der Waals and electrostatic "double layer". Two different curves of adhesion force versus salt concentration were obtained from the experiment with monovalent and divalent ions. The tip-surface adhesion force was determined from a statistical analysis of data obtained from the force vs. distance retracting curves.
    Źródło:
    Acta Physica Polonica A; 1998, 93, 2; 421-424
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    XRD and TEM heating of large period Ni/Al multilayer coatings
    Autorzy:
    Świątek, Z.
    Gradys, A.
    Maj, Ł.
    Morgiel, J.
    Marszałek, K.
    Mania, R.
    Szlezynger, M.
    Powiązania:
    https://bibliotekanauki.pl/articles/1113635.pdf
    Data publikacji:
    2016-10
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    68.65.Ac
    68.37.Lp
    Opis:
    The Ni/Al multilayer coating of λ ≈100 nm was deposited onto (001)-oriented monocrystalline silicon substrate using double target magnetron sputtering system equipped with rotating sample holder. The thicknesses of alternating layers were adjusted in the way to preserve the chemical composition ratio close to 50%Al:50%Ni (at.%). The in situ X-ray diffraction and in situ transmission electron microscopy heating experiments were carried out at relatively low heating rates (20°C/min) in order to study the phase transformation sequence. The investigations revealed that the reaction between Ni and Al multilayers starts at ≈200°C with precipitation of Al₃Ni phase, while above 300°C dominates precipitation of Ni₃Al and NiAl intermetallic phases. Both the X-ray and electron diffractions acquired at 450°C confirmed presence of the Ni₃Al and NiAl intermetallics, but the former pointed at still lasting traces of Ni(Al) solid solution.
    Źródło:
    Acta Physica Polonica A; 2016, 130, 4; 880-883
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    AFM, XRD and HRTEM Studies οf Annealed FePd Thin Films
    Autorzy:
    Perzanowski, M.
    Zabila, Y.
    Morgiel, J.
    Polit, A.
    Krupiński, M.
    Dobrowolska, A.
    Marszałek, M.
    Powiązania:
    https://bibliotekanauki.pl/articles/1539149.pdf
    Data publikacji:
    2010-02
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    68.35.bd
    68.55.-a
    73.50.-h
    68.37.Yz
    Opis:
    Ferromagnetic FePd L $1_{0}$ ordered alloys are highly expected as forthcoming high-density recording materials, because they reveal a large perpendicular magnetocrystalline anisotropy [1]. The value of the magnetic anisotropy of FePd alloy strongly depends on the alloy composition, degree of alloy order as well as on the crystallographic grain orientation. In particular, to obtain the perpendicular anisotropy, it is necessary to get the films with (001) texture. One of the successful methods, which allows one to obtain highly ordered alloy, is a subsequent deposition of Fe and Pd layers, followed by an annealing at high temperature. This paper presents the study of the FePd thin alloy film structure changing in the result of high temperature annealing. During the annealing in high vacuum, the measurements of electrical resistance were performed, indicating the regions of different structure evolution. Changes in the crystal structure and surface morphology induced by thermal treatment were investigated by X-ray diffraction, atomic force microscopy, as well as high resolution transmission electron microscopy and then compared with electrical resistivity measurement. The slow thermal annealing of the deposited layers leads to the formation of L $1_{0}$ ordered FePd alloy with preferred (111) grain orientation. After the annealing at the highest used temperature, the dewetting process was observed, resulting in a creation of well oriented, regular nanoparticles.
    Źródło:
    Acta Physica Polonica A; 2010, 117, 2; 423-426
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-5 z 5

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