Informacja

Drogi użytkowniku, aplikacja do prawidłowego działania wymaga obsługi JavaScript. Proszę włącz obsługę JavaScript w Twojej przeglądarce.

English (EN)·Polski (PL)·Yкраїнський (UK)
Przejdź do strony domowej biblioteki Centralna Biblioteka Wojskowa Link otwiera się w nowym oknie Logo biblioteki Prolib Integro - strona głównaCentralna Biblioteka Wojskowa

Wyszukujesz frazę "Stachura, M." wg kryterium: Wszystkie pola

  Lista filtrów
Wyrównaj
    Wyświetlanie 1-4 z 4
    Tytuł:
    Local Adhesive Surface Properties Studied by Force Microscopy
    Autorzy:
    Lekka, M.
    Lekki, J.
    Marszałek, M.
    Stachura, Z.
    Cleff, B.
    Powiązania:
    https://bibliotekanauki.pl/articles/1968773.pdf
    Data publikacji:
    1998-02
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    68.35.Gy
    Opis:
    Scanning force microscopy was used in the contact mode to determine the adhesion force between a mica surface and a silicon nitride tip. The measurements were performed in an aqueous solution of sodium and calcium chlorides. The adhesion force according to the Derjaguin-Landau-Verwey- Overbeek theory depends on the competition between two kinds of forces: van der Waals and electrostatic "double layer". Two different curves of adhesion force versus salt concentration were obtained from the experiment with monovalent and divalent ions. The tip-surface adhesion force was determined from a statistical analysis of data obtained from the force vs. distance retracting curves.
    Źródło:
    Acta Physica Polonica A; 1998, 93, 2; 421-424
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Scanning Force Microscopy Studies of Implanted Silicon Crystals
    Autorzy:
    Lekki, J.
    Lekka, M.
    Romano, H.
    Cleff, B.
    Stachura, Z.
    Powiązania:
    https://bibliotekanauki.pl/articles/1945219.pdf
    Data publikacji:
    1996-03
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    62.20.-x
    Opis:
    Scanning force microscope has been applied to investigate wear tracks produced during friction coefficient measurements of hard steel ball against ⟨111⟩ silicon crystals implanted with Ar ions. Such treatment causes the stable and significant decrease in friction, despite the total removal of implanted species from the wear track during friction. Scanning force microscope measurements of wear tracks topography supported the former hypothesis assuming the formation of post-implantation dense microcracks structure and subsequent propagation of this structure into the bulk. Such process assures small size of wear particles and a low friction coefficient value. Additionally the microfriction force measurement method was applied to determine the friction coefficient of Si$\text{}_{3}$N$\text{}_{4}$ cantilever and a wear track in Si crystal.
    Źródło:
    Acta Physica Polonica A; 1996, 89, 3; 315-322
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Single-Bond Force Measured by Means of Scanning Force MicroscopyD
    Autorzy:
    Lekka, M.
    Gryboś, J.
    Lekki, J.
    Stachura, Z.
    Styczeń, J.
    Powiązania:
    https://bibliotekanauki.pl/articles/2035535.pdf
    Data publikacji:
    2002-09
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    68.35.Gy
    07.10.Pz
    Opis:
    The aim of this investigation was to determine the adhesion force as a function of calcium dichloride concentration in water. The studies were performed with two surfaces carrying opposite charge in water solution: mica - as a negatively charged surface and glass covered with poly-L-lysine - as a positively charged surface, the latter due to the presence of amino groups. The surfaces were immersed in a CaCl$\text{}_{2}$ solution in the range of concentration varied from 0 to 100 mM. The scanning force microscopy was applied to determine the adhesion force by measurements of the pull-off force. Additionally, the values of the single bond force were estimated basing on the Poisson distribution of the number of binding sites.
    Źródło:
    Acta Physica Polonica A; 2002, 102, 3; 355-364
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Study of Adhesion Interaction Using Atomic Force Microscopy
    Autorzy:
    Gryboś, J.
    Pyka-Fościak, G.
    Lebed, K.
    Lekka, M.
    Stachura, Z.
    Styczeń, J.
    Powiązania:
    https://bibliotekanauki.pl/articles/2038080.pdf
    Data publikacji:
    2004-05
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    87.64.Dz
    68.35.Gy
    Opis:
    An atomic force microscope is a useful tool to study the interaction forces at molecular level. In particular the atomic force microscope can measure an unbinding force needed to separate the two single molecule complexes. Recent studies have shown that such unbinding force depends linearly on the logarithm of the applied loading rate, defined as a product of scanning velocity and the spring constant characterizing the investigated system (cantilever vs. surface). This dependence can be used to study the energy landscape shape of a molecular complex by the estimation of energy barrier locations and the related dissociation rates. In the present work the complex consisting of ethylene(di)aminetetraacetic acid and the bovine serum albumin was measured. The dependence between the unbinding force and the logarithm of the loading rate was linear. Using the Bell model describing the dissociation of the above molecules caused by the action of the external bond breaking force, two parameters were estimated: the dissociation rate and the position of the energy barrier needed to overcome during a transition from a bound to unbound state. The obtained results are similar to those obtained for a typical ligand-receptor interaction.
    Źródło:
    Acta Physica Polonica A; 2004, 105, 5; 501-510
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-4 z 4

      Ta witryna wykorzystuje pliki cookies do przechowywania informacji na Twoim komputerze. Pliki cookies stosujemy w celu świadczenia usług na najwyższym poziomie, w tym w sposób dostosowany do indywidualnych potrzeb. Korzystanie z witryny bez zmiany ustawień dotyczących cookies oznacza, że będą one zamieszczane w Twoim komputerze. W każdym momencie możesz dokonać zmiany ustawień dotyczących cookies