Informacja

Drogi użytkowniku, aplikacja do prawidłowego działania wymaga obsługi JavaScript. Proszę włącz obsługę JavaScript w Twojej przeglądarce.

Wyszukujesz frazę "system-on-a-chip" wg kryterium: Temat


Wyświetlanie 1-4 z 4
Tytuł:
Simple Wide Frequency Range Impedance Meter Based on AD5933 Integrated Circuit
Autorzy:
Chabowski, K.
Piasecki, T.
Dzierka, A.
Nitsch, K.
Powiązania:
https://bibliotekanauki.pl/articles/221804.pdf
Data publikacji:
2015
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
impedance
converter
AD5933
system-on-a-chip
measurement
Opis:
As it contains elements of complete digital impedance meter, the AD5933 integrated circuit is an interesting solution for impedance measurements. However, its use for measurements in a wide range of impedances and frequencies requires an additional digital and analogue circuitry. This paper presents the design and performance of a simple impedance meter based on the AD5933 IC. Apart from the AD5933 IC it consists of a clock generator with a programmable prescaler, a novel DC offset canceller for the excitation signal based on peak detectors and a current to voltage converter with switchable conversion ratios. The authors proposed a simple method for choosing the measurement frequency to minimalize errors resulting from the spectral leakage and distortion caused by a lack of an anti-aliasing filter in the DDS generator. Additionally, a novel method for the AD5933 IC calibration was proposed. It consists in a mathematical compensation of the systematic error occurring in the argument of the value returned from the AD5933 IC as a result. The performance of the whole system is demonstrated in an exemplary measurement.
Źródło:
Metrology and Measurement Systems; 2015, 22, 1; 13-24
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
New Structure of Test Pattern Generator Stimulating Crosstalks in Bus-type Connections
Autorzy:
Garbolino, T.
Powiązania:
https://bibliotekanauki.pl/articles/226543.pdf
Data publikacji:
2015
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
integrated circuit interconnections
crosstalk
test pattern generator
built-in self-test
system-on-a-chip
Opis:
The paper discloses the idea of a new structure for a Test Pattern Generator (TPG) for detection of crosstalk faults that may happen to bus-type interconnections between built in blocks within a System-on-Chip structure. The new idea is an improvement of the TPG design proposed by the author in one of the previous studies. The TPG circuit is meant to generate test sequences that guarantee detection of all crosstalk faults with the capacitive nature that may occur between individual lines within an interconnecting bus. The study comprises a synthesizable and parameterized model developed for the presented TPG in the VLSI Hardware Description Language (VHDL) with further investigation of properties and features of the offered module. The significant advantages of the proposed TPG structure include less area occupied on a chip and higher operation frequency as compared to other solutions. In addition, the design demonstrates good scalability in terms of both the hardware overhead and the length of the generated test sequence.
Źródło:
International Journal of Electronics and Telecommunications; 2015, 61, 1; 67-75
2300-1933
Pojawia się w:
International Journal of Electronics and Telecommunications
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
An integrated gas removing system for microfluidic application. Design and evaluation
Autorzy:
Hofman, I. M.
Ziółkowska, K.
Dybko, A.
Brzózka, Z.
Powiązania:
https://bibliotekanauki.pl/articles/115931.pdf
Data publikacji:
2013
Wydawca:
Fundacja na Rzecz Młodych Naukowców
Tematy:
gas removing system
debubbler
debubbling system
lab-on-a-chip
microfluidics
long-term cell culture
cell spheroids
HT-29 cells
Opis:
Microfluidic systems are used in a wide range of applications, including medical diagnostics, cell engineering and bioanalytics. In this work we focused on “Lab-on-a-chip” microsystems for cell cultivation. A troublesome problem of gas bubbles entering microdevices causing signal interferences and cells damage was emphasized. A novel, integrated debubbler in the form of cylindrical traps covered with thin PDMS membrane was designed and manufactured. Demonstrated debubbler was successfully applied in a long-lasting culture of HT-29 cell aggregates.
Źródło:
Challenges of Modern Technology; 2013, 4, 3; 10-15
2082-2863
2353-4419
Pojawia się w:
Challenges of Modern Technology
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Development of a Point-of-Care system for early diagnostics of genetic diseases
Autorzy:
Kwapiszewski, R.
Chudy, M.
Dybko, A.
Brzózka, Z.
Powiązania:
https://bibliotekanauki.pl/articles/115790.pdf
Data publikacji:
2012
Wydawca:
Fundacja na Rzecz Młodych Naukowców
Tematy:
lysosomal storage disorders
Fabry disease
Gaucher disease
early diagnostics
intracellular enzyme activity
Point-of-Care system
lab-on-a-chip system
Opis:
Lysosomal storage disorders (LSDs) represent a group of more than 45 genetically inherited diseases caused by the absence or deficiency of one or more specific lysosomal enzymes. Nowadays, there is a lack of reports on fast, reliable methods for the diagnostics of LSDs. Currently applied diagnostic approaches generate many false-negative and false-positive results, which results in classification of patients to inappropriate therapeutic groups. Moreover, these methods are time-consuming (even 20 hours), and are carried out only in a few laboratories in the world. The goal of this work was to develop a method and a tool, a Point-of-Care system, for diagnostics of LSDs. The polymeric microdevice consists of a cell lysis module, a mixing microchannel and an optical detection module. The system enables to determine the activity of α-galactosidase (deficient in Fabry disease), and to reduce the time of analysis to 10 min. Due to its easy fabrication steps and low price, it seems to be a prospective tool for a point-of-care approach.
Źródło:
Challenges of Modern Technology; 2012, 3, 2; 6-8
2082-2863
2353-4419
Pojawia się w:
Challenges of Modern Technology
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-4 z 4

    Ta witryna wykorzystuje pliki cookies do przechowywania informacji na Twoim komputerze. Pliki cookies stosujemy w celu świadczenia usług na najwyższym poziomie, w tym w sposób dostosowany do indywidualnych potrzeb. Korzystanie z witryny bez zmiany ustawień dotyczących cookies oznacza, że będą one zamieszczane w Twoim komputerze. W każdym momencie możesz dokonać zmiany ustawień dotyczących cookies