Temat: semiconductor diodes - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Reconfigurable Antennas: the State of the Art
Autorzy:: Yashchyshyn, Y.
Powiązania:: https://bibliotekanauki.pl/articles/226828.pdf
Data publikacji:: 2010
Wydawca:: Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:: antenna arrays
reconfigurable antennas
semiconductor devices
MEMS switches
surface PIN diodes
Opis:: The paper provides an overview of the state of the art in the area of reconfigurable antennas. This emerging area has been rapidly developing in the recent years. This article brings a comprehensive summary of the high quality applied and fundamental research contributions in the above-mentioned field. A broad spectrum of topics is covered, reflecting the areas in which Institute of Radioelectronics's expertise is recognized worldwide.
Źródło:: International Journal of Electronics and Telecommunications; 2010, 56, 3; 319-326
2300-1933
Pojawia się w:: International Journal of Electronics and Telecommunications
Dostawca treści:: Biblioteka Nauki

Artykuł

Zmień widok

na półce

Skocz do pozycji: 2.

Tytuł:: Modelling of Schottky contacts for admittance and impurity profiling measurements
Autorzy:: Sikorski, S.
Jung, W.
Powiązania:: https://bibliotekanauki.pl/articles/378443.pdf
Data publikacji:: 2007
Wydawca:: Sieć Badawcza Łukasiewicz - Instytut Technologii Elektronowej
Tematy:: diody Schottky'ego
modelowanie
detektory z barierą Schottky'ego
przyrządy półprzewodnikowe
Schottky diodes
modelling
Schottky barrier photodiodes
semiconductor devices
Opis:: The paper presents a theory of a metal-semiconductor contact biased by dc voltage with superimposed small ac signal. Theoretical considerations based on general transport equations enabled to derive equations useful for admittance and impurity profiling measurements of materials properties.
Źródło:: Electron Technology : Internet Journal; 2007, 39, 5; 1-5
1897-2381
Pojawia się w:: Electron Technology : Internet Journal
Dostawca treści:: Biblioteka Nauki

Artykuł

Zmień widok

na półce

Skocz do pozycji: 3.

Tytuł:: Experimental evaluation of circuit board components under extreme conditions
Autorzy:: Sokół, Krzysztof
Ptak, Piotr
Powiązania:: https://bibliotekanauki.pl/articles/2106230.pdf
Data publikacji:: 2022
Wydawca:: Politechnika Białostocka. Oficyna Wydawnicza Politechniki Białostockiej
Tematy:: experimental test
mathematical model
semiconductor diodes
thermal chamber
WCA
Opis:: Designing products operating in harsh conditions is a challenging task. Years of experience, developed standards and good practices are crucial in achieving the intended result. The article shows a methodology for designing electronic systems based on the worst-case analysis (WCA) and comparing its outcomes with the experimental verification of an actual circuit through large-scale tests. The analysed diode-based semiconductor circuit is part of a temperature measuring system of industrial application. The objective of the design and analysis process is to achieve a reliable solution, which has all the required functionalities under actual, extreme operating conditions. The preliminary circuit design is developed using ideal components. The truth table, which represents customer requirements, is created to check the correct operation of the system. Simulation software, such as LTSpice, are used as the main tools to verify the correct functioning based on ideal or close-to-real component models. Next, based on the results of computer simulations, the WCA is conducted, considering all extreme (worst) operating environment parameters, such as, among others, ambient temperature or ageing. WCA results were verified through an experimental, large-scale measurement of the real system, with defined forward voltage as a function of the current flowing through the semiconductor at various ambient temperatures.
Źródło:: Acta Mechanica et Automatica; 2022, 16, 1; 8--15
1898-4088
2300-5319
Pojawia się w:: Acta Mechanica et Automatica
Dostawca treści:: Biblioteka Nauki

Artykuł

Zmień widok

na półce

Informacja

Wyszukujesz frazę "semiconductor diodes" wg kryterium: Temat

Źródło danych

Dostawca treści

Kolekcja

Rok wydania

Wydawca

Temat

Autor

Typ dokumentu

Język