Informacja

Drogi użytkowniku, aplikacja do prawidłowego działania wymaga obsługi JavaScript. Proszę włącz obsługę JavaScript w Twojej przeglądarce.

Wyszukujesz frazę "scattering distribution function" wg kryterium: Temat


Wyświetlanie 1-3 z 3
Tytuł:
Measurements of spectral spatial di stribution of scattering materials for rear projection screens used in virtual reality systems
Autorzy:
Mazikowski, A.
Trojanowski, M.
Powiązania:
https://bibliotekanauki.pl/articles/220880.pdf
Data publikacji:
2013
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
scattering distribution function
BSDF
virtual reality
CAVE
spectroscopy
luminance
Opis:
Rapid development of computing and visualisation systems has resulted in an unprecedented capability to display, in real time, realistic computer-generated worlds. Advanced techniques, including three-dimensional (3D) projection, supplemented by multi-channel surround sound, create immersive environments whose applications range from entertainment to military to scientific. One of the most advanced virtual reality systems are CAVE-type systems, in which the user is surrounded by projection screens. Knowledge of the screen material scattering properties, which depend on projection geometry and wavelength, is mandatory for proper design of these systems. In this paper this problem is addressed by introducing a scattering distribution function, creating a dedicated measurement setup and investigating the properties of selected materials used for rear projection screens. Based on the obtained results it can be concluded that the choice of the screen material has substantial impact on the performance of the system.
Źródło:
Metrology and Measurement Systems; 2013, 20, 3; 443-452
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Revisiting the role of oceanic phase function in remote sensing reflectance
Autorzy:
Freda, W.
Piskozub, J.
Powiązania:
https://bibliotekanauki.pl/articles/48003.pdf
Data publikacji:
2012
Wydawca:
Polska Akademia Nauk. Instytut Oceanologii PAN
Tematy:
marine optics
remote sensing
scattering
backscattering
volume scattering function
angular variation
scattering light intensity
inherent optical property
sea surface
solar radiation
angular distribution
Opis:
The effect of angular structure differences between measured and best-fit analytical phase functions of the equivalent backscattering ratio on calculated reflectance values was studied and shown to be significant. We used a Monte Carlo radiative transfer code to check the effect of choosing different analytical (several Fournier- Forand (1994) and Henyey-Greenstein (1941)) phase functions with backscattering ratios identical to the ‘classical’ average Petzold function. We show that the additional variability of the resulting water leaving radiance is about 7% (4% between the Fournier-Forand functions themselves) for most scenarios. We also show a previously unknown maximum of the discrepancy (up to 10%) for highly scattering waters. We discuss the importance of relative differences in phase function for different angular ranges to this maximum and to the behaviour of the discrepancy as a function of solar zenith angle.
Źródło:
Oceanologia; 2012, 54, 1
0078-3234
Pojawia się w:
Oceanologia
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Optical methods applied in thickness and topography testing of passive layers on implantable titanium alloys
Autorzy:
Szewczenko, J
Jaglarz, J
Basiaga, M
Kurzyk, J
Paszenda, Z
Powiązania:
https://bibliotekanauki.pl/articles/173875.pdf
Data publikacji:
2013
Wydawca:
Politechnika Wrocławska. Oficyna Wydawnicza Politechniki Wrocławskiej
Tematy:
biomaterials
Ti-6Al-7Nb
passive layer
light scattering
bidirectional reflection distribution function (BRDF)
thin films optics
Opis:
The work presents the results of the applied surface pretreatment on topography and thickness of a passive layer of the anodically oxidized Ti6Al7Nb alloy. In our study were used: integrating sphere spectral measurements, bidirectional reflection distribution function (BRDF) method and optical profilometry. On the basis of the study, the passive layer thickness, roughness, waviness and the autocorrelation length were determined. The influence of voltage of anodization on topographical parameters of TiO2 has been discussed.
Źródło:
Optica Applicata; 2013, 43, 1; 173-180
0078-5466
1899-7015
Pojawia się w:
Optica Applicata
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-3 z 3

    Ta witryna wykorzystuje pliki cookies do przechowywania informacji na Twoim komputerze. Pliki cookies stosujemy w celu świadczenia usług na najwyższym poziomie, w tym w sposób dostosowany do indywidualnych potrzeb. Korzystanie z witryny bez zmiany ustawień dotyczących cookies oznacza, że będą one zamieszczane w Twoim komputerze. W każdym momencie możesz dokonać zmiany ustawień dotyczących cookies