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Wyszukujesz frazę "nonlinearity error" wg kryterium: Temat


Wyświetlanie 1-4 z 4
Tytuł:
Metoda autonomicznej korekcji błędu nieliniowości przetwornika czas-cyfra opartego na różnicowej linii opóźniającej
An autonomous nonlinearity error correction method for a vernier delay line based time-to-digital converter
Autorzy:
Czoków, J.
Powiązania:
https://bibliotekanauki.pl/articles/158168.pdf
Data publikacji:
2010
Wydawca:
Stowarzyszenie Inżynierów i Techników Mechaników Polskich
Tematy:
noniuszowa linia opóźniająca
różnicowa linia opóźniająca
kalibracja
błąd nieliniowości
przetwornik czas-cyfra
vernier delay line
calibration
nonlinearity error
time-to-digital converter
Opis:
W artykule zaprezentowano nową metodę autonomicznej układowej korekcji błędu nieliniowości przetwornika czas-cyfra opartego na noniuszowej linii opóźniającej. Wyniki symulacji pokazały, że możliwe jest zmniejszenie błędów nieliniowości o rząd wielkości. W symulacji Monte Carlo dla szesnastokomórkowej linii noniuszowej zaprojektowanej w technologii CMOS 0.35 m i średnim opóźnieniu komórki wynoszącym 10 ps, otrzymano błędy nieliniowości sumacyjnej INL mniejsze niż 1 ps.
The paper presents a new autonomous nonlinearity error correction method for vernier delay line (VDL, Fig. 1) based time-to-digital converter (TDC). The described VDL consists of flip-flops and two delay chains. The first chain is composed of voltage controlled delay buffers (Fig. 3a) and the second one utilizes digitally controlled shunt capacitor scheme (Fig. 3b). In order to accomplish nonlin-earity correction both delay chains in VDL are first set to the same delay using voltage controlled buffers, then the delays of buffers in both chains are compared with use of flip-flops and adjusted with shunt capacitor controlled buffers. Finally, once more the voltage controlled buffers are used to increase VDL delay and achieve the needed LSB. The simulations show that nonlinearity error reduction by an order of magnitude is possible with this method. Monte Carlo simulations performed with 16 stages VDL (CMOS 0.35 m) indicate that integral nonlinearity (INL) error can be less than 1 ps (Fig. 4b). Some predictions about max INL error based on time model are also presented. Moreover, nonmonotonic VDL can also be corrected, which improves attainable resolution. In opposition to the previously proposed VDL calibration methods[1, 3, 4, 5, 6], there is no need for either implementing accurate signal sources or generating a large number of uncorrelated time events like in the code density method.
Źródło:
Pomiary Automatyka Kontrola; 2010, R. 56, nr 10, 10; 1205-1208
0032-4140
Pojawia się w:
Pomiary Automatyka Kontrola
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Investigation of Different Transfer Functions for Optical Limiting Amplifier used in a 2R Burst Mode Optical Regenerator
Autorzy:
Deodhar, Yash
Reddy, Jeeru Jaya Sankar
Kakade, Priyanka Desai
Kakade, Rohan
Powiązania:
https://bibliotekanauki.pl/articles/1844502.pdf
Data publikacji:
2021
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
optical limiting amplifier
burst mode
ASE noise
nonlinearity
bit error rate
optical regeneration
Opis:
The major difference between a continuous mode optical regenerator (CMOR) and a burst mode optical regenerator (BMOR) is that a BMOR is capable of handling large variations in the input power which makes it useful in optical packet switched and optical burst switched networks. This is due to the optical limiting amplifier (OLA) present in the BMOR. Using computer modelling, the impact of using different OLA non-linear transfer functions on the output bit error rate of a system consisting of a cascade of 2R BMORs has been investigated. The effect of amplified spontaneous emission (ASE) noise introduced in the inter-regenerator links has also been taken into consideration. Also, a brief review of existing OLA designs is presented.
Źródło:
International Journal of Electronics and Telecommunications; 2021, 67, 3; 409-416
2300-1933
Pojawia się w:
International Journal of Electronics and Telecommunications
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Error estimation and adaptivity for nonlinear FE analysis
Autorzy:
Huerta, A.
Rodriguez-Ferran, A.
Diez, P.
Powiązania:
https://bibliotekanauki.pl/articles/907892.pdf
Data publikacji:
2002
Wydawca:
Uniwersytet Zielonogórski. Oficyna Wydawnicza
Tematy:
element skończony
finite elements
error estimation
adaptivity
nonlinearity
quality of FE solutions
damage models
Opis:
An adaptive strategy for nonlinear finite-element analysis, based on the combination of error estimation and h-remeshing, is presented. Its two main ingredients are a residual-type error estimator and an unstructured quadrilateral mesh generator. The error estimator is based on simple local computations over the elements and the so-called patches. In contrast to other residual estimators, no flux splitting is required. The adaptive strategy is illustrated by means of a complex nonlinear problem: the failure analysis of a single-edge notched beam. The quasi-brittle response of concrete is modelled by means of a nonlocal damage model.
Źródło:
International Journal of Applied Mathematics and Computer Science; 2002, 12, 1; 59-70
1641-876X
2083-8492
Pojawia się w:
International Journal of Applied Mathematics and Computer Science
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Disassembly-free metrological control of analog-to-digital converter parameters
Autorzy:
Bubela, Tetiana
Kochan, Roman
Więcław, Łukasz
Yatsuk, Vasyl
Kuts, Victor
Yatsuk, Jurij
Powiązania:
https://bibliotekanauki.pl/articles/2173896.pdf
Data publikacji:
2022
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
metrological support
analog-to-digital converter
non-disassembly control
cyber-physical system
nonlinearity
additive component of error
ACE
multiplicative component of error
Opis:
The authors update the issue disassembly-free control and correction of all components of the error of measuring channels with multi-bit analog-to-digital converters (ADCs). The main disadvantages of existing methods for automatic control of the parameters of multi-bit ADCs, in particular their nonlinearity, are identified. Methods for minimizing instrumental errors and errors caused by limited internal resistances of closed switches, input and output resistances of active elements are investigated. The structures of devices for determining the multiplicative and nonlinear components of the error of multi-bit ADCs based on resistive dividers built on single-nominal resistors are proposed and analyzed. The authors propose a method for the correction of additive, multiplicative and nonlinear components of the error at each of the specified points of the conversion range during non-disassembly control of the ADC with both types of inputs. The possibility of non-disassembly control, as well as correction of multiplicative and nonlinear components of the error of multi-bit ADCs in the entire range of conversion during their on-site control is proven. ADC error correction procedures are proposed. These procedures are practically invariant to the non-informative parameters of active structures with resistive dividers composed of single-nominal resistors. In the article the prospects of practical implementation of the method of error correction during non-dismantling control of ADC parameters using the possibilities provided by modern microelectronic components are shown. The ways to minimize errors are proposed and the requirements to the choice of element parameters for the implementation of the proposed technical solutions are given. It is proved that the proposed structure can be used for non-disassembly control of multiplicative and nonlinear components of the error of precision instrumentation amplifiers.
Źródło:
Metrology and Measurement Systems; 2022, 29, 4; 669--684
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-4 z 4

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