- Tytuł:
- Measurement of basic observation parameters of optoelectronic devices in an accredited laboratory. Measurement methodology, uncertainty analysis
- Autorzy:
-
Bareła, Jarosław
Kastek, Mariusz
Firmanty, Krzysztof - Powiązania:
- https://bibliotekanauki.pl/articles/114246.pdf
- Data publikacji:
- 2019
- Wydawca:
- Stowarzyszenie Inżynierów i Techników Mechaników Polskich
- Tematy:
-
optoelectronic metrology
measurements of parameters of IR cameras
uncertainty analysis - Opis:
- The article describes the methodologies for measuring the basic parameters of optoelectronic observation devices in accordance with applicable standards and international procedures. Noise equivalent temperature difference NETD, minimum resolvable temperature difference MRTD, detection, recognition and identification ranges according to STANAG 4347, angular field of view FOV and modulation transfer function MTF are described. The description and requirements for laboratory measuring stations are presented. The article contains an analysis of measurement uncertainty of measured quantities in accordance with ISO 17025: 2018 and JCGM 100: 2008 guide based on the TOP 6-3-040 procedure.
- Źródło:
-
Measurement Automation Monitoring; 2019, 65, 1; 2-6
2450-2855 - Pojawia się w:
- Measurement Automation Monitoring
- Dostawca treści:
- Biblioteka Nauki
Artykuł