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Wyszukujesz frazę "field-effect transistor" wg kryterium: Temat


Wyświetlanie 1-6 z 6
Tytuł:
Hydrogen sensor based on field effect transistor with C–Pd layer
Autorzy:
Firek, Piotr
Krawczyk, Sławomir
Wronka, Halina
Czerwosz, Elżbieta
Szmidt, Jan
Powiązania:
https://bibliotekanauki.pl/articles/220688.pdf
Data publikacji:
2020
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
FET
C-Pd layer
hydrogen sensor
field effect transistor
Opis:
ISFET (Ion Sensitive Field Effect Transistors) microsensors are widely used for pH measurements as well as analytical and biomedical applications. At the same time, ISFET is a good candidate for testing various materials for their applications in sensitive membranes. For example, hydrogen sensitive carbonaceous films containing Pd nanocrystallites (C-Pd) make this material very interesting for sensor applications. A cost effective silicon technology was selected to fabricate n-channel transistors. The structures were coupled to specially designed double-sided PCB (Printed Circuit Board) holder. The holder enables assembly of the structure as part of an automatic stand. The last step of production of MIS structures was deposition of the C-Pd layer. The C-Pd films were fabricated by the Physical Vapor Deposition (PVD) method in which C60 and palladium acetate were evaporated. Electrical resistance of structures with C-Pd films was measured during their interaction with hydrogen. Finally, a new type of highly sensitive FET hydrogen sensor with C-Pd layer was demonstrated and characterized.
Źródło:
Metrology and Measurement Systems; 2020, 27, 2; 313-321
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
The Behavioural Model of Graphene Field-effect Transistor
Autorzy:
Łuszczek, Maciej
Turzyński, Marek
Świsulski, Dariusz
Powiązania:
https://bibliotekanauki.pl/articles/1844478.pdf
Data publikacji:
2020
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
graphene field effect transistor
behavioural models
circuit simulation
sensors
Opis:
The behavioural model of a graphene field-effect transistor (GFET) is proposed. In this approach the GFET element is treated as a “black box” with only external terminals available and without considering the physical phenomena directly. The presented circuit model was constructed to reflect steady-state characteristics taking also into account GFET capacitances. The authors’ model is defined by a relatively small number of equations which are not nested and all the parameters can be easily extracted. It was demonstrated that the proposed model allows to simulate the steady-state characteristics with the accuracy approximately as high as in the case of the physical model. The presented compact GFET model can be used for circuit or system-level simulations in the future.
Źródło:
International Journal of Electronics and Telecommunications; 2020, 66, 4; 753-758
2300-1933
Pojawia się w:
International Journal of Electronics and Telecommunications
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Historia tranzystora polowego, początki i geneza powstania
The history of field effect transistor, beginning and origins
Autorzy:
Czupryniak, J.
Namirowska, P.
Ossowski, T.
Powiązania:
https://bibliotekanauki.pl/articles/134813.pdf
Data publikacji:
2017
Wydawca:
ADVSEO
Tematy:
field effect transistor
FET
MOSFET
unipolar
N-type channel
P-type channel
gateway
Opis:
Automation diagnostic methods and techniques of environmental monitoring combined with higher precision, sensitivity and selectivity of the currently available detection methods evokes a growing interest of medicine and medical diagnostics to produce the miniaturized diagnostic devices and technology which enable automation of medical procedures. Application of different sensors including chemical ones for detecting substance such as: peptides, proteins, ions, heavy metals in biological systems in which is low concentration of analyte is observed, forces us to use a miniaturized chemical nanosensors with high sensitivity and selectivity. This type of sensors are FET, ISFET and MOSFET. The nano-diagnostic devices with ability of molecular recognition that’s today's world most important analytical challenge for designers and chemists in order to obtain rapid and cheap diagnostic methods. In this paper we present the principle of FET and the genesis of the measuring system.
Źródło:
Technical Issues; 2017, 1; 28-33
2392-3954
Pojawia się w:
Technical Issues
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Variation Analysis of CMOS Technologies Using Surface-Potential MOSFET Model
Autorzy:
Mattausch, H. J.
Yumisaki, A.
Sadachika, N.
Kaya, A.
Johguchi, K.
Koide, T.
Miura-Mattausch, M.
Powiązania:
https://bibliotekanauki.pl/articles/308251.pdf
Data publikacji:
2009
Wydawca:
Instytut Łączności - Państwowy Instytut Badawczy
Tematy:
compact model
fabrication inaccuracy
field-effect transistor
macroscopic
microscopic
potential at channel surface
silicon
within wafer
Opis:
An analysis of the measured macroscopic withinwafer variations for threshold voltage (Vth) and on-current (Ion) over several technology generations (180 nm, 100 nm and 65 nm) is reported. It is verified that the dominant microscopic variations of the MOSFET device can be extracted quantitatively from these macroscopic variation data by applying the surface-potential compact model Hiroshima University STARC IGFET model 2 (HiSIM2), which is presently brought into industrial application. Only a small number of microscopic parameters, representing substrate doping (NSUBC), pocket-implantation doping (NSUBP), carrier-mobility degradation due to gate-interface roughness (MUESR1) and channel-length variation during the gate formation (XLD) are found sufficient to quantitatively reproduce the measured macroscopic within-wafer variations of Vth and Ion for all channel length Lg and all technology generations. Quantitative improvements from 180 nm to 65 nm are confirmed to be quite large for MUESR1 (about 70%) and Lmin(XLD) (55%) variations, related to the gate-oxide interface and the gate-stack structuring, respectively. On the other hand, doping-related technology advances, which are reflected by the variation magnitudes of NSUBC (30%) and NSUBP (25%), are found to be considerably smaller. Furthermore, specific combinations of extreme microscopic parameter-variation values are able to represent the boundaries of macroscopic fabrication inaccuracies for Vth and Ion. These combinations are found to remain identical, not only for all Lg of a given technology node, but also for all investigated technologies with minimum Lg of 180 nm, 100 nm and 65 nm.
Źródło:
Journal of Telecommunications and Information Technology; 2009, 4; 37-44
1509-4553
1899-8852
Pojawia się w:
Journal of Telecommunications and Information Technology
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Distributed radiation monitoring system for linear accelerators based on CAN bus
Autorzy:
Kozak, T.
Makowski, D.
Napieralski, A.
Powiązania:
https://bibliotekanauki.pl/articles/397933.pdf
Data publikacji:
2010
Wydawca:
Politechnika Łódzka. Wydział Mikroelektroniki i Informatyki
Tematy:
obszar pod kontrolą sieci
dozymetria promieniowania gamma
dozymetria promieniowania neutronowego
akcelerator liniowy
controller area network
gamma radiation dosimetry
neutron radiation dosimetry
radiation sensing Field Effect Transistor
linear accelerator
X-ray free electron laser
Opis:
Gamma and neutron radiation is produced during the normal operation of linear accelerators like Free-Electron Laser in Hamburg (FLASH) or X-ray Free Electron Laser (X-FEL). Gamma radiation cause general degeneration of electronics devices and neutron fluence can be a reason of soft error in memories and microcontrollers. X-FEL accelerator will be built only in one tunnel, therefore most of electronic control systems will be placed in radiation environment. Exposing control systems to radiation may lead to many errors and unexpected failure of the whole accelerator system. Thus, the radiation monitoring system able to monitor radiation doses produced near controlling systems is crucial. Knowledge of produced radiation doses allows to detect errors caused by radiation, schedule essential replacement of control systems and prevent accelerator from serious damages. The paper presents the project of radiation monitoring system able to monitor radiation environment in real time.
Źródło:
International Journal of Microelectronics and Computer Science; 2010, 1, 1; 52-55
2080-8755
2353-9607
Pojawia się w:
International Journal of Microelectronics and Computer Science
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Transistor Effect in the Cochlear Amplifier
Autorzy:
Kiełczyński, P.
Szalewski, M.
Powiązania:
https://bibliotekanauki.pl/articles/178149.pdf
Data publikacji:
2014
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
cochlear amplifier
acoustoelectric transducers
electromechanical transistor
equivalent circuits
field effect transistors
ion current
Opis:
The paper presents a new electromechanical amplifying device i.e., an electromechanical biological transistor. This device is located in the outer hair cell (OHC), and constitutes a part of the Cochlear amplifier. The physical principle of operation of this new amplifying device is based on the phenomenon of forward mechanoelectrical transduction that occurs in the OHC’s stereocilia. Operation of this device is similar to that of classical electronic Field Effect Transistor (FET). In the considered electromechanical transistor the input signal is a mechanical (acoustic) signal. Whereas the output signal is an electric signal. It has been shown that the proposed electromechanical transistor can play a role of the active electromechanical controlled element that has the ability to amplify the power of input AC signals. The power required to amplify the input signals is extracted from a battery of DC voltage. In the considered electromechanical transistor, that operates in the amplifier circuit, mechanical input signal controls the flow of electric energy in the output circuit, from a battery of DC voltage to the load resistance. Small signal equivalent electrical circuit of the electromechanical transistor is developed. Numerical values of the electrical parameters of the equivalent circuit were evaluated. The range, which covers the levels of input signals (force and velocity) and output signals (voltage, current) was determined. The obtained data are consistent with physiological data. Exemplary numerical values of currents, voltages, forces, vibrational velocities and power gain (for the assumed input power levels below 1 picowatt (〖10〗^(-12) W), were given. This new electromechanical active device (transistor) can be responsible for power amplification in the cochlear amplifier in the inner ear.
Źródło:
Archives of Acoustics; 2014, 39, 1; 117-124
0137-5075
Pojawia się w:
Archives of Acoustics
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-6 z 6

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