Temat: extrinsic parameters - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Software application for calibration of stereoscopic camera setups
Autorzy:: Rzeszotarski, D.
Pełczyński, P.
Powiązania:: https://bibliotekanauki.pl/articles/221121.pdf
Data publikacji:: 2012
Wydawca:: Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:: camera calibration
canonical stereovision system
intrinsic and extrinsic parameters
Opis:: The article describes an application for calibration of a stereovision camera setup constructed for the needs of an electronic travel aid for the blind. The application can be used to calibrate any stereovision system consisting of two DirectShow compatible cameras using a reference checkerboard of known dimensions. A method forexperimental verification of the correctness of the calibration is also presented. The developed software is intended for calibration of mobile stereovision systems that focus mainly on obstacle detection.
Źródło:: Metrology and Measurement Systems; 2012, 19, 4; 805-816
0860-8229
Pojawia się w:: Metrology and Measurement Systems
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: Automatic calibration of stereoscopic cameras in an electronic travel aid for the blind
Autorzy:: Pełczyński, P.
Ostrowski, B.
Powiązania:: https://bibliotekanauki.pl/articles/220839.pdf
Data publikacji:: 2013
Wydawca:: Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:: stereovision
canonical setup
extrinsic parameters
image rectification
disparity
Opis:: The article describes a technique developed for identification of extrinsic parameters of a stereovision camera system for the purpose of image rectification without the use of reference calibration objects. The goal of the presented algorithm is the determination of the mutual position of cameras, under the assumption that they can be modeled by pinhole cameras, are separated by a fixed distance and are moving through a stationary scene. The developed method was verified experimentally on image sequences of a scene with a known structure.
Źródło:: Metrology and Measurement Systems; 2013, 20, 2; 229-238
0860-8229
Pojawia się w:: Metrology and Measurement Systems
Dostawca treści:: Biblioteka Nauki

Artykuł

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