- Tytuł:
- Two-level approach for solving the inverse problem of defects identification in Eddy Current Testing - type NDT
- Autorzy:
-
Putek, P.
Crevecoeur, G.
Slodička, M.
Gawrylczyk, K.M.
Van Keer, R.
Dupré, L. - Powiązania:
- https://bibliotekanauki.pl/articles/140340.pdf
- Data publikacji:
- 2011
- Wydawca:
- Polska Akademia Nauk. Czytelnia Czasopism PAN
- Tematy:
-
charakterystyka wad
elektromagnetyczny problem odwrotny
problem odwrotny
algorytmy optymalizacji
algorytmy dwupoziomowe
badanie wiroprądowe
analiza wrażliwości
defect characterization
electromagnetic inverse problem
two level optimization algorithms
eddy current testing method
sensitivity analysis - Opis:
- This work deals with the inverse problem associated to 3D crack identification inside a conductive material using eddy current measurements. In order to accelerate the time-consuming direct optimization, the reconstruction is provided by the minimization of a last-square functional of the data-model misfit using space mapping (SM) methodology. This technique enables to shift the optimization burden from a time consuming and accurate model to the less precise but faster coarse surrogate model. In this work, the finite element method (FEM) is used as a fine model while the model based on the volume integral method (VIM) serves as a coarse model. The application of the proposed method to the shape reconstruction allows to shorten the evaluation time that is required to provide the proper parameter estimation of surface defects.
- Źródło:
-
Archives of Electrical Engineering; 2011, 60, 4; 497-518
1427-4221
2300-2506 - Pojawia się w:
- Archives of Electrical Engineering
- Dostawca treści:
- Biblioteka Nauki
Artykuł