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    Wyświetlanie 1-3 z 3
    Tytuł:
    Remarks on Statistical Design Centering
    Autorzy:
    Opalski, L. J.
    Powiązania:
    https://bibliotekanauki.pl/articles/226467.pdf
    Data publikacji:
    2011
    Wydawca:
    Polska Akademia Nauk. Czytelnia Czasopism PAN
    Tematy:
    statistical design centering
    design yield
    realistic worst-case design
    stochastic approximation
    propagation of variance
    Monte Carlo simulation
    Opis:
    The paper overviews optimization based statistical design centering techniques for analog circuits. Emphasis is placed on dependence between formulation of quality indices, problem formulation, and computational complexity of design centering algorithms, executed in single- or multiple-processor environments. For characterization of solution techniques a standard CMOS op-amp design case and a simplified computational complexity analysis are used.
    Źródło:
    International Journal of Electronics and Telecommunications; 2011, 57, 2; 159-167
    2300-1933
    Pojawia się w:
    International Journal of Electronics and Telecommunications
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Analysis of a Simple Method of CMOS IC Design for Yield Optimization
    Autorzy:
    Tomaszewski, D.
    Yakupov, M.
    Powiązania:
    https://bibliotekanauki.pl/articles/397989.pdf
    Data publikacji:
    2012
    Wydawca:
    Politechnika Łódzka. Wydział Mikroelektroniki i Informatyki
    Tematy:
    CMOS
    projektowanie pod kątem zysku
    funkcja gęstości prawdopodobieństwa
    dystrybuanta
    modelowanie statystyczne
    BPV
    symulacja SPICE
    design centering
    design for yield
    probability density function
    cumulative distribution function
    statistical modeling
    BPV method
    SPICE simulation
    Opis:
    A simple approach for CMOS integrated circuit (IC) design taking into account a process variability and oriented towards optimization of a parametric yield has been presented. Its concept is based on cumulative distribution functions of random variables representing IC performances subject to process variations. In the method it has been assumed that CMOS process statistical data are expressed in terms of so-called process parameter distributions. Thus the design centering is done via layout parameter tuning. The approach relies on maximizing the probability that random variables corresponding to IC performances remain within the performance boundaries. Also, a methodology for statistical characterization of CMOS process has been briefly described. Finally, the method operation has been illustrated using analytical and SPICE models of CMOS inverter, operational amplifier and ring oscillator.
    Źródło:
    International Journal of Microelectronics and Computer Science; 2012, 3, 3; 81-87
    2080-8755
    2353-9607
    Pojawia się w:
    International Journal of Microelectronics and Computer Science
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Optimization of the Synthesis Parameters and Analysis of the Impact Sensitivity for Tetrazene Explosive
    Autorzy:
    Li, Jin-Shuh
    Chang, Chun-Chieh
    Lu, Kai-Tai
    Powiązania:
    https://bibliotekanauki.pl/articles/358591.pdf
    Data publikacji:
    2020
    Wydawca:
    Sieć Badawcza Łukasiewicz - Instytut Przemysłu Organicznego
    Tematy:
    tetrazene
    yield
    optimal synthesis parameters
    Taguchi design method
    Opis:
    Tetrazene [1-(5-tetrazolyl)-4-guanyltetrazene hydrate] is widely used in ordnance systems as a sensitizer of primer compositions, for use in both percussion and stab applications. It can be synthesized by reacting aminoguanidinium bicarbonate (AGB) with sodium nitrite (NaNO2) in the presence of acetic acid. However, little is known about its optimal synthesis parameters in the manufacturing process. In this study, Taguchi's experimental design method was used to further improve the yield of tetrazene. Under the condition that the molar ratio of AGB to NaNO2 was fixed at 1.0:1.2, a L9(33) orthogonal array with three control factors and three levels for each control factor was used to design nine experimental conditions. The experimental data were transformed into a signal-to-noise (S/N) ratio to analyze and evaluate the experimental conditions of the optimal parameter combination for the maximum yield of tetrazene. Verification of the results indicated that the optimal synthesis parameters were as follows: pH value of AGB solution was 5.0, reaction temperature was 35 °C and reaction time was 6 h; the maximum yield of tetrazene could reach 83.7%. Furthermore, the synthesized tetrazene was identified and characterized by elemental analysis (EA), nuclear magnetic resonance spectroscopy (NMR), Fourier transform infrared spectroscopy (FTIR), optical microscopy (OM),particle size distribution analysis (PSDA), X-ray diffraction (XRD) and differential scanning calorimetry (DSC), and its impact sensitivity was determined using a BAM Fallhammer apparatus and the Bruceton analysis method.
    Źródło:
    Central European Journal of Energetic Materials; 2020, 17, 1; 5-19
    1733-7178
    Pojawia się w:
    Central European Journal of Energetic Materials
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-3 z 3

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