- Tytuł:
- X-Ray Topography of the Subsurface Crystal Layers in the Skew Asymmetric Reflection Geometry
- Autorzy:
-
Świątek, Z.
Fodchuk, I. - Powiązania:
- https://bibliotekanauki.pl/articles/356405.pdf
- Data publikacji:
- 2016
- Wydawca:
- Polska Akademia Nauk. Czytelnia Czasopism PAN
- Tematy:
-
x-ray topography
subsurface crystal layers
asymmetric reflection geometry - Opis:
- The technique of X ray topography with the asymmetric reflection geometry of X-ray diffraction presented in this paper as useful tool for structural characterization of materials, particularly, epitaxial thin films and semiconductor multi-layered crystal systems used for the optoelectronic devices. New possibilities of this technique for a layer-by-layer visualization of structural changes in the subsurface crystal layers are demonstrated for semiconductors after various types of surface treatment, such as chemical etching, laser irradiation and ion implantation.
- Źródło:
-
Archives of Metallurgy and Materials; 2016, 61, 4; 1931-1938
1733-3490 - Pojawia się w:
- Archives of Metallurgy and Materials
- Dostawca treści:
- Biblioteka Nauki
Artykuł