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Wyszukujesz frazę "analog circuits fault diagnosis" wg kryterium: Temat


Wyświetlanie 1-9 z 9
Tytuł:
Construction of an Expert System Based on Fuzzy Logic for Diagnosis of Analog Electronic Circuits
Autorzy:
Grzechca, D. E.
Powiązania:
https://bibliotekanauki.pl/articles/226616.pdf
Data publikacji:
2015
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
analog circuits fault diagnosis
analog system testing
fuzzy set theory
expert system
sensitivity analysis
Opis:
The paper presents construction of the fuzzy logic system to analog circuits parametric fault diagnosis. The classical dictionary construction is replaced by fuzzy rule system. The first part refers to analog fault diagnosis, its techniques, approaches and goals. It clarifies common strategy and define differences between detecting, locating and identifying a fault in analog electronic circuit. The second part is focused on a creation of fuzzy rule expert system with use of sensitivity functions and known circuit topology. To detect, locate and identify a faulty element in a circuit the sensitivity matrix is used. The advantage of the method is its utilization in all, AC, DC and time domain. The fuzzy system, like the classical fault dictionary, can detect and locate single catastrophic faults and, on the contrary to the classical one, it also detects and locates parametric faults. Moreover, it allows identification of these faults, such that sign of the faulty parameter deviation is designated. The method has deterministic character as well as it can be applied on the verification and production stage.
Źródło:
International Journal of Electronics and Telecommunications; 2015, 61, 1; 77-82
2300-1933
Pojawia się w:
International Journal of Electronics and Telecommunications
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Identification of Circuit Parameters for the Specified or Measured Performances
Autorzy:
Rutkowski, J.
Powiązania:
https://bibliotekanauki.pl/articles/226920.pdf
Data publikacji:
2015
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
analog circuits
parameter identification
fault diagnosis
Opis:
Extension of the method of analog circuit parameter identification for the specified design performances, originally presented by the same author in 1982, is described. These parameters are designated by means of PSpice simulation of the adjoint circuit to the original one. In this adjoint circuit, elements of the original circuit, described by the sized parameters, are replaced by controlled sources. Each such source is controlled by the differential voltage or current, difference between the calculated voltage or current and the specified one, with infinitely large gain. The method is applicable to both linear and nonlinear DC circuits and AC circuits and can be used in many fields of analog circuit design, such as: finding of acceptability region, analog fault diagnosis, postproduction identification and tuning. In the later cases, design performances are replaced by measurements of Circuit Under Test (CUT). Simplicity, extremely low computational complexity and high accuracy are the main benefits of the proposed, basic Circuit Theory based, approach - the solution is found after a single PSpice simulation. For better understanding of the presented methodology, five practical examples are discussed.
Źródło:
International Journal of Electronics and Telecommunications; 2015, 61, 1; 95-100
2300-1933
Pojawia się w:
International Journal of Electronics and Telecommunications
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Multiple soft fault diagnosis of BJT circuits
Autorzy:
Tadeusiewicz, M.
Hałgas, S.
Powiązania:
https://bibliotekanauki.pl/articles/221281.pdf
Data publikacji:
2014
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
analog circuits
BJT circuits
fault diagnosis
multiple faults
Opis:
This paper deals with multiple soft fault diagnosis of nonlinear analog circuits comprising bipolar transistors characterized by the Ebers-Moll model. Resistances of the circuit and beta forward factor of a transistor are considered as potentially faulty parameters. The proposed diagnostic method exploits a strongly nonlinear set of algebraic type equations, which may possess multiple solutions, and is capable of finding different sets of the parameters values which meet the diagnostic test. The equations are written on the basis of node analysis and include DC voltages measured at accessible nodes, as well as some measured currents. The unknown variables are node voltages and the parameters which are considered as potentially faulty. The number of these parameters is larger than the number of the accessible nodes. To solve the set of equations the block relaxation method is used with different assignments of the variables to the blocks. Next, the solutions are corrected using the Newton-Raphson algorithm. As a result, one or more sets of the parameters values which satisfy the diagnostic test are obtained. The proposed approach is illustrated with a numerical example.
Źródło:
Metrology and Measurement Systems; 2014, 21, 4; 663-674
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Multiple soft fault diagnosis of nonlinear dc circuits considering component tolerances
Autorzy:
Tadeusiewicz, M.
Hałgas, S.
Powiązania:
https://bibliotekanauki.pl/articles/221771.pdf
Data publikacji:
2011
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
analog circuits
fault diagnosis
multiple faults
nonlinear circuits
Opis:
This paper is devoted to multiple soft fault diagnosis of analog nonlinear circuits. A two-stage algorithm is offered enabling us to locate the faulty circuit components and evaluate their values, considering the component tolerances. At first a preliminary diagnostic procedure is performed, under the assumption that the non-faulty components have nominal values, leading to approximate and tentative results. Then, they are corrected, taking into account the fact that the non-faulty components can assume arbitrary values within their tolerance ranges. This stage of the algorithm is carried out using the linear programming method. As a result some ranges are obtained including possible values of the faulty components. The proposed approach is illustrated with two numerical examples.
Źródło:
Metrology and Measurement Systems; 2011, 18, 3; 349-360
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
A Verification Technique for Multiple Soft Fault Diagnosis of Linear Analog Circuits
Autorzy:
Tadeusiewicz, M.
Ossowski, M.
Powiązania:
https://bibliotekanauki.pl/articles/227002.pdf
Data publikacji:
2018
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
analog circuits
fault diagnosis
linear circuits
multiple soft fault
verification technique
Opis:
The paper deals with multiple soft fault diagnosis of linear analog circuits. A fault verification method is developed that allows estimating the values of a set of the parameters considered as potentially faulty. The method exploits the transmittance of the circuit and is based on a diagnostic test leading to output signal in discrete form. Applying Z-transform a diagnostic equation is written which is next reproduced. The obtained system of equations consisting of larger number of equations than the number of the parameters is solved using appropriate numerical approach. The method is adapted to real circumstances taking into account scattering of the fault-free parameters within their tolerance ranges and some errors produced by the method. In consequence, the results provided by the method have the form of ranges including the values of the tested parameters. To illustrate the method two examples of real electronic circuits are given.
Źródło:
International Journal of Electronics and Telecommunications; 2018, 64, 1; 83-89
2300-1933
Pojawia się w:
International Journal of Electronics and Telecommunications
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
A method for Soft Fault Diagnosis of Linear Analog Circuits Using the Laplace Transform Technique
Autorzy:
Tadeusiewicz, Michał
Ossowski, Marek
Korzybski, Marek
Powiązania:
https://bibliotekanauki.pl/articles/1844533.pdf
Data publikacji:
2021
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
analog linear circuits
fault diagnosis
multiple soft fault
Laplace transform
Opis:
This paper is focused on multiple soft fault diagnosis of linear time-invariant analog circuits and brings a method that achieves all objectives of the fault diagnosis: detection, location, and identification. The method is based on a diagnostic test arranged in the transient state, which requires one node accessible for excitation and two nodes accessible for measurement. The circuit is specified by two transmittances which express the Laplace transform of the output voltages in terms of the Laplace transform of the input voltage. Each of these relationships is used to create an overdetermined system of nonlinear algebraic equations with the circuit parameters as the unknown variables. An iterative method is developed to solve these equations. Some virtual solutions can be eliminated comparing the results obtained using both transmittances. Three examples are provided where laboratory or numerical experiments reveal effectiveness of the proposed method.
Źródło:
International Journal of Electronics and Telecommunications; 2021, 67, 3; 531-536
2300-1933
Pojawia się w:
International Journal of Electronics and Telecommunications
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
New Aspects of Fault Diagnosis of Nonlinear Analog Circuits
Autorzy:
Tadeusiewicz, M.
Hałgas, S.
Kuczyński, A.
Powiązania:
https://bibliotekanauki.pl/articles/226274.pdf
Data publikacji:
2015
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
analog circuits
fault diagnosis
local and global diagnosis
multiple soft fault
nonlinear circuits
single hard faults
Opis:
The paper is focused on nonlinear analog circuits, with the special attention paid to circuits comprising bipolar and MOS transistors manufactured in micrometer and submicrometer technology. The problem of fault diagnosis of this class of circuits is discussed, including locating faulty elements and evaluating their parameters. The paper deals with multiple parametric fault diagnosis using the simulation after test approach as well as detection and location of single catastrophic faults, using the simulation before test approach. The discussed methods are based on diagnostic test, leading to a system of nonlinear algebraic type equations, which are not given in explicit analytical form. An important and new aspect of the fault diagnosis is finding multiple solutions of the test equation, i.e. several sets of the parameters values that meet the test. Another new problems in this area are global fault diagnosis of technological parameters in CMOS circuits fabricated in submicrometer technology and testing the circuits having multiple DC operating points. To solve these problems several methods have been recently developed, which employ different concepts and mathematical tools of nonlinear analysis. In this paper they are sketched and illustrated. All the discussed methods are based on the homotopy (continuation) idea. It is shown that various versions of homotopy and combinations of the homotopy with some other mathematical algorithms lead to very powerful tools for fault diagnosis of nonlinear analog circuits. To trace the homotopy path which allows finding multiple solutions, the simplicial method, the restart method, the theory of linear complementarity problem and Lemke’s algorithm are employed. For illustration four numerical examples are given.
Źródło:
International Journal of Electronics and Telecommunications; 2015, 61, 1; 83-93
2300-1933
Pojawia się w:
International Journal of Electronics and Telecommunications
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Diagnosis of Soft Spot Short Defects in Analog Circuits Considering the Thermal Behaviour of the Chip
Autorzy:
Tadeusiewicz, M.
Hałgas, S.
Powiązania:
https://bibliotekanauki.pl/articles/221818.pdf
Data publikacji:
2016
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
analog circuits
fault diagnosis
short spot defects
thermal effects
Opis:
The paper deals with fault diagnosis of nonlinear analogue integrated circuits. Soft spot short defects are analysed taking into account variations of the circuit parameters due to physical imperfections as well as self-heating of the chip. A method enabling to detect, locate and estimate the value of a spot defect has been developed. For this purpose an appropriate objective function was minimized using an optimization procedure based on the Fibonacci method. The proposed approach exploits DC measurements in the test phase, performed at a limited number of accessible points. For illustration three numerical examples are given.
Źródło:
Metrology and Measurement Systems; 2016, 23, 2; 239-250
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
A Novel Approach To Diagnosis Of Analog Circuit Incipient Faults Based On KECA And OAO LSSVM
Autorzy:
Zhang, C.
He, Y.
Zuo, L.
Wang, J.
He, W.
Powiązania:
https://bibliotekanauki.pl/articles/221378.pdf
Data publikacji:
2015
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
analog circuits
incipient fault diagnosis
wavelet transform
kernel entropy component analysis
least squares support vector machine
Opis:
Correct incipient identification of an analog circuit fault is conducive to the health of the analog circuit, yet very difficult. In this paper, a novel approach to analog circuit incipient fault identification is presented. Time responses are acquired by sampling outputs of the circuits under test, and then the responses are decomposed by the wavelet transform in order to generate energy features. Afterwards, lower-dimensional features are produced through the kernel entropy component analysis as samples for training and testing a one-against-one least squares support vector machine. Simulations of the incipient fault diagnosis for a Sallen-Key band-pass filter and a two-stage four-op-amp bi-quad low-pass filter demonstrate the diagnosing procedure of the proposed approach, and also reveal that the proposed approach has higher diagnosis accuracy than the referenced methods.
Źródło:
Metrology and Measurement Systems; 2015, 22, 2; 251-262
0860-8229
Pojawia się w:
Metrology and Measurement Systems
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-9 z 9

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