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Wyszukujesz frazę "SXR" wg kryterium: Temat


Wyświetlanie 1-4 z 4
Tytuł:
Investigation of low-temperature plasmas formed in low-density gases surrounding laser-produced plasmas
Autorzy:
Majszyk, Mateusz
Bartnik, Andrzej
Skrzeczanowski, Wojciech
Fok, Tomasz
Węgrzyński, Łukasz
Szczurek, Mirosław
Fiedorowicz, Henryk
Powiązania:
https://bibliotekanauki.pl/articles/2202566.pdf
Data publikacji:
2023
Wydawca:
Instytut Chemii i Techniki Jądrowej
Tematy:
extreme ultraviolet
EUV
laser plasma
low pressure
photoionization
plasma
soft X-ray
SXR
Opis:
Low-temperature plasma production is possible as a result of photoionization using high-intensity extreme ultraviolet (EUV) and soft X-ray (SXR) pulses. Plasma of this type is also present in outer space, e.g., aurora borealis. It also occurs when high-velocity objects enter the atmosphere, during which period high temperatures can be produced locally by friction. Low-temperature plasma is also formed in an ambient gas surrounding the hot laser-produced plasma (LPP). In this work, a special system has been prepared for investigation of this type of plasma. The LPP was created inside a chamber fi lled with a gas under a low pressure, of the order of 1–50 mbar, by a laser pulse (3–9 J, 1–8 ns) focused onto a gas puff target. In such a case, the SXR/EUV radiation emitted from the LPP was partially absorbed in the low-density gas. In this case, high- and low-temperature plasmas (Te ~100 eV and ~1 eV, respectively) were created locally in the chamber. Investigation of the EUV-induced plasmas was performed mainly using spectral methods in ultraviolet/visible (UV/VIS) light. The measurements were performed using an echelle spectrometer, and additionally, spatial–temporal measurements were performed using an optical streak camera. Spectral analysis was supported by the PGOPHER numerical code.
Źródło:
Nukleonika; 2023, 68, 1; 11--17
0029-5922
1508-5791
Pojawia się w:
Nukleonika
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Nanoimaging Using Soft X-Ray and EUV Sources Based on Double Stream Gas Puff Targets
Autorzy:
Wachulak, P.
Torrisi, A.
Ayele, M.
Bartnik, A.
Węgrzyński, Ł.
Fok, T.
Czwartos, J.
Fiedorowicz, H.
Powiązania:
https://bibliotekanauki.pl/articles/1030619.pdf
Data publikacji:
2018-02
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
gas puff target
Fresnel zone plates
EUV/SXR microscopy
contact microscopy
imaging
nanometer resolution
Opis:
In this work we present recent results on nanoscale imaging in the extreme ultraviolet and soft X-ray spectral ranges, describing three novel imaging systems dedicated for high spatial resolution imaging of nanoscale objects with the extreme ultraviolet and soft X-ray radiations. The extreme ultraviolet and soft X-ray full field microscopes operate at 13.8 nm and 2.88 nm wavelengths and are capable of imaging of nanostructures with a sub-50 nm spatial resolution. A soft X-ray contact microscope operates in the "water-window" spectral range from 2.3 to 4.4 nm wavelength, to obtain images of an internal structure of the investigated object in a thin surface layer of soft X-ray light sensitive photoresist. The development of such compact imaging systems may, in the near future, be important from the point of view of new research related to biological, material science, and nanotechnology applications. Such preliminary applications are also shown in the studies of biological samples, including carcinoma cells, diatoms, and neurons.
Źródło:
Acta Physica Polonica A; 2018, 133, 2; 271-276
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Soft X-ray Diagnostic System Upgrades and Data Quality Monitoring Features for Tokamak Usage
Autorzy:
Wojenski, Andrzej
Linczuk, Paweł
Piotr, Kolasinski
Chernyshova, Maryna
Mazon, Didier
Kasprowicz, Grzegorz
Pozniak, Krzysztof T.
Gaska, Michał
Czarski, Tomasz
Krawczyk, Rafał
Powiązania:
https://bibliotekanauki.pl/articles/1844595.pdf
Data publikacji:
2021
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
data quality monitoring
FPGA
Verilog/VHDL
HDL
GEM detector
SXR plasma diagnostics
modular measurement system
data evaluation
tokamak
Opis:
The validation of the measurements quality after on-site diagnostic system installation is necessary in order to provide reliable data and output results. This topic is often neglected or not discussed in detail regarding measurement systems. In the paper recently installed system for soft X-ray measurements is described in introduction. The system is based on multichannel GEM detector and the data is collected and sent in special format to PC unit for further postprocessing. The unique feature of the system is the ability to compute final data based on raw data only. The raw data is selected upon algorithms by FPGA units. The FPGAs are connected to the analog frontend of the system and able to register all of the signals and collect the useful data. The interface used for data streaming is PCIe Gen2 x4 for each FPGA, therefore high throughput of the system is ensured. The paper then discusses the properties of the installation environment of the system and basic functionality mode. New features are described, both in theoretical and practical approach. New modes correspond to the data quality monitoring features implemented for the system, that provide extra information to the postprocessing stage and final algorithms. In the article is described also additional mode to perform hardware simulation of signals in a tokamak-like environment using FPGAs. The summary describes the implemented features of the data quality monitoring features and additional modes of the system.
Źródło:
International Journal of Electronics and Telecommunications; 2021, 67, 1; 109-114
2300-1933
Pojawia się w:
International Journal of Electronics and Telecommunications
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Advanced Real-time Evaluation and Data Quality Monitoring Model Integration with FPGAs for Tokamak High-performance Soft X-ray Diagnostic System
Autorzy:
Wojenski, A.
Poźniak, K.
Mazon, D.
Chernyshova, M.
Powiązania:
https://bibliotekanauki.pl/articles/227260.pdf
Data publikacji:
2018
Wydawca:
Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:
data quality monitoring
system modeling
FPGA
Verilog/VHDL
HDL
GEM detector
SXR plasma diagnostics
modular measurement system
data evaluation
Opis:
Based on the publications regarding new or recent measurement systems for the tokamak plasma experiments, it can be found that the monitoring and quality validation of input signals for the computation stage is done in different, often simple, ways. In the paper is described the unique approach to implement the novel evaluation and data quality monitoring (EDQM) model for use in various measurement systems. The adaptation of the model is made for the GEM-based soft X-ray measurement system FPGA-based. The EDQM elements has been connected to the base firmware using PCI-E DMA real-time data streaming with minimal modification. As additional storage, on-board DDR3 memory has been used. Description of implemented elements is provided, along with designed data processing tools and advanced simulation environment based on Questa software.
Źródło:
International Journal of Electronics and Telecommunications; 2018, 64, 4; 473-479
2300-1933
Pojawia się w:
International Journal of Electronics and Telecommunications
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-4 z 4

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