Temat: Ps 73 - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Oczekiwanie nieśmiertelności w Starym Testamencie
Autorzy:: Filipiak, Marian
Powiązania:: https://bibliotekanauki.pl/articles/1165509.pdf
Data publikacji:: 1978
Wydawca:: Katolicki Uniwersytet Lubelski Jana Pawła II
Tematy:: nieśmiertelność
Ps 16
Ps 49
Ps 73
immortality
Opis:: Nous pouvons distinguer dans l’Ancien Testament trois groupes principaux de textes qui préparent à 1’enseignement sur la vie posthume et qui ne seront entièrement développès que dans le Nouveau Testament. Ce sont d’abord des textes qu i parlent des retrouvailles du mourant et de ses ancêtres, ensuite des textes qui expriment la conviction que Dieu possède un pouvoir sur la vie et sur la mort et, enfin, les Psaumes 16; 49; 73. II résulte de l’analyse de ces textes que la foi en la vie posthume — qui, dans la pensée de l’Ancien Testament, n’est point liée avec l’espoir du salut ou d’une récompense — prend ses racines dans les plus anciennes assises de la pensée religieuse d’Israel.
Źródło:: The Biblical Annals; 1978, 25, 1; 15-22
2083-2222
2451-2168
Pojawia się w:: The Biblical Annals
Dostawca treści:: Biblioteka Nauki

Artykuł

Zmień widok

na półce

Skocz do pozycji: 2.

Tytuł:: Kelvin Force Microscopy Characterization of Corona Charged Dielectric Surfaces
Autorzy:: Marinskiy, D.
Edelman, P.
Snider, A.
Powiązania:: https://bibliotekanauki.pl/articles/1363397.pdf
Data publikacji:: 2014-04
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 77.55.-g
73.61.-r
68.37.Ps
73.25.+i
Opis:: Ionic diffusion of $(H_2O)_{n}^{+}$ and $CO¯_3$ on $SiO_2$ surfaces has been quantified using Kelvin force microscopy measurement of ion distribution change after small spot corona charge. For both positive and negative ionic species, the concentration profiles versus time follow the two-dimensional surface diffusion enabling a determination of corresponding diffusion coefficients. On a thermally grown $SiO_2$ surface, diffusion coefficients of $(H_2O)_{n}^{+}$ and $CO¯_3$ ions were 2.2 × $10^{-11} cm^2$/s and 4.8 × $10^{-12} cm^2$/s, respectively. On a chemically cleaned $SiO_2$ surface, diffusion coefficients of $(H_2O)_{n}^{+}$ and $CO¯_3$ ions were 7.5 × $10^{-9} cm^2$/s and 2.4 × $10^{-9} cm^2$/s, respectively. Mathematical analysis of the surface potential decay yields an additional parameter - capacitance equivalent thickness.
Źródło:: Acta Physica Polonica A; 2014, 125, 4; 997-1002
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Zmień widok

na półce

Skocz do pozycji: 3.

Tytuł:: Preparation and Characterization of Nanocrystalline PbS Thin Films Produced by Chemical Bath Deposition
Autorzy:: Göde, F.
Yavuz, F.
Kariper, İ.
Powiązania:: https://bibliotekanauki.pl/articles/1401980.pdf
Data publikacji:: 2015-08
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 68.37.Ps
68.55.-a
78.20.-e
73.61.Ga
Opis:: Lead sulfide thin films are deposited on glass substrates at room temperature for 2 h by chemical bath deposition. The structure, surface morphology, optical and electrical properties of the thin films are characterized by X-ray diffraction, scanning electron microscopy, atomic force microscopy, optical absorption spectroscopy and the Hall effect measurements. The obtained films show the formation of well crystallized PbS with a cubic rock salt structure and with the preferential orientation (111) plane. The lattice parameter and crystallite size of the films are found as a=600 Å and 62 nm from the X-ray reflectivity data from the atomic force microscopy image, respectively. The band gap width of the films is determined as 2.84 eV. The optical parameters of the films such as refractive index, extinction coefficient, real and imaginary parts of dielectric constant are evaluated. Moreover, from the Hall measurements, electrical resistivity, conductivity carrier mobility, and carrier concentration of the films are determined as 3.722 Ω m, 0.268 Ω¯¹ m¯¹, 8.486× 10¯¹ m² V¯¹ s¯¹, and $1.976 \times 10^{18} m^{-3}$, respectively.
Źródło:: Acta Physica Polonica A; 2015, 128, 2B; B-215-B-218
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Zmień widok

na półce

Skocz do pozycji: 4.

Tytuł:: Influence of Thermal Process on Physical Properties of ZnO Films Prepared by Spray Pyrolysis
Autorzy:: Gencyilmaz, O.
Atay, F.
Akyuz, I.
Powiązania:: https://bibliotekanauki.pl/articles/1377852.pdf
Data publikacji:: 2014-12
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 81.05.Dz
78.66.Hf
73.61.Ga
68.37.Ps
Opis:: ZnO films were deposited on glass substrates by ultrasonic spray pyrolysis technique at a substrate temperature of 300 ± 5°C. All of the films have been annealed at 500°C temperature for different time (1, 2, and 3 h) to improve the optical, electrical and surface properties. The effect of annealing time on the films of physical properties has been investigated. UV-Vis spectrophotometer has been used for transmittance measurements. Also, band gap values of the films have been determined by optical method. Atomic force microscopy has been used to have information the surface morphology and roughness values of the films. Thicknesses, refractive index and extinction coefficient values of the films have been determined by spectroscopic ellipsometry technique. The electrical conduction mechanisms and resistivity of the films were investigated using two probe technique. After all the investigations it was concluded that annealing time has a dramatic effect especially on the surface, optical properties and electrical resistivity values of ZnO films. From the results of these investigations, the application potential of the films for solar cell devices as transparent electrode was searched.
Źródło:: Acta Physica Polonica A; 2014, 126, 6; 1331-1337
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Zmień widok

na półce

Skocz do pozycji: 5.

Tytuł:: Mechanical and Electrical Properties, of ZnO-Nanowire/Si-Substrate Junctions Studied by Scanning Probe Microscopy
Autorzy:: Aleszkiewicz, M.
Fronc, K.
Wróbel, J.
Klepka, M.
Wojtowicz, T.
Karczewski, G.
Powiązania:: https://bibliotekanauki.pl/articles/2047440.pdf
Data publikacji:: 2007-08
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 68.37.Ef
68.37.Ps
68.65.La
73.21.Hb
78.67.Lt
Opis:: Scanning tunneling spectroscopy was used to check the tunneling I-V characteristics of junctions formed by n-ZnO nanowires deposited on Si substrates with n- and p-type electrical conductivity (i.e. n-ZnO nanowire/n-Si and n-ZnO nanowire/p-Si junctions, respectively). Simultaneously, several phenomena which influence the measured I-V spectra were studied by atomic force microscopy. These influencing factors are: the deposition density of the nanowires, the possibility of surface modification by tip movement (difference in attraction forces between nanowires and the p-Si and n-Si) and the aging of the surface.
Źródło:: Acta Physica Polonica A; 2007, 112, 2; 255-260
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Zmień widok

na półce

Informacja

Wyszukujesz frazę "Ps 73" wg kryterium: Temat

Źródło danych

Dostawca treści

Kolekcja

Rok wydania

Wydawca

Temat

Autor

Typ dokumentu

Język