- Tytuł:
- Seebeck coefficient measurement by Kelvin-probe force microscopy
- Autorzy:
-
Ikeda, H.
Salleh, F.
Asai, K. - Powiązania:
- https://bibliotekanauki.pl/articles/384281.pdf
- Data publikacji:
- 2009
- Wydawca:
- Sieć Badawcza Łukasiewicz - Przemysłowy Instytut Automatyki i Pomiarów
- Tematy:
-
Seebeck coefficient
Kelvin-probe force microscopy
nanostructure - Opis:
- In order to measure the Seebeck coefficient of nanometer-scale thermoelectric materials, we propose a new technique in which the thermoelectric-motive force (TEMF) is evaluated by Kelvin-probe force microscopy (KFM). In this study, we measured the Seebeck coefficient of an n-type Si wafer. The surface-potential difference between the high- and low-temperature regions on the Si wafer increases with increasing temperature difference. This indicates that the TEMF can be measured by KFM. The Seebeck coefficient evaluated from the surface-potential difference is 0.71š0.08 mV/K, which is close to that obtained by the conventional method.
- Źródło:
-
Journal of Automation Mobile Robotics and Intelligent Systems; 2009, 3, 4; 49-51
1897-8649
2080-2145 - Pojawia się w:
- Journal of Automation Mobile Robotics and Intelligent Systems
- Dostawca treści:
- Biblioteka Nauki
Artykuł