Informacja

Drogi użytkowniku, aplikacja do prawidłowego działania wymaga obsługi JavaScript. Proszę włącz obsługę JavaScript w Twojej przeglądarce.

Wyszukujesz frazę "87.59.B-" wg kryterium: Temat


Wyświetlanie 1-3 z 3
Tytuł:
Advances in High Intensity e-Beam Diode Development for Flash X-Ray Radiography
Autorzy:
Oliver, B.
Hahn, K.
Johnston, M.
Portillo, S.
Powiązania:
https://bibliotekanauki.pl/articles/1807904.pdf
Data publikacji:
2009-06
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
41.75.Fr
41.75.Ht
41.50.+h
52.59.Mv
87.59.B-
Opis:
Recent experiments at Sandia National Laboratories have demonstrated an electron beam diode X-ray source capable of producing >350 rad at one meter with 1.7 mm FWHM X-ray source distribution, with a 50 ns pulse-width and X-ray photon endpoint energy spectrum in the 6-7 MeV range. The diode operates at current densities of ≈1 MA/$cm^{2}$. The intense electron beam rapidly ( ≈ 5 ns) heats the X-ray conversion anode/target, liberating material in the form of low density ion emission early in the pulse and high density plasma later. This environment gives rise to beam/plasma collective effects which dominate the diode and beam characteristics, affecting the radiation properties (dose and spot-size). A review of the diode operation, the measured source characteristics and the simulation methods and diagnostics used to guide its optimization is given.
Źródło:
Acta Physica Polonica A; 2009, 115, 6; 1044-1046
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Applications of a compact "water window" source for investigations of nanostructures using SXR microscope
Autorzy:
Torrisi, A.
Wachulak, P.
Fahad Nawaz, M.
Bartnik, A.
Adjei, D.
Vondrová, Š.
Turňová, J.
Jančarek, A.
Fiedorowicz, H.
Powiązania:
https://bibliotekanauki.pl/articles/1065141.pdf
Data publikacji:
2016-02
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
52.38.-r
42.30.-d
42.62.-b
87.59.-e
68.37.Yz
07.85.Tt
41.50.+h
42.79.Dj
Opis:
A compact soft X-ray microscope based on a nitrogen double-stream gas puff target soft X-ray source, operating at He-like nitrogen spectral line at the wavelength of λ =2.88 nm is presented. The desk-top size microscope was successfully demonstrated in transmission mode using the Fresnel zone-plate objective and it is suitable for soft X-ray source microscopy in the "water window" spectral range (λ = 2.3÷ 4.4 nm). Details about the soft X-ray source source, the microscope and an example of application in the biomedical field are shown and discussed.
Źródło:
Acta Physica Polonica A; 2016, 129, 2; 169-171
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Ion and Electron Beam Induced Luminescence οf Rare Earth Doped YAG Crystals
Autorzy:
Gawlik, G.
Sarnecki, J.
Jóźwik, I.
Jagielski, J.
Pawłowska, M.
Powiązania:
https://bibliotekanauki.pl/articles/1504113.pdf
Data publikacji:
2011-07
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.60.Hk
52.59.Bi
79.20.Rf
61.80.Lj
41.75.Ak
41.75.Cn
61.72.S-
61.72.-y
29.40.-n
77.84.Bw
79.60.Ht
87.53.Bn
78.55.-m
78.60.-b
77.55.Px
77.55.-g
25.40.Lw
Opis:
The aim of this work was the evaluation of ion-beam induced luminescence for the characterization of luminescent oxide materials containing rare earth elements. The yttrium aluminium garnet epilayers doped with Nd, Pr, Ho, and Tm atoms were used. The ion-beam induced luminescence spectra were excited using 100 keV $H_2^{+}$ ion beam and were recorded in the wavelengths ranging from 300 nm up to 1000 nm. The separate parts of the surface of the same samples were used for ion-beam induced luminescence and cathodoluminescence experiments. Cathodoluminescence spectra have been recorded in the range from 370 nm up to 850 nm at 20 keV e-beam in scanning electron microscope equipped with a grating spectrometer coupled with a photomultiplier. The observed narrow ion-beam induced luminescence lines can be ascribed to the well known radiative transitions in the rare-earth ions in the YAG crystals. The cathodoluminescence spectra reveal essentially the same emission lines as ion-beam induced luminescence. The decrease of the ion-beam induced luminescence lines intensity has been observed under the increasing ion fluences. The ion-beam induced luminescence may be used for characterization of transparent luminescent materials as an alternative method for cathodoluminescence and can be especially useful for observation of ion-beam damage formation in crystals.
Źródło:
Acta Physica Polonica A; 2011, 120, 1; 181-183
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-3 z 3

    Ta witryna wykorzystuje pliki cookies do przechowywania informacji na Twoim komputerze. Pliki cookies stosujemy w celu świadczenia usług na najwyższym poziomie, w tym w sposób dostosowany do indywidualnych potrzeb. Korzystanie z witryny bez zmiany ustawień dotyczących cookies oznacza, że będą one zamieszczane w Twoim komputerze. W każdym momencie możesz dokonać zmiany ustawień dotyczących cookies