- Tytuł:
- Photoemission and Inverse Photoemission Studies of SiO$\text{}_{2}$
- Autorzy:
-
Sobczak, A.
Nietubyć, R.
Sobczak, J. W. - Powiązania:
- https://bibliotekanauki.pl/articles/1931764.pdf
- Data publikacji:
- 1994-11
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
79.20.Kz
71.25.Tn
79.60.Ht - Opis:
- Occupied and unoccupied electron states of amorphous silicon dioxide film supported on Si crystal are studied by using X-ray photoemission and, for the first time, X-ray inverse photoemission (X-ray bremsstrahlung isochromat method). A special care was undertaken to minimize decomposition of silicon oxide during X-ray bremsstrahlung measurements. The experimental spectra are compared with theoretical band structure calculations for amorphous SiO$\text{}_{2}$ from the literature and good overall agreement is found.
- Źródło:
-
Acta Physica Polonica A; 1994, 86, 5; 837-843
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł