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Tytuł:
THz Time Domain Spectroscopy of Thin Gold Layers on GaAs
Autorzy:
Szczytko, J.
Adomavicius, R.
Papis, E.
Barańska, A.
Wawro, A.
Krotkus, A.
Piętka, B.
Łusakowski, J.
Powiązania:
https://bibliotekanauki.pl/articles/1417930.pdf
Data publikacji:
2012-12
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.66.Bz
78.68.+m
Opis:
Thin layers of Au with the thickness of several nanometers were prepared on a semi-insulating GaAs substrate. The layers' thickness was determined by ellipsometry. THz time-domain spectroscopy was applied to determine a complex index of refraction of thin Au layers. The obtained results allow for a more precise modeling of the performance of semiconductor devices at THz frequencies.
Źródło:
Acta Physica Polonica A; 2012, 122, 6; 1118-1120
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Angle Resolved Scattering Combined with Optical Profilometry as Tools in Thin Films and Surface Survey
Autorzy:
Marszałek, K.
Wolska, N.
Jaglarz, J.
Powiązania:
https://bibliotekanauki.pl/articles/1402327.pdf
Data publikacji:
2015-07
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.35.+c
78.68.+m
78.66.Jg
Opis:
The work presents an application of two scanning optical techniques, i.e. optical profilometry and angle resolved scattering method. The first method measures the light reflected from a film during scan of the surface, while the second method measures light intensity as a function of the scattering angle. The angle resolved scattering and optical profilometry measurements, being complementary to the atomic force microscopy, give information about surface topography. Scattered radiation measured by angle resolved scattering and optical profilometry is a function of height and slope of microfacets. The analysis of images allows to determine the most important statistic surface parameters, like roughness, height distribution and autocorrelation length, in large wavelength range by the determination of power spectral density function. The fast Fourier transform of angle resolved scattering and optical profilometry images permits to determine the distribution of surface features in the inverse space, such as periodicity and anisotropy. In this paper the results obtained for porous SiO₂, SiO₂-TiO₂ blends, TiN and polymer thin films have been presented. The paper demonstrates the usefulness of the angle resolved scattering and optical profilometry for the surface and volume thin film inspection.
Źródło:
Acta Physica Polonica A; 2015, 128, 1; 81-86
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Effect of N₂⁺ Ion Implantation and Thermal Annealing on Near-Surface Layers of Implanted GaAs
Autorzy:
Kulik, M.
Surowiec, Z.
Rzodkiewicz, W.
Filiks, J.
Drozdziel, A.
Powiązania:
https://bibliotekanauki.pl/articles/1402234.pdf
Data publikacji:
2015-11
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.66.Fd
78.68.+m
79.20.Rf
Opis:
The surface of semi-isolating GaAs (100) was irradiated with a fluence of 6×10¹⁷ cm¯² of the N₂⁺ ion beam; then, the samples were thermally annealed at temperatures of 500, 700, and 900°C for 2 h in an argon gas flow. The surface roughness of implanted samples was investigated with the help of atomic force microscopy. Numerous hillocks, which caused a significant increase in surface roughness, were observed. The spectroscopic ellipsometry method was used for determination of pseudo-dielectric functions of the near-surface layers in the investigated samples and the thickness of native oxides covering the irradiated surface. It was observed that the shapes of disorder spectra of the dielectric functions of near-surface layers of implanted GaAs partly returned to their original state after the thermal annealing.
Źródło:
Acta Physica Polonica A; 2015, 128, 5; 918-922
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Dispersion of Bloch Modes in a Multilayer Structure with Alternating Left-Handed and Right-Handed Materials
Autorzy:
Vukovic, S.
Aleksic, N. B.
Timotijevic, D. V.
Powiązania:
https://bibliotekanauki.pl/articles/2047883.pdf
Data publikacji:
2007-11
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
41.20.Jb
78.66.Fd
78.68.+m
Opis:
We study all-evanescent eigenmodes of a one-dimensional infinite periodic structure with alternating left-handed and right-handed materials that propagate perpendicularly to the surface or guided eigenmodes. Investigation of dispersion properties of such Bloch modes is shown to be crucial for understanding of an efficient radiation energy transport across the periodic multilayer structure. Frequency pass bands and gaps are found as a function of the two orthogonal wave vectors: the Bloch wave vector k$\text{}_{B}$ and the surface wave vector k$\text{}_{S}$. We demonstrate that pass bands of both TE- and TM-polarizations can exist and, under certain conditions, may overlap.
Źródło:
Acta Physica Polonica A; 2007, 112, 5; 1061-1066
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Influence of growth conditions of hydrogenated amorphous silicon carbide on optical properties of the interfacial layer in SiC-based photodevice
Autorzy:
Kaci, S.
Keffous, A.
Bozetine, I.
Trari, M.
Fellahi, O.
Powiązania:
https://bibliotekanauki.pl/articles/1070464.pdf
Data publikacji:
2016-07
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.68.+m
78.66.-w
78.67.Bf
78.55.-m
Opis:
The attention has been focused on the optical properties of structures of the form Au/MS/a-Si_{1-x}C_x:H/Si(100)/Al as a function of the deposition temperature of the a-Si_{1-x}C_x:H films. The amorphous SiC:H films were obtained for different temperatures ranging from 150°C up to 500°C. By photoluminescence, blue emission from all the structures was observed at room temperature and a high emission was obtained for sample whose amorphous film was deposited at 500°C. The spectral response of Au/MS/a-Si_{1-x}C_x:H/Si(100)/Al structures with a-Si_{1-x}C_x:H film deposited at 250°C, exhibits a maximum value at λ=950 nm while for structure with a-Si_{1-x}C_x:H film obtained at 150°C, a maximum value of λ was observed at 400 nm.
Źródło:
Acta Physica Polonica A; 2016, 130, 1; 463-465
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Spectroscopic Ellipsometry of Porphyrin Adsorbed in Porous Silicon
Autorzy:
Babonas, G.
Snitka, V.
Rodaitė, R.
Šimkienė, I.
Rėza, A.
Treideris, M.
Powiązania:
https://bibliotekanauki.pl/articles/1178739.pdf
Data publikacji:
2005-02
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.68.+m
61.43.-j
61.43.Gt
Opis:
Aqueous solution of meso-tetra(4-sulfonatophenyl)porphine was deposited on electrochemically etched n-Si wafers. The morphology of the hybrid systems was investigated by scanning electron microscope and atomic force microscope techniques. The optical response of the hybrid systems was studied by spectroscopic ellipsometry in the range of 1-5 eV. Particular features in adsorption process were revealed for meso-tetra(4-sulfonatophenyl)porphine deposited on variously chemically treated Si substrates. It was found that porphyrin J-aggregates can be intercalated into large pores formed in a bulk n-Si as well as into nanopores of luminescent oxide layer.
Źródło:
Acta Physica Polonica A; 2005, 107, 2; 319-323
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Identification of Gastric Cancer from Speckle Patterns
Autorzy:
Andrade-Eraso, C.
Patiño-Velasco, M.
Vásquez-López, J.
León, J.
Bolaños-Pantoja, G.
Trivi, M.
Powiązania:
https://bibliotekanauki.pl/articles/1490749.pdf
Data publikacji:
2012-01
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.68.+m
42.87.-d
87.50.W-
Opis:
Speckle technique is based on the light intensity distribution randomly formed when a laser light is reflected on a rough surface, creating a pattern of illuminated grains (constructively) and dark (destructive) on scales of 1 μm. When the samples are displaced or deformed, the speckle pattern is altered. In this paper we present speckle patterns obtained from samples of gastric mucosa that is physically altered for the carcinogenesis process. Biopsies were studied with different diagnoses and were grouped according to the characteristics of speckle patterns. Speckle patterns were obtained by illuminating the samples with green laser. Morphological parameters of the speckle patterns reveal existence of 3 descriptors: the average grain size, hydraulic radius and the radio of the Weddel disc, which showed a high, intermediate and low value. The comparison shows agreement between the histopathological diagnosis and the values obtained by the speckle technique, making this technique emerge as a new classification system for quantitative diagnosis of precancerous lesions.
Źródło:
Acta Physica Polonica A; 2012, 121, 1; 62-64
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Growth Characteristics of Plasma Electrolytic Oxidation Coatings on Aluminum Alloys
Autorzy:
Ayday, A.
Durman, M.
Powiązania:
https://bibliotekanauki.pl/articles/1400565.pdf
Data publikacji:
2015-04
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.68.+m
81.65.-b
52.77.-j
Opis:
The ceramic coating on aluminum alloy was prepared in sodium metasilicate electrolyte by plasma electrolytic oxidation (PEO). The effect of PEO treating time on surface layer was investigated. The morphology and phase composition of the ceramic coatings were characterized by scanning electron microscopy (SEM) and X-ray diffractometer (XRD). The effect of the electrolyte contents on the growth mechanism, element distribution and properties of oxide layers were studied. Oxide coatings morphology is strongly dependent on PEO process time. The microdischarges characteristics were studied as well, and it is shown that size of microdischarges becomes larger with increasing time of PEO. XRD analysis showed that Plasma Electrolytic Oxidation coating has hard, dominantly Al₂O₃ phase.
Źródło:
Acta Physica Polonica A; 2015, 127, 4; 886-887
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Optical Properties of $As_{36}Te_{42}Ge_{10}Si_{12}$ Thin Films
Autorzy:
Hegab, N.
El-Mallah, H.
Powiązania:
https://bibliotekanauki.pl/articles/1535744.pdf
Data publikacji:
2010-10
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
78.20.-e
78.20.Ci
78.66.-w
78.68.+m
Opis:
Thermally evaporated $As_{36}Te_{42}Ge_{10}Si_{12}$ amorphous chalcogenide films were prepared in a vacuum of $10^{-5}$ Torr on to glass substrates hold at about 300 K during the deposition process. Measurements of the optical properties have been made. The optical transmittance and reflectance spectra of films in the thickness range 155-395 nm were measured in the wavelength λ range 500-2500 nm. The refractive index n, the extinction coefficient k and the absorption coefficient α were calculated for the studied films. It is found that both n and k are independent on the film thickness. The refractive index n has anomalous behavior for the wavelength λ range 500-1500 nm, while it has normal dispersion for the wavelength greater than 1500 nm. The optical energy gap was estimated from absorption coefficient. The allowed optical transitions were found to be nondirect transitions with optical gap of 1.08 eV for the sample under test. The effect of annealing on the obtained optical parameters was also investigated.
Źródło:
Acta Physica Polonica A; 2010, 118, 4; 637-642
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
STM-Induced Luminescence for Alkanethiol Films on Au(111) Surface
Autorzy:
Nishitani, R.
Tateishi, Y.
Arakawa, H.
Kasuya, A.
Sumiyama, K.
Powiązania:
https://bibliotekanauki.pl/articles/2036894.pdf
Data publikacji:
2003
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
68.37.Ef
73.20.Mf
78.68.+m
68.43.Hn
Opis:
STM-induced luminescence spectra for organic molecule adsorbed Au(111) surfaces were studied, and the influence of STM-tip alloy material on the emission spectra was measured. We observed the STM-tip dependent emission spectra of Au(111). The characteristics of the spectra with Pt-Ir alloy(20%) tip are interpreted in terms of the one-mode type and two-mode type depending on the composition rates. We measured the emission spectra for two different types of molecules, decanethiol and octanedithiol, which have different adsorption structures. The emission spectra for the octanedithiol films were compared with the spectra from clean gold films and the decanethiol films. A spectral change of Au(111) due to adsorption of octanedithiol molecules on Au(111) was observed in the spectral range from 700 through 780 nm while not for the adsorption of decanethiol molecules. The spectral change due to adsorption of octanedithiol molecules is compared with the STS measurements.
Źródło:
Acta Physica Polonica A; 2003, 104, 3-4; 269-279
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
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