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    Wyświetlanie 1-6 z 6
    Tytuł:
    Nanostructure of Thin Gold Films Investigated by Means of Atomic Force Microscopy and X-Ray Reflectometry Methods
    Autorzy:
    Żymierska, D.
    Auleytner, J.
    Domagała, J.
    Kobiela, T.
    Duś, R.
    Powiązania:
    https://bibliotekanauki.pl/articles/2035502.pdf
    Data publikacji:
    2002-08
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    68.55.-a
    68.37.Ps
    61.10.Kw
    Opis:
    A study of the thin gold film growth, during the deposition on glass substrate under UHV conditions at low temperatures, is presented. The complementary methods, the atomic force microscopy and grazing incidence X-ray reflectometry, are used for the research. It is shown that due to variation of the time of deposition from 2 to 50 min different kinds of thin Au films nanostructures are obtained: from discontinuous films consisting of isolated islands, via formation of the chains of islands, up to continuous films.
    Źródło:
    Acta Physica Polonica A; 2002, 102, 2; 289-294
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Layer and Interface Structure of CoFe/Ru Multilayers
    Autorzy:
    Pym, A.
    Lamperti, A.
    Cardoso, S.
    Freitas, P.
    Tanner, B.
    Powiązania:
    https://bibliotekanauki.pl/articles/1814028.pdf
    Data publikacji:
    2007-12
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    61.10.Kw
    68.65.Ac
    68.35.Ct
    75.50.Kj
    85.75.Dd
    85.70.Ay
    Opis:
    Grazing incidence X-ray scattering measurements have been performed to probe the structure of CoFe/Ru layers and their interfaces. It was found that the interface width increased approximately linearly with the layer number from the substrate in a multilayer and that a substantial asymmetry existed between the width of CoFe/Ru and Ru/CoFe interfaces. By co-minimizing both the specular and diffuse scatter with that simulated from a model structure, the topological roughness amplitude was determined to be comparable to the intermixing interface width.
    Źródło:
    Acta Physica Polonica A; 2007, 112, 6; 1243-1248
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    The Behaviour of Surfactants during the Growth of Co/Cu Multilayers
    Autorzy:
    Polit, A.
    Kąc, M.
    Krupiński, M.
    Samul, B.
    Zabila, Y.
    MarszaŁek, M.
    Powiązania:
    https://bibliotekanauki.pl/articles/1814035.pdf
    Data publikacji:
    2007-12
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    82.80.Pv
    61.10.Kw
    68.65.Ac
    68.55.Ln
    Opis:
    The $[Co(1 nm)//Cu(2 nm)]_N$ multilayers with different numbers of bilayer repetitions (N=3 and 10) were thermally evaporated on Si(100) substrates with a small amount of Bi or Pb deposited only on the first and on the second Cu layer. The chemical composition of the surface after each step of the preparation process was studied by Auger electron spectroscopy. The evolution of the Auger peaks showed the segregation of Bi and Pb surfactants. During the evaporation of the subsequent Co and Cu layers, gradual decrease in the surfactant amount on the surface was observed. No appearance of Co peak on the Cu layer, and Cu peak on the Co layer even for a coverage of a few å indicates the layer continuity. The interface roughness of the surfactant-mediated Co/Cu layers analyzed by X-ray reflectometry (when surfactant was deposited twice) was similar to the pure Co/Cu samples. However, more repetitions of surfactant, by reduction of interface roughness, improve the layer quality.
    Źródło:
    Acta Physica Polonica A; 2007, 112, 6; 1281-1287
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Metrological Applications of X-ray Waveguide Thin Film Structures in X-ray Reflectometry and Diffraction
    Autorzy:
    Pełka, J. B.
    Lagomarsino, S.
    Powiązania:
    https://bibliotekanauki.pl/articles/2035489.pdf
    Data publikacji:
    2002-08
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    68.65.-k
    61.10.Kw
    06.30.Bp
    Opis:
    The effect of resonance, observed in X-ray waveguide layered structures in a characteristic way influences the scattering properties of the films. It is well known that in the resonant region the reflectivity shows a series of minima, usually very deep and extremely narrow. The positions and depths of the minima depend only on X-ray waveguide structural properties, on the X-ray wavelength and on the incident beam divergence. In the present work we propose and discuss the application of the X-ray waveguide and quasi X-ray waveguide film structures as tools to experimental evaluation of some quantities related to X-ray reflectometric or diffractometric measurements, like the beam divergence, wavelength, or angular distance. Examples of application of the X-ray waveguide as an excellent tool to estimate the effective beam divergence are shown. Properties of the X-ray waveguide elements as a handy wavelength or angular calibration standard are also mentioned.
    Źródło:
    Acta Physica Polonica A; 2002, 102, 2; 233-238
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Energy-Dispersive X-Ray Reflectometry and X-Ray Grazing Incidence Diffraction from Organic Multilayers
    Autorzy:
    Neißendorfer, F.
    Bolm, A.
    Pietsch, U.
    Powiązania:
    https://bibliotekanauki.pl/articles/1963393.pdf
    Data publikacji:
    1997-04
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    68.18.+p
    61.10.Kw
    68.55.Jk
    07.85.Qe
    Opis:
    The installation of the wavelength shifter at the BESSY I storage ring in Berlin makes it possible to apply the synchrotron radiation for white beam investigations of organic multilayers. Considering the energy characteristic of the synchroton radiation source and the absorbance of the beryllium window the synchrotron radiation can be used outside the UHV system for X-ray reflectometry and X-ray diffuse scattering between about 3 keV and 25 keV. Between 3 and 10 keV the synchrotron radiation intensity is high enough to realize the grazing incidence diffraction mode in order to get in-plane information. The capability of the methods is demonstrated at the example of a Pb-stearate multilayer covered by a thin polyelectrolytic polymer layer.
    Źródło:
    Acta Physica Polonica A; 1997, 91, 4; 829-833
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Study of Si-Implanted and Thermally Annealed Layers of Silicon by Using X-ray Grazing Incidence Methods
    Autorzy:
    Klinger, D.
    Lefeld-Sosnowska, M.
    Pełka, J. B.
    Paszkowicz, W.
    Gierłowski, P.
    Pankowski, P.
    Powiązania:
    https://bibliotekanauki.pl/articles/2030709.pdf
    Data publikacji:
    2002-05
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    61.10.-i
    61.10.Kw
    61.72.Tt
    68.35.Fx
    81.40.Ef
    81.65.Mq
    Opis:
    This paper reports on the study of structural modifications induced by the implantation process and by the subsequent thermal annealing in near-surface layers of Si single crystals implanted with Si$\text{}^{2+}$ ions of energy 140 keV and doses from 1×10$\text{}^{15}$ to 1× 10$\text{}^{16}$ ions/cm$\text{}^{2}$. The grazing incidence X-ray diffraction and X-ray reflectivity measurements were applied to determine the thickness and structural composition of the damaged layers. The fitted electron density profiles indicated an existence of an interfacial layer with density higher than the density of Si matrix or near-surface oxide layer. Formation of polycrystalline phases of silicon and silicon oxides is discussed in dependence on the conditions of annealing treatment and implantation dose.
    Źródło:
    Acta Physica Polonica A; 2002, 101, 5; 795-801
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-6 z 6

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