- Tytuł:
- Ellipsometric and Spectrophotometric Investigations of Porous Silica Thin Films Produced by Sol-Gel Method
- Autorzy:
-
Skoczek, E.
Jaglarz, J.
Karasiński, P. - Powiązania:
- https://bibliotekanauki.pl/articles/1493259.pdf
- Data publikacji:
- 2011-10
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
81.20.Fw
83.80.Jx
07.60.Fs
07.60.Rd - Opis:
- The work presents the optical properties of porous silica thin films prepared by TEOS sol-gel method. The films were deposited onto glass substrate using dip-coating technique. The spectroscopic ellipsometry measurements have been performed to determine the optical constants of the films. This technique also enabled evaluation of the depolarization for the investigated layers. Additionally, the spectrophotometric measurements of transmittance and reflectance by the use of integrating sphere and reflectance probe have been made with the aim of possible application of the films as antireflective coatings.
- Źródło:
-
Acta Physica Polonica A; 2011, 120, 4; 732-735
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł