- Tytuł:
- On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low-frequency noise measurements
- Autorzy:
-
Scandurra, Graziella
Beyne, Sofie
Giusi, Gino
Ciofi, Carmine - Powiązania:
- https://bibliotekanauki.pl/articles/221721.pdf
- Data publikacji:
- 2019
- Wydawca:
- Polska Akademia Nauk. Czytelnia Czasopism PAN
- Tematy:
-
low-frequency noise measurements
electron devices reliability
electro-migration
dedicated instrumentation - Opis:
- Low-frequency noise measurements have long been recognized as a valuable tool in the examination of quality and reliability of metallic interconnections in the microelectronic industry. While characterized by very high sensitivity, low-frequency noise measurements can be extremely time-consuming, especially when tests have to be carried out over an extended temperature range and with high temperature resolutionas it is required by some advanced characterization approaches recently proposed in the literature. In order to address this issue we designed a dedicated system for the characterization of the low-frequency noise produced by a metallic line vs temperature. The system combines high flexibility and automation with excellent background noise levels. Test temperatures range from ambient temperature up to 300°C. Measurements can be completely automated with temperature changing in pre-programmed steps. A ramp temperature mode is also possible that can be used, with proper caution, to virtually obtain a continuous plot of noise parameters vs temperature.
- Źródło:
-
Metrology and Measurement Systems; 2019, 26, 1; 13-21
0860-8229 - Pojawia się w:
- Metrology and Measurement Systems
- Dostawca treści:
- Biblioteka Nauki
Artykuł