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Wyszukujesz frazę "Pełka, J. B." wg kryterium: Autor

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    Tytuł:
    Study of Instrumental Factors Affecting X-Ray Isochromat Spectra
    Autorzy:
    Pełka, J. B.
    Powiązania:
    https://bibliotekanauki.pl/articles/1931722.pdf
    Data publikacji:
    1994-11
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    07.85.+n
    06.90.+v
    Opis:
    In the present paper a model of an apparatus function for the bremsstrahlung isochromat spectroscopy method is proposed. The study presented in this work is based on experimental results obtained with a particular spectrometer working at the quantum energy of Cr K$\text{}_{α1}$ (5414 eV). However, most of implications are general for the bremsstrahlung isochromat spectroscopy independently of particular construction of a spectrometer. From the theoretical considerations it was found that the total apparatus function, F$\text{}_{t}$, is composed of two main subfunctions in such a manner that F$\text{}_{t}$ is not necessarily constant along the isochromat spectrum. The properties of the function as well as the question how it influences the measured spectra are discussed. Considerations presented in this paper are limited to the most essential instrumental factors broadening the bremsstrahlung isochromat spectra which can be described in terms of the apparatus function. In order to estimate the width of the apparatus function some experimental results of bremsstrahlung isochromat spectroscopy measurements of chosen substances with various apparatus settings are shown.
    Źródło:
    Acta Physica Polonica A; 1994, 86, 5; 753-762
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Metrological Applications of X-ray Waveguide Thin Film Structures in X-ray Reflectometry and Diffraction
    Autorzy:
    Pełka, J. B.
    Lagomarsino, S.
    Powiązania:
    https://bibliotekanauki.pl/articles/2035489.pdf
    Data publikacji:
    2002-08
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    68.65.-k
    61.10.Kw
    06.30.Bp
    Opis:
    The effect of resonance, observed in X-ray waveguide layered structures in a characteristic way influences the scattering properties of the films. It is well known that in the resonant region the reflectivity shows a series of minima, usually very deep and extremely narrow. The positions and depths of the minima depend only on X-ray waveguide structural properties, on the X-ray wavelength and on the incident beam divergence. In the present work we propose and discuss the application of the X-ray waveguide and quasi X-ray waveguide film structures as tools to experimental evaluation of some quantities related to X-ray reflectometric or diffractometric measurements, like the beam divergence, wavelength, or angular distance. Examples of application of the X-ray waveguide as an excellent tool to estimate the effective beam divergence are shown. Properties of the X-ray waveguide elements as a handy wavelength or angular calibration standard are also mentioned.
    Źródło:
    Acta Physica Polonica A; 2002, 102, 2; 233-238
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Grazing Incidence X-Ray Reflectivity Study of MBE-Grown Co/Cu Multilayers
    Autorzy:
    Pełka, J. B.
    Baczewski, L. T.
    Wawro, A.
    Domagała, J.
    Powiązania:
    https://bibliotekanauki.pl/articles/1963397.pdf
    Data publikacji:
    1997-05
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    75.30.Gw
    75.30.-m
    75.70.-i
    Opis:
    In this work we report preliminary grazing-incidence X-ray reflectometry studies of multilayer structures composed of 3d metals Co and Cu deposited in the ultra-high vacuum molecular beam epitaxy system. The multilayers of different modulation period were deposited on glass substrate directly, or on 3d -metallic buffers of various thicknesses. The experimental specular reflectivity spectra were analyzed by a comparison with a theoretical model calculated from a recursive algorithm based on the Fresnel formula [1, 2]. It enabled us to estimate the structural parameters concerning layer thickness and roughness. The results obtained are correlated with magnetization measurements of the layered structures, as a function of modulation period, buffer type and thickness. A special attention to influence of interfacial roughness on magnetization results is paid.
    Źródło:
    Acta Physica Polonica A; 1997, 91, 5; 859-863
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Lattice Parameters of Aluminium Nitride in the Range 10-291 K
    Autorzy:
    Paszkowicz, W.
    Knapp, M.
    Podsiadło, S.
    Kamler, G.
    Pełka, J. B.
    Powiązania:
    https://bibliotekanauki.pl/articles/2030706.pdf
    Data publikacji:
    2002-05
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    81.05.Je
    65.40.De
    65.60.+a
    65.40.-b
    Opis:
    Lattice parameters for aluminium nitride were determined using X-ray powder diffraction at a synchrotron radiation source (beamline B2, Hasylab/DESY, Hamburg) in the temperature range from 10 K to 291 K. The measurements were carried out using the Debye-Scherrer geometry. The relative change of both, a and c, on rising the temperature in the studied range (10-291 K) is about 0.03%. The results are compared with earlier laboratory data and theoretical predictions.
    Źródło:
    Acta Physica Polonica A; 2002, 101, 5; 781-785
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Study of Si(111) Implanted with As Ions by X-Ray Diffraction and Grazing Incidence Methods
    Autorzy:
    Pełka, J. B.
    Górecka, J.
    Auleytner, J.
    Domagała, J.
    Bąk-Misiuk, J.
    Powiązania:
    https://bibliotekanauki.pl/articles/1964119.pdf
    Data publikacji:
    1997-05
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    68.55.Ln
    68.55.Jk
    Opis:
    The Si(111) wafer cut from a bulk single crystal obtained by the Czochralski method was implanted with 5×10$\text{}^{16}$ I cm$\text{}^{-2}$ of As ions of energy 80 keV. The dose applied was chosen above the amorphization limit of the silicon substrate. Two samples, implanted and a reference, were studied by grazing incidence X-ray reflectometry and X-ray diffraction methods using a high resolution Philips MRD system equipped with a Cu source and a channel-cut monochromator. The obtained spectra were compared with distributions of ion range and defect production calculated with TRIM program [1], as well as with theoretical models of reflectivity [2, 3]. The results of grazing incidence X-ray reflectometry reflectivity of the implanted sample show well-pronounced oscillations, which can be associated with a layer about 50 nm thick, approximately comparable to the thickness of the defected layer estimated from the TRIM method. Theoretical calculations of reflectivity clearly indicate an occurrence of a Si layer of electron density lower about 10-15% comparing to the unimplanted Si sample. This can be due to the vacancy production during ion implantation. A comparison of the spectra with a density distribution profile concluded from the TRIM calculations shows large discrepancies. The results indicate the applicability of grazing incidence X-ray reflectometry method in a study of amorphization processes in implanted layers.
    Źródło:
    Acta Physica Polonica A; 1997, 91, 5; 905-910
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Oscillations in Reflectivity of Samples with X-ray Waveguide Layers
    Autorzy:
    Pełka, J. B.
    Lagomarsino, S.
    Di Fonzo, S.
    Jark, W.
    Domagała, J.
    Powiązania:
    https://bibliotekanauki.pl/articles/1945221.pdf
    Data publikacji:
    1996-03
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    68.65.+g
    78.20.Ci
    Opis:
    The glancing-angle reflectivity profiles in samples containing an X-ray waveguide layer are studied. Oscillations observed at angles within the region of resonance and above, are interpreted by angle dependent interference of the monochromatic X-ray beam in thin layer. The discussion is extended to the structures composed of more than one layer. Experimental reflectivity spectra recorded with Cu K$\text{}_{α}$ radiation are compared with the theoretical calculations. It leads to the model of oscillations in reflectivity consistent both for the resonant and non-resonant regions, and clarifies interpretation of oscillations in the region above the resonances. A brief discussion of potential applications of the reflectivity spectra to the studies of structure of thin layers is done.
    Źródło:
    Acta Physica Polonica A; 1996, 89, 3; 323-328
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Study of Photoelectron Emission Yield from Layered Structures in Presence of Resonance-Enhanced X-Ray Propagation Effect
    Autorzy:
    Pełka, J. B.
    Lagomarsino, S.
    Cedola, A.
    Di Fonzo, S.
    Jark, W.
    Powiązania:
    https://bibliotekanauki.pl/articles/1963396.pdf
    Data publikacji:
    1997-05
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    68.65.+g
    78.20.-e
    Opis:
    In this work we present the new experimental results of total photoelectric yield as well as energy distribution of photoelectrons excited in a thin carbon film deposited on Ni mirror in the presence of resonance-enhanced X-ray propagation effect. The measurements were performed using conventional X-ray tube as a radiation source for the energy Cu K$\text{}_{α}$ (8047 keV). The spectra were recorded using a flow proportional electron counter with energy resolution of about 15%, and multichannel pulse height analyzer. A comparison with the reflectivity spectra recorded at the same time show an excellent correlation of both kinds of spectra, consistently with the theoretical prediction. A map of electron energy distribution is reported. Although the applied electron counter was of low energetic resolution the recorded spectra show characteristic regularities and indicate that the photoelectron yield excited in the presence of resonance-enhanced X-ray propagation effect can provide depth dependent information about impurity distribution and processes in thin layers.
    Źródło:
    Acta Physica Polonica A; 1997, 91, 5; 851-857
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    Study of Si-Implanted and Thermally Annealed Layers of Silicon by Using X-ray Grazing Incidence Methods
    Autorzy:
    Klinger, D.
    Lefeld-Sosnowska, M.
    Pełka, J. B.
    Paszkowicz, W.
    Gierłowski, P.
    Pankowski, P.
    Powiązania:
    https://bibliotekanauki.pl/articles/2030709.pdf
    Data publikacji:
    2002-05
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    61.10.-i
    61.10.Kw
    61.72.Tt
    68.35.Fx
    81.40.Ef
    81.65.Mq
    Opis:
    This paper reports on the study of structural modifications induced by the implantation process and by the subsequent thermal annealing in near-surface layers of Si single crystals implanted with Si$\text{}^{2+}$ ions of energy 140 keV and doses from 1×10$\text{}^{15}$ to 1× 10$\text{}^{16}$ ions/cm$\text{}^{2}$. The grazing incidence X-ray diffraction and X-ray reflectivity measurements were applied to determine the thickness and structural composition of the damaged layers. The fitted electron density profiles indicated an existence of an interfacial layer with density higher than the density of Si matrix or near-surface oxide layer. Formation of polycrystalline phases of silicon and silicon oxides is discussed in dependence on the conditions of annealing treatment and implantation dose.
    Źródło:
    Acta Physica Polonica A; 2002, 101, 5; 795-801
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    X-ray Characterization of Films Formed by Pulsed Laser Deposition on Cold Substrates from YBaCuO Targets
    Autorzy:
    Pełka, J. B.
    Paszkowicz, W.
    Gierłowski, P.
    Lewandowski, S. J.
    Zieliński, M.
    Barbanera, S.
    Knapp, M.
    Powiązania:
    https://bibliotekanauki.pl/articles/2030707.pdf
    Data publikacji:
    2002-05
    Wydawca:
    Polska Akademia Nauk. Instytut Fizyki PAN
    Tematy:
    52.38.Mf
    81.15.-z
    68.55.-a
    Opis:
    Grazing-incidence X-ray diffraction supplemented with atomic force microscopy and secondary ion mass spectroscopy were applied to the characterization of films deposited by laser ablation on cold substrates from YBaCuO targets and subsequently irradiated with additional laser pulses of lower energy density. Evolution of X-ray diffraction pattern was observed as a function of irradiation dose. For the as-deposited films the pattern was typical of the amorphized solids. For the films irradiated with doses higher than the threshold, the pattern was enriched with the diffraction peaks, whose general features, like peak positions, widths and relative intensities were almost independent of the dose. The size of the crystallites was deduced from the peak widths to be not smaller than 12-16 nm. Comparison of the pattern with patterns of known phases indicates that, apart of the amorphous component, a structure with an admixture of some new metastable or high temperature phase(s) is formed during the process of pulsed laser annealing. The atomic force microscopy observations revealed that the surface roughness shows a pronounced minimum at low irradiation doses. The secondary ion mass spectroscopy investigation confirms that the strongest chemical changes (increase in concentration of yttrium and copper) due to irradiation with higher doses are observed in the near-surface film material.
    Źródło:
    Acta Physica Polonica A; 2002, 101, 5; 787-794
    0587-4246
    1898-794X
    Pojawia się w:
    Acta Physica Polonica A
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
    Tytuł:
    The effects of interior design on wellness – eye tracking analysis in determining emotional experience of architectural space. A survey on a group of volunteers from the Lublin region, Eastern Poland
    Autorzy:
    Tuszyńska-Bogucka, W.
    Kwiatkowski, B.
    Chmielewska, M.
    Dzieńkowski, M.
    Kocki, W.
    Pełka, J.
    Przesmycka, N.
    Bogucki, J.
    Galkowski, D.
    Powiązania:
    https://bibliotekanauki.pl/articles/2085475.pdf
    Data publikacji:
    2020
    Wydawca:
    Instytut Medycyny Wsi
    Tematy:
    supportive design
    healing environment
    emotional significance of space
    optimisation of treatment conditions
    eye tracking in medical research
    Opis:
    Introduction and objective. Using the concepts of Ulrich’s theory of supportive design and Malkin’s healing environment, an eye tracking experiment was designed in order to measure respondents’ reactions while looking at visualisations of various interiors, with the aim of verifying whether certain parameters of an interior are related to emotional reactions in terms of positive stimulation, and the sense of security and comfort. Materials and method. 12 boards were designed, incorporating standard features of an interior, i.e. (1) proportions, (2) lighting, (3) colour scheme of a room, as well as (4) the colours and spatial arrangement of furnishings. Respondents’ reactions were recorded with an eye tracker Tobii TX300 and supplemented by self-descriptions of emotional reactions. Results. The results showed that the varying spatial and colour arrangements presented in the interior visualisations provoked different emotional responses, confirmed by pupil reaction parameters, as measured by the eye tracking device. Conclusions. Architectural space can have a diverse emotional significance and impact on an individual’s emotional state. This is an important conclusion from the point of view of optimising and creating the so-called supportive and healing environment. The results have implications for the interpretation of the pupil diameter as an index of emotional reactions to different architectural space visualisations. Testing the eye tracker as a method helpful in diagnosing the emotional reactions to features of the interior is justified, and can provide an effective tool for early diagnosis of the impact of architectural space on the well-being of individuals. It can also be a good form of testing the emotional significance of architectural designs before they are implemented.
    Źródło:
    Annals of Agricultural and Environmental Medicine; 2020, 27, 1; 113-122
    1232-1966
    Pojawia się w:
    Annals of Agricultural and Environmental Medicine
    Dostawca treści:
    Biblioteka Nauki
    Artykuł
      Wyświetlanie 1-10 z 10

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