Autor: Mrad, O. - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Sorption and migration of Cs, Sr, and Eu in gypsum - groundwater system
Autorzy:: Alhassanieh, O.
Mrad, O.
Ajji, Z.
Powiązania:: https://bibliotekanauki.pl/articles/147892.pdf
Data publikacji:: 2012
Wydawca:: Instytut Chemii i Techniki Jądrowej
Tematy:: distribution
cesium
europium
strontium
gypsum
groundwater
Opis:: The distribution of 137Cs, 152Eu, and 85Sr in a solid/aqueous system, gypsum in contact with groundwater, was investigated using gamma-spectrometry. The sorption and migration of the radionuclides were investigated. The aqueous phase was characterized using instrumental neutron activation analysis (INAA) and high performance liquid chromatography (HPLC). The solid phases were characterized using X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS). The investigations included three kinds of gypsum: mineral, commercial, and own prepared gypsum. The influence of some parameters on sorption/migration of the radionuclides were studied, such as contact time, pH, and concentrations of concurrent elements. The effect of element concentration was also investigated. The results show the ability of gypsum to keep Sr and Eu in the solid phase in all three cases. The incorporation of Cs in the solid phase depends on the conditions and used materials, and varies between 93 and 97%.
Źródło:: Nukleonika; 2012, 57, 1; 125-131
0029-5922
1508-5791
Pojawia się w:: Nukleonika
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: Characterization of TiAlV Films Prepared by Vacuum Arc Deposition: Effect of Substrate Temperature
Autorzy:: Abdallah, B.
Mrad, O.
Ismail, I.
Powiązania:: https://bibliotekanauki.pl/articles/1400306.pdf
Data publikacji:: 2013-01
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 68.55.-a
87.85.jf
Opis:: Three TiAlV films have been prepared by vacuum arc discharge technique at different substrate temperatures (50, 300, and 400°C). The depositions were carried out from aluminum, vanadium and titanium elemental targets. The temperature effects on the crystalline quality and texture have been investigated by means of X-ray diffraction. Two phases have been identified and the grain size has been found to increase with temperature. The composition of the films has been determined by proton induced X-ray emission technique. The Ti ratio was found to increase with temperature. The microhardness, measured by the Vickers indentation method was found to decrease with temperature. X-ray photoelectron spectroscopy was used to study the chemical composition of the passive layer formed on the films by analyzing high resolution spectra of Al 2p, Ti 2p and V 2p. This layer was mainly composed of $TiO_2$ with a small participation of other oxidation and metallic states of Ti, Al and V.
Źródło:: Acta Physica Polonica A; 2013, 123, 1; 76-79
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

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