- Tytuł:
- Scanning-Gate Microscopy of Semiconductor Nanostructures: An Overview
- Autorzy:
-
Martins, F.
Hackens, B.
Sellier, H.
Liu, P.
Pala, M. G.
Baltazar, S.
Desplanque, L.
Wallart, X.
Bayot, V.
Huant, S. - Powiązania:
- https://bibliotekanauki.pl/articles/2047914.pdf
- Data publikacji:
- 2011-05
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
73.21.La
73.23.Ad
03.65.Yz
85.35.Ds - Opis:
- This paper presents an overview of scanning-gate microscopy applied to the imaging of electron transport through buried semiconductor nanostructures. After a brief description of the technique and of its possible artifacts, we give a summary of some of its most instructive achievements found in the literature and we present an updated review of our own research. It focuses on the imaging of GaInAs-based quantum rings both in the low magnetic field Aharonov-Bohm regime and in the high-field quantum Hall regime. In all of the given examples, we emphasize how a local-probe approach is able to shed new, or complementary, light on transport phenomena which are usually studied by means of macroscopic conductance measurements.
- Źródło:
-
Acta Physica Polonica A; 2011, 119, 5; 569-575
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł