- Tytuł:
- High Resolution X-ray Reciprocal Space Mapping
- Autorzy:
-
Bauer, G.
Li, J. H.
Holy, V. - Powiązania:
- https://bibliotekanauki.pl/articles/1943985.pdf
- Data publikacji:
- 1996-02
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
61.10.-i
68.55.-a
61.72.Lk - Opis:
- A survey will be given on recent advances in the investigation of semiconductor epilayers, heterostructures and superlattices using reciprocal space mapping techniques based on triple-axis diffractometry. It is shown that X-ray reciprocal space mapping yields quantitative information on strain, strain relaxation, as well as composition in such structures. These data are obtained from analyses of the isointensity contours of scattered X-ray intensity around reciprocal lattice points. Further analysis of the diffuse scattering yields also information on defect distribution in the epilayers.
- Źródło:
-
Acta Physica Polonica A; 1996, 89, 2; 115-127
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł