Autor: Durakbasa, M. N. - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: From Nanometrology to Picometrology - metrology for Human Life and technical Development in the 21st Century
Od nanometrologii do pikometrologii - metrologia dla ludzkiego życia i rozwoju technologicznego XXI wieku
Autorzy:: Afjehi-Sadat, A.
Osanna, P. H.
Durakbasa, M. N.
Powiązania:: https://bibliotekanauki.pl/articles/158059.pdf
Data publikacji:: 2004
Wydawca:: Stowarzyszenie Inżynierów i Techników Mechaników Polskich
Tematy:: nanometrologia
pikometrologia
metrologia
życie ludzkie
rozwój technologiczny
wiek XXI
nanometrology
nanotechnology
precision manufacturing
measurement technique
quality management
picometrology
metrology
human life
technical development
21st Century
Opis:: In this article the importance of nanometrology and nanotechnology in general for scientific research and especially for production engineering is described and particulary the influence on technical development, high precision manufacturing but also for circumstancies of human life is demonstrated. High accuracy measurement technique and metrology must be given a key role in modern production environment. Essential contributions to increase the quality of products and the productive power of industrial plants can be reached through the aimed application of nanometrology.
Przedstawiono podstawowe znaczenie nanometrologii i nanotechnologii w badaniach naukowych koncentrując się przede wszystkim na inżynierii produkcji. Podkreślono wpływ nanometrologii i nanotechnologii na rozwój techniczny, wytwarzanie o wysokiej dokładności jak również ich znaczenie w życiu człowieka. Techniki pomiarowe o wysokiej dokładności i metrologia powinny odgrywać kluczową rolę w warunkach nowoczesnej produkcji. Dzięki zastosowaniom nanotmetrologii można uzyskać znaczący wzrost jakości wyrobów i zdolności produkcyjnych.
Źródło:: Pomiary Automatyka Kontrola; 2004, R. 50, nr 12, 12; 10-14
0032-4140
Pojawia się w:: Pomiary Automatyka Kontrola
Dostawca treści:: Biblioteka Nauki

Artykuł

Zmień widok

na półce

Skocz do pozycji: 2.

Tytuł:: Novel developments in dimensional nanometrology in the context of Geometrical Product Specifications and Verification (GPS)
Autorzy:: Durakbasa, M. N.
Osanna, P. H.
Bas, G.
Demircioglu, P.
Cakmakci, M.
Hornikova, A.
Powiązania:: https://bibliotekanauki.pl/articles/384407.pdf
Data publikacji:: 2012
Wydawca:: Sieć Badawcza Łukasiewicz - Przemysłowy Instytut Automatyki i Pomiarów
Tematy:: precision metrology
design
manufacturing
workpiece tolerancing
Opis:: Adequate knowledge in the areas of intelligent coordinate metrology and design are important presuppositions to achieve waste free production and low costs of manufacturing with higher quality and accuracy at the same time. This is of extreme importance in present time of worldwide international competition in industry and production and at the same time increasingly higher costs of energy and raw material. The prescription and consumption of material and energy to achieve the necessary and required workpiece accuracy in series manufacturing depends to a great extent from the (geometrical) workpiece tolerances of any kind (roughness, form, positional, dimensional) which are prescribed for the production and the fulfillment of these tolerances and therefore for the function of the produced workpieces and their fitness for practical application and none the less of the economy of production altogether. This requirement is of great importance at the time being which is characterized as described above.
Źródło:: Journal of Automation Mobile Robotics and Intelligent Systems; 2012, 6, 2; 22-25
1897-8649
2080-2145
Pojawia się w:: Journal of Automation Mobile Robotics and Intelligent Systems
Dostawca treści:: Biblioteka Nauki

Artykuł

Zmień widok

na półce

Skocz do pozycji: 3.

Tytuł:: Ants Colony Optimisation of a Measuring Path of Prismatic Parts on a CMM
Autorzy:: Stojadinovic, S. M.
Majstorovic, V. D.
Durakbasa, N. M.
Sibalija, T. V.
Powiązania:: https://bibliotekanauki.pl/articles/221131.pdf
Data publikacji:: 2016
Wydawca:: Polska Akademia Nauk. Czytelnia Czasopism PAN
Tematy:: path planning
ACO
CMM
prismatic parts
Opis:: This paper presents optimisation of a measuring probe path in inspecting the prismatic parts on a CMM. The optimisation model is based on: (i) the mathematical model that establishes an initial collision-free path presented by a set of points, and (ii) the solution of Travelling Salesman Problem (TSP) obtained with Ant Colony Optimisation (ACO). In order to solve TSP, an ACO algorithm that aims to find the shortest path of ant colony movement (i.e. the optimised path) is applied. Then, the optimised path is compared with the measuring path obtained with online programming on CMM ZEISS UMM500 and with the measuring path obtained in the CMM inspection module of Pro/ENGINEER® software. The results of comparing the optimised path with the other two generated paths show that the optimised path is at least 20% shorter than the path obtained by on-line programming on CMM ZEISS UMM500, and at least 10% shorter than the path obtained by using the CMM module in Pro/ENGINEER®.
Źródło:: Metrology and Measurement Systems; 2016, 23, 1; 119-132
0860-8229
Pojawia się w:: Metrology and Measurement Systems
Dostawca treści:: Biblioteka Nauki

Artykuł

Zmień widok

na półce

Skocz do pozycji: 4.

Tytuł:: Surface characterization by accurate measurement and image processing systems on machined surfaces of precision cutting tools
Autorzy:: Durakbasa, N. M.
Bogrekci, I.
Demircioglu, P.
Bas, G.
Gunay, A.
Powiązania:: https://bibliotekanauki.pl/articles/385129.pdf
Data publikacji:: 2012
Wydawca:: Sieć Badawcza Łukasiewicz - Przemysłowy Instytut Automatyki i Pomiarów
Tematy:: surface roughness
end milling
image processing
precision machining
Opis:: High precise measurement techniques and surface structure analysis are required in advanced fields of interchangeable manufacturing and precision engineering. This study presents the characterization of the surface roughness of the machined milling cutters by experimental precision measurements and the image processing tool. The data obtained are compared to assess the surface characterization parameters and computational data in terms of precision, accuracy, sensitivity, repeatability and resolution. In the experimental measurement phase, the roughness measurements and surface topography characterization were performed in the nanotechnology laboratory using the stylus profilometry and digital microscopy. The computational phase was performed using an image processing toolbox with precise evaluation of the roughness for the machined metal surfaces of the end mill cutting tool. The surface parameter database is established exhibiting an advantage over the traditional method. This study reveals a comparison methodology of the end mill surface parameters using both stylus readings and image processing software for widely used end mill cutting tools that have considerable effect on characterization of sensitive manufacturing surface of millings.
Źródło:: Journal of Automation Mobile Robotics and Intelligent Systems; 2012, 6, 3; 51-55
1897-8649
2080-2145
Pojawia się w:: Journal of Automation Mobile Robotics and Intelligent Systems
Dostawca treści:: Biblioteka Nauki

Artykuł

Zmień widok

na półce

Informacja

Wyszukujesz frazę "Durakbasa, M. N." wg kryterium: Autor

Źródło danych

Dostawca treści

Kolekcja

Rok wydania

Wydawca

Temat

Autor

Typ dokumentu

Język