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Wyszukujesz frazę "Ratajczak, D." wg kryterium: Autor


Wyświetlanie 1-5 z 5
Tytuł:
High Resistivity AlGaAs Grown by Low Temperature MBE
Autorzy:
Radomska, D.
Ratajczak, J.
Regiński, K.
Bugajski, M.
Powiązania:
https://bibliotekanauki.pl/articles/1992076.pdf
Data publikacji:
1998-09
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
73.61.Ey
Opis:
Al$\text{}_{0.3}$Ga$\text{}_{0.7}$As layers were grown by molecular beam epitaxy using substrate temperature 200-300°C, tetrameric As and two values of As/Ga+Al flux ratio i.e. 3 or 8. The post-growth annealing was performed in situ at 600°C for 20 min under As-overpressure. The samples were characterised by reflection high-energy electron diffraction, transmission electron microscope and room-temperature I-V measurements of n$\text{}^{+}$/LT grown layer /n$\text{}^{+}$ resistors. The resistivity and trap-filled limited voltage have been determined. The best layers exhibited ρ of the order of 10$\text{}^{9}$ Ω cm, were monocrystalline, uniformly precipitated and without dislocations.
Źródło:
Acta Physica Polonica A; 1998, 94, 3; 492-496
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Relationship between antibiotic resistance, biofilm formation, genes coding virulence factors and source of origin of Pseudomonas aeruginosa clinical strains
Autorzy:
Ratajczak, M.
Kamińska, D.
Nowak-Malczewska, D.M.
Schneider, A.
Dlugaszewska, J.
Powiązania:
https://bibliotekanauki.pl/articles/28762758.pdf
Data publikacji:
2021
Wydawca:
Instytut Medycyny Wsi
Źródło:
Annals of Agricultural and Environmental Medicine; 2021, 28, 2; 306-313
1232-1966
Pojawia się w:
Annals of Agricultural and Environmental Medicine
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Characterization of SOI fabrication process using gated-diode measurements and TEM studies
Autorzy:
Gibki, J.
Kątcki, J.
Ratajczak, J.
Łukasik, L.
Jakubowski, A.
Tomaszewski, D.
Powiązania:
https://bibliotekanauki.pl/articles/309219.pdf
Data publikacji:
2000
Wydawca:
Instytut Łączności - Państwowy Instytut Badawczy
Tematy:
microelectronics
SOI technology
characterization
Opis:
SOI fabrication process was characterized using electrical and TEM methods. The investigated SOI structures included partially and fully depleted capacitors, gated diodes and transistors fabricated on SIMOX substrates. From C-V and I-V measurements of gated diodes, the following parameters of partially depleted structures were determined: doping concentration in both n- and p-type regions, average carrier generation lifetimes in the region under the gate and generation velocity at top and bottom surfaces of the active layer. Structures with short lifetime were studied using a transmission electron microscope. TEM studies indicate that the quality of the active layer in the investigated structures is good. Moreover, these studies were used to verify the thicknesses determined by means of electrical characterization methods.
Źródło:
Journal of Telecommunications and Information Technology; 2000, 3-4; 81-83
1509-4553
1899-8852
Pojawia się w:
Journal of Telecommunications and Information Technology
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
TEM Characterization of Polysilicon and Silicide Fin Fabrication Processes of FinFETs
Autorzy:
Ratajczak, J.
Łaszcz, A.
Czerwinski, A.
Kątcki, J.
Tang, X.
Reckinger, N.
Yarekha, D.
Larrieu, G.
Dubois, E.
Powiązania:
https://bibliotekanauki.pl/articles/1807511.pdf
Data publikacji:
2009-12
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
85.40.-e
68.37.Lp
Opis:
The transmission electron microscopy characterization of various silicon and silicide fin structures intended for application in FinFET devices has been performed. The results showed that transmission electron microscopy is a very useful tool for optimization of manufacturing processes of fin nanostructures in FinFETs.
Źródło:
Acta Physica Polonica A; 2009, 116, S; S-89-S-91
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
Tytuł:
Response of ZnO/GaN Heterostructure to Ion Irradiation
Autorzy:
Barcz, A.
Pągowska, K.
Kozubal, M.
Guziewicz, E.
Borysiewicz, M.
Dyczewski, J.
Jakieła, R.
Ratajczak, J.
Snigurenko, D.
Dynowska, E.
Powiązania:
https://bibliotekanauki.pl/articles/1402192.pdf
Data publikacji:
2015-11
Wydawca:
Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:
61.82.Fk
61.85.+p
68.35.Dv
Opis:
In this paper we report on the analysis of Al⁺-implanted ZnO/GaN bilayers in search for the damage production mechanism and possible ion mixing. 100 nm or 200 nm thick ZnO epitaxial layers were grown on GaN substrates by either sputter deposition or atomic layer deposition technique followed by adequate annealing. Ion irradiations of ZnO/GaN were carried out at room temperature using 200 keV Al⁺ ions with fluences of 2×10¹⁵ and 10¹⁶ at./cm². Unprocessed and irradiated samples were characterized by the Rutherford backscattering spectrometry in channeling geometry (RBS\c), X-ray diffraction and transmission electron microscopy. Additionally, secondary ion mass spectrometry was employed for the aforementioned samples as well as for the implanted samples subjected to further annealing. It was found that the damage distributions in ZnO/GaN differ considerably from the corresponding defect profiles in the bulk ZnO and GaN crystals, most probably due to an additional strain originating from the lattice mismatch. Amount of intermixing appears to be relatively small; apparently, efficient recombination prevents foreign atoms to relocate to large distances.
Źródło:
Acta Physica Polonica A; 2015, 128, 5; 832-835
0587-4246
1898-794X
Pojawia się w:
Acta Physica Polonica A
Dostawca treści:
Biblioteka Nauki
Artykuł
    Wyświetlanie 1-5 z 5

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