- Tytuł:
- Thin layers XRD study technique on an example of cobalt tetrafluoro phthalocyanine
- Autorzy:
-
Sukhikh, A.
Basova, T.
Gromilov, S. - Powiązania:
- https://bibliotekanauki.pl/articles/1075647.pdf
- Data publikacji:
- 2016-10
- Wydawca:
- Polska Akademia Nauk. Instytut Fizyki PAN
- Tematy:
-
61.05.cp
68.55.Nq - Opis:
- Thin layers X-ray diffraction study technique utilizing single-crystal X-ray diffractometer equipped with microfocus X-ray tube is described. It is shown that the layers of the tetra-fluorinated cobalt phthalocyanine (CoPcF₄), deposited by thermal evaporation in vacuum on a polished surface of the substrate (glass, quartz), have a highly oriented polycrystalline structure. All the crystallites have the (00l) plane oriented along the surface of the substrate. CoPcF₄ X-ray diffraction pattern indexing was conducted and unit cell parameters were determined. It is shown that crystal phase of both polycrystalline powder and thin layers of CoPcF₄ are isostructural to that of α -CoPc.
- Źródło:
-
Acta Physica Polonica A; 2016, 130, 4; 889-891
0587-4246
1898-794X - Pojawia się w:
- Acta Physica Polonica A
- Dostawca treści:
- Biblioteka Nauki
Artykuł