Thin layers XRD study technique on an example of cobalt tetrafluoro phthalocyanine

Thin layers X-ray diffraction study technique utilizing single-crystal X-ray diffractometer equipped with microfocus X-ray tube is described. It is shown that the layers of the tetra-fluorinated cobalt phthalocyanine (CoPcF₄), deposited by thermal evaporation in vacuum on a polished surface of the substrate (glass, quartz), have a highly oriented polycrystalline structure. All the crystallites have the (00l) plane oriented along the surface of the substrate. CoPcF₄ X-ray diffraction pattern indexing was conducted and unit cell parameters were determined. It is shown that crystal phase of both polycrystalline powder and thin layers of CoPcF₄ are isostructural to that of α -CoPc.