Autor: Khrupa, V. - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: X-Ray Structure Perfection Diagnostics of Slightly Distorted Silicon Crystals in the Bragg Case of Diffraction
Autorzy:: Khrupa, V.
Krasulya, S.
Machulin, V.
Datsenko, L.
Auleytner, J.
Powiązania:: https://bibliotekanauki.pl/articles/1964151.pdf
Data publikacji:: 1997-05
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 61.66.Bi
81.40.-z
Opis:: A new approach to structure perfection diagnostics of dislocation-free silicon crystals has been developed using the Bragg case of diffraction. The approach is being based on successive measurements of integral reflectivity and the spatial intensity distribution of reflected beam on the same diffraction planes of a real crystal by means of a single crystal diffractometer.
Źródło:: Acta Physica Polonica A; 1997, 91, 5; 981-985
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 2.

Tytuł:: Integral Structure Perfection Diagnostics of Single Crystals Using Two Wavelengths of X-Ray Spectrum
Autorzy:: Datsenko, L.
Krasulya, S.
Machulin, V.
Auleytner, J.
Khrupa, V.
Powiązania:: https://bibliotekanauki.pl/articles/1964123.pdf
Data publikacji:: 1997-05
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 81.40.-z
61.10.-i
Opis:: A new approach to determination of microdefect structure parameters by means of single crystal diffractometer is proposed. The approach is based on the measurements of the integral reflectivity of a sample for two selected X-ray wavelengths providing with the approximations of thin and thick crystal, respectively.
Źródło:: Acta Physica Polonica A; 1997, 91, 5; 935-938
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

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Skocz do pozycji: 3.

Tytuł:: Investigation of Near Surface Distortions in Si Single Crystals by Means of Spatial Distribution Analysis of Reflected Beams
Autorzy:: Khrupa, V. I.
Krasulya, S. M.
Machulin, V.
Datsenko, L. I.
Auleytner, J.
Powiązania:: https://bibliotekanauki.pl/articles/1945216.pdf
Data publikacji:: 1996-03
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 81.40.-z
61.10.-i
Opis:: A diffractometrical method for quantitative evaluation of structure perfection level in silicon single crystals containing various types of near surface distortions is described. The method is based on the spatial distribution analysis of the reflected intensity in the Bragg case of diffraction. To implement the proposed approach one has to satisfy the condition of the so-called low X-ray absorption because in this case the penetration depth of diffracted radiation exceeds the corresponding value of extinction length. It permits us to obtain a remarkable value of noncoherent reflectivity due to defects placed in deep (on the extension of absorption length) regions of a crystal and therefore, to increase the sensitivity of scattering for low distortions of crystal lattice. Using the method described here the extension of various disturbed layers as well as the level of the static Debye-Waller factor of a crystal can be determined. The effect of surface distortions caused by mechanical treatment and the influence of the following thermal annealing as well as irradiation by high energy protons on the defective structure of the samples were investigated.
Źródło:: Acta Physica Polonica A; 1996, 89, 3; 309-313
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

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