Autor: Khrupa, V. - Katalog OPAC zbiorów

Skocz do pozycji: 1.

Tytuł:: Integral Structure Perfection Diagnostics of Single Crystals Using Two Wavelengths of X-Ray Spectrum
Autorzy:: Datsenko, L.
Krasulya, S.
Machulin, V.
Auleytner, J.
Khrupa, V.
Powiązania:: https://bibliotekanauki.pl/articles/1964123.pdf
Data publikacji:: 1997-05
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 81.40.-z
61.10.-i
Opis:: A new approach to determination of microdefect structure parameters by means of single crystal diffractometer is proposed. The approach is based on the measurements of the integral reflectivity of a sample for two selected X-ray wavelengths providing with the approximations of thin and thick crystal, respectively.
Źródło:: Acta Physica Polonica A; 1997, 91, 5; 935-938
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 2.

Tytuł:: X-Ray Structure Perfection Diagnostics of Slightly Distorted Silicon Crystals in the Bragg Case of Diffraction
Autorzy:: Khrupa, V.
Krasulya, S.
Machulin, V.
Datsenko, L.
Auleytner, J.
Powiązania:: https://bibliotekanauki.pl/articles/1964151.pdf
Data publikacji:: 1997-05
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 61.66.Bi
81.40.-z
Opis:: A new approach to structure perfection diagnostics of dislocation-free silicon crystals has been developed using the Bragg case of diffraction. The approach is being based on successive measurements of integral reflectivity and the spatial intensity distribution of reflected beam on the same diffraction planes of a real crystal by means of a single crystal diffractometer.
Źródło:: Acta Physica Polonica A; 1997, 91, 5; 981-985
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

Skocz do pozycji: 3.

Tytuł:: Structural Perfection of Czochralski Grown Silicon Crystals Annealed above 1500 K under Hydrostatic Pressure
Autorzy:: Datsenko, L.
Khrupa, V.
Krasulya, S.
Misiuk, A.
Härtwig, J.
Surma, B.
Powiązania:: https://bibliotekanauki.pl/articles/1964116.pdf
Data publikacji:: 1997-05
Wydawca:: Polska Akademia Nauk. Instytut Fizyki PAN
Tematy:: 81.40.-z
81.05.Cy
Opis:: The structural perfection of Czochralski grown silicon crystals annealed at 1580-1620 K under hydrostatic pressure up to 10$\text{}^{9}$ Pa was investigated by X-ray diffractometry and topography supplemented by the method of absorption of infrared rays. Such treatment suppresses dissolution of oxygen-related defects. From the static Debye-Waller factor dependence on the reflection order it was concluded that large clusters or dislocation loops are the dominant type of defects for most of the samples.
Źródło:: Acta Physica Polonica A; 1997, 91, 5; 929-933
0587-4246
1898-794X
Pojawia się w:: Acta Physica Polonica A
Dostawca treści:: Biblioteka Nauki

Artykuł

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